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Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal

Volume 104

 ISSN: 1044-677X

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6

Issue 1 January-February 1999


Tests of a Two-Photon Technique for Measuring Polarization Mode Dispersion With Subfemtosecond Precision, p. 1
Eric Dauler, Gregg Jaeger, Antoine Muller, A