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Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal

Volume 103

 ISSN: 1044-677X

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6




Issue 1 January-February 1998

 

Ultraviolet Spectral Irradiance Scale Comparison: 210 nm to 300 nm, p. 1
Ambler Thompson, Edward A. Early, and Thomas R. O'Brian
http://dx.doi.org/10.6028/jres.103.001

The 1995 North American Interagency Intercomparison of Ultraviolet Monitoring Spectroradiometers, p. 15
Edward Early, Ambler Thompson, Carol Johnson, John DeLuisi, Patrick Disterhoft, David Wardle, Edmund Wu, Wanfeng Mou, Yongchen Sun, Timothy Lucas, Tanya Mestechkina, Lee Harrison, Jerry Berndt, and Douglas Hayes
http://dx.doi.org/10.6028/jres.103.002

High-Temperature Adiabatic Calorimeter for Constant-Volume Heat Capacity Measurements of Compressed Gases and Liquids, p. 63
Joseph W. Magee, Renee J. Deal, and John C. Blanco
http://dx.doi.org/10.6028/jres.103.003

Moving Particles Through a Finite Element Mesh, p. 77
Adele P. Peskin and Gary R. Hardin
http://dx.doi.org/10.6028/jres.103.004

Metrological Timelines in Traceability, p. 93
Charles D. Ehrlich and Stanley D. Rasberry
http://dx.doi.org/10.6028/jres.103.005

Workshop on Thin Film Thermal Conductivity Measurement at the Thirteenth Symposium on Thermophysical Properties, p. 107
Albert Feldman and Naira M. Balzaretti
http://dx.doi.org/10.6028/jres.103.006

News Briefs, p. 117
http://dx.doi.org/10.6028/jres.103.007


Issue 2 March-April 1998

 

Uncertainty Analysis for Angle Calibrations Using Circle Closure, p. 141
W. Tyler Estler
http://dx.doi.org/10.6028/jres.103.008

Chopped Radiation Measurements With Large Area Si Photodiodes, p. 153
George Eppeldauer
http://dx.doi.org/10.6028/jres.103.009

An Easy-To-Use Combination Four-Terminal-Pair/Two-Terminal-Pair AC Transformer Bridge, p. 163
A. Jeffery, J. Q. Shields, and L. H. Lee
http://dx.doi.org/10.6028/jres.103.010

Can a Pressure Standard be Based on Capacitance Measurements?, p. 167
Michael R. Moldover
http://dx.doi.org/10.6028/jres.103.011

Degradation of GaAs/AlGaAs Quantized Hall Resistors With Alloyed AuGe/Ni Contacts, p. 177
Kevin C. Lee
http://dx.doi.org/10.6028/jres.103.012

Accurate Ab Initio Calculation of Molecular Constants, p. 201
S. Kotochigova and I. Tupitsyn
http://dx.doi.org/10.6028/jres.103.013

Hyperfine Structure Constants for Diatomic Molecules, p. 205
I. Tupitsyn and S. Kotochigova
http://dx.doi.org/10.6028/jres.103.014

Fourth International Symposium on Roofing Technology, p. 209
Walter J. Rossiter, Jr.
http://dx.doi.org/10.6028/jres.103.015

International Workshop on Ultrasonic and Dielectric Characterization Techniques for Suspended Particulates, p. 217
Vincent A. Hackley and John Texter
http://dx.doi.org/10.6028/jres.103.016

NIST Meeting on Multicomponent Polymers and Polyelectrolytes, p. 225
Jack Douglas
http://dx.doi.org/10.6028/jres.103.017

News Briefs, p. 227
http://dx.doi.org/10.6028/jres.103.018


Issue 3 May-June 1998

 

Experimental Issues in Coherent Quantum-State Manipulation of Trapped Atomic Ions, p. 259
D. J. Wineland, C. Monroe, W. M. Itano, D. Leibfried, B. E. King, and D. M. Meekhof
http://dx.doi.org/10.6028/jres.103.019

News Briefs, p. 329
http://dx.doi.org/10.6028/jres.103.020


Issue 4 July-August 1998

 

Thermal Conductivity of Magnesium Oxide From Absolute, Steady-State Measurements, p. 357
A. J. Slifka, B. J. Filla, and J. M. Phelps
http://dx.doi.org/10.6028/jres.103.021

Comparison of the NIST and ENEA Air Kerma Standards, p. 365
R. F. Laitano, P. J. Lamperti, and M. P. Toni
http://dx.doi.org/10.6028/jres.103.022

