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Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal

Volume 103

 ISSN: 1044-677X

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6

Issue 1 January-February 1998


Ultraviolet Spectral Irradiance Scale Comparison: 210 nm to 300 nm, p. 1
Ambler Thompson, Edward A. Early, and Thomas R. O'Brian

The 1995 North American Interagency Intercomparison of Ultraviolet Monitoring Spectroradiometers, p. 15
Edward Early, Ambler Thompson, Carol Johnson, John DeLuisi, Patrick Disterhoft, David Wardle, Edmund Wu, Wanfeng Mou, Yongchen Sun, Timothy Lucas, Tanya Mestechkina, Lee Harrison, Jerry Berndt, and Douglas Hayes

High-Temperature Adiabatic Calorimeter for Constant-Volume Heat Capacity Measurements of Compressed Gases and Liquids, p. 63
Joseph W. Magee, Renee J. Deal, and John C. Blanco

Moving Particles Through a Finite Element Mesh, p. 77
Adele P. Peskin and Gary R. Hardin

Metrological Timelines in Traceability, p. 93
Charles D. Ehrlich and Stanley D. Rasberry

Workshop on Thin Film Thermal Conductivity Measurement at the Thirteenth Symposium on Thermophysical Properties, p. 107
Albert Feldman and Naira M. Balzaretti

News Briefs, p. 117

Issue 2 March-April 1998


Uncertainty Analysis for Angle Calibrations Using Circle Closure, p. 141
W. Tyler Estler

Chopped Radiation Measurements With Large Area Si Photodiodes, p. 153
George Eppeldauer

An Easy-To-Use Combination Four-Terminal-Pair/Two-Terminal-Pair AC Transformer Bridge, p. 163
A. Jeffery, J. Q. Shields, and L. H. Lee

Can a Pressure Standard be Based on Capacitance Measurements?, p. 167
Michael R. Moldover

Degradation of GaAs/AlGaAs Quantized Hall Resistors With Alloyed AuGe/Ni Contacts, p. 177
Kevin C. Lee

Accurate Ab Initio Calculation of Molecular Constants, p. 201
S. Kotochigova and I. Tupitsyn

Hyperfine Structure Constants for Diatomic Molecules, p. 205
I. Tupitsyn and S. Kotochigova

Fourth International Symposium on Roofing Technology, p. 209
Walter J. Rossiter, Jr.

International Workshop on Ultrasonic and Dielectric Characterization Techniques for Suspended Particulates, p. 217
Vincent A. Hackley and John Texter

NIST Meeting on Multicomponent Polymers and Polyelectrolytes, p. 225
Jack Douglas

News Briefs, p. 227

Issue 3 May-June 1998


Experimental Issues in Coherent Quantum-State Manipulation of Trapped Atomic Ions, p. 259
D. J. Wineland, C. Monroe, W. M. Itano, D. Leibfried, B. E. King, and D. M. Meekhof

News Briefs, p. 329

Issue 4 July-August 1998


Thermal Conductivity of Magnesium Oxide From Absolute, Steady-State Measurements, p. 357
A. J. Slifka, B. J. Filla, and J. M. Phelps

Comparison of the NIST and ENEA Air Kerma Standards, p. 365
R. F. Laitano, P. J. Lamperti, and M. P. Toni

Liquidus Diagram of the Ba-Y-Cu-O System in the Vicinity of the Ba2 YCu3O6+x Phase Field, p. 379
Winnie Wong-Ng and Lawrence P. Cook

The Refinement-Tree Partition for Parallel Solution of Partial Differential Equations, p. 405
William F. Mitchell

NIST Workshop on Thin Dielectric Film Metrology, p. 415
Barbara J. Belzer and James R. Ehrstein

Electronic Dosimetry Workshop, p. 421
J. Shobe and K. L. Swinth

Fourth International Conference on Chemical Kinetics, p. 425
Robert E. Huie and Jeffrey W. Hudgens

Issue 5 September-October 1998


The 1996 North American Interagency Intercomparison of Ultraviolet Monitoring Spectroradiometers, p. 449
Edward Early, Ambler Thompson, Carol Johnson, John DeLuisi, Patrick Disterhoft, David Wardle, Edmund Wu, Wanfeng Mou, James Ehramjian, John Tusson, Tanya Mestechkina, Mark Beaubian, James Gibson, and Douglas Hayes

Image Evaluation of the High Resolution VUV Spectrometer at SURF II by Ray Tracing, p. 483
N. C. Das, R. P. Madden, and H. M. Seyoum

Algorithms for Fresnel Diffraction at Rectangular and Circular Apertures, p. 497
Klaus D. Mielenz

Acid-Assisted Consolidation of Silver Alloys for Direct Fillings, p. 511
Frederick D. Eichmiller, Kathleen M. Hoffman, Anthony A. Guiseppetti, Michael M. Wray, and Rangall J. Avers

Gaseous Dielectrics VIII (Eighth International Symposium on Gaseous Dielectrics), p. 517
Loucas G. Christophorou, and James K. Olthoff

NIST Workshop on Process Information Technology: From Research to Industry, p. 519
Howard T. Moncarz, Craig Schlenoff, Michael Gruninger, Michael Duffey, and Amy Knutilla http://dx.doi.org/10.6028/jres.103.033

Refrigerants for the 21st Century ASHRAE/NIST Refrigerants Conference, p. 529
Piotr A. Domanski

Workshop on Knowledge-Based Systems Interoperability, p. 535
Robert H. Allen and Ram D. Sriram

News Briefs, p. 539

Issue 6 November-December 1998


Calculating the Effects of Longitudinal Resistance in Multi-Series-Connected Quantum Hall Effect Devices, p. 561
M. E. Cage, A. Jeffery, R. E. Elmquist, and K. C. Lee

A Problem in AC Quantized Hall Resistance Measurements and a Proposed Solution, p. 593
M. E. Cage and A. Jeffery

Development of a Bolometer Detector System for the NIST High Accuracy Infrared Spectrophotometer, p. 605
Y. Zong and R. U. Datla

Spectral Response Based Calibration Method of Tristimulus Colorimeters, p. 615
George Eppeldauer

Aperture Proximity Effects in High Heat Flux Sensors Calibration, p. 621
A. V. Murthy, B. K. Tsai, and R. D. Saunders

Calculation of Measurement Uncertainty Using Prior Information, p. 625
S. D. Phillips, W. T. Estler, M. S. Levenson, and K. R. Eberhardt

Least-Squares Fitting Algorithms of the NIST Algorithm Testing System, p. 633
Craig M. Shakarji

News Briefs, p. 643

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