Liquidus Diagram of the Ba-Y-Cu-O System in the Vicinity of the Ba2 YCu3O6+x Phase Field, p. 379
Winnie Wong-Ng and Lawrence P. Cook
http://dx.doi.org/10.6028/jres.103.023

The Refinement-Tree Partition for Parallel Solution of Partial Differential Equations, p. 405
William F. Mitchell
http://dx.doi.org/10.6028/jres.103.024

NIST Workshop on Thin Dielectric Film Metrology, p. 415
Barbara J. Belzer and James R. Ehrstein
http://dx.doi.org/10.6028/jres.103.025

Electronic Dosimetry Workshop, p. 421
J. Shobe and K. L. Swinth
http://dx.doi.org/10.6028/jres.103.026

Fourth International Conference on Chemical Kinetics, p. 425
Robert E. Huie and Jeffrey W. Hudgens
http://dx.doi.org/10.6028/jres.103.027


Issue 5 September-October 1998

 

The 1996 North American Interagency Intercomparison of Ultraviolet Monitoring Spectroradiometers, p. 449
Edward Early, Ambler Thompson, Carol Johnson, John DeLuisi, Patrick Disterhoft, David Wardle, Edmund Wu, Wanfeng Mou, James Ehramjian, John Tusson, Tanya Mestechkina, Mark Beaubian, James Gibson, and Douglas Hayes
http://dx.doi.org/10.6028/jres.103.028

Image Evaluation of the High Resolution VUV Spectrometer at SURF II by Ray Tracing, p. 483
N. C. Das, R. P. Madden, and H. M. Seyoum
http://dx.doi.org/10.6028/jres.103.029

Algorithms for Fresnel Diffraction at Rectangular and Circular Apertures, p. 497
Klaus D. Mielenz
http://dx.doi.org/10.6028/jres.103.030

Acid-Assisted Consolidation of Silver Alloys for Direct Fillings, p. 511
Frederick D. Eichmiller, Kathleen M. Hoffman, Anthony A. Guiseppetti, Michael M. Wray, and Rangall J. Avers
http://dx.doi.org/10.6028/jres.103.031

Gaseous Dielectrics VIII (Eighth International Symposium on Gaseous Dielectrics), p. 517
Loucas G. Christophorou, and James K. Olthoff
http://dx.doi.org/10.6028/jres.103.032

NIST Workshop on Process Information Technology: From Research to Industry, p. 519
Howard T. Moncarz, Craig Schlenoff, Michael Gruninger, Michael Duffey, and Amy Knutilla http://dx.doi.org/10.6028/jres.103.033

Refrigerants for the 21st Century ASHRAE/NIST Refrigerants Conference, p. 529
Piotr A. Domanski
http://dx.doi.org/10.6028/jres.103.034

Workshop on Knowledge-Based Systems Interoperability, p. 535
Robert H. Allen and Ram D. Sriram
http://dx.doi.org/10.6028/jres.103.035

News Briefs, p. 539
http://dx.doi.org/10.6028/jres.103.036


Issue 6 November-December 1998

 

Calculating the Effects of Longitudinal Resistance in Multi-Series-Connected Quantum Hall Effect Devices, p. 561
M. E. Cage, A. Jeffery, R. E. Elmquist, and K. C. Lee
http://dx.doi.org/10.6028/jres.103.037

A Problem in AC Quantized Hall Resistance Measurements and a Proposed Solution, p. 593
M. E. Cage and A. Jeffery
http://dx.doi.org/10.6028/jres.103.038

Development of a Bolometer Detector System for the NIST High Accuracy Infrared Spectrophotometer, p. 605
Y. Zong and R. U. Datla
http://dx.doi.org/10.6028/jres.103.039

Spectral Response Based Calibration Method of Tristimulus Colorimeters, p. 615
George Eppeldauer
http://dx.doi.org/10.6028/jres.103.040

Aperture Proximity Effects in High Heat Flux Sensors Calibration, p. 621
A. V. Murthy, B. K. Tsai, and R. D. Saunders
http://dx.doi.org/10.6028/jres.103.041

Calculation of Measurement Uncertainty Using Prior Information, p. 625
S. D. Phillips, W. T. Estler, M. S. Levenson, and K. R. Eberhardt
http://dx.doi.org/10.6028/jres.103.042

Least-Squares Fitting Algorithms of the NIST Algorithm Testing System, p. 633
Craig M. Shakarji
http://dx.doi.org/10.6028/jres.103.043

News Briefs, p. 643
http://dx.doi.org/10.6028/jres.103.044


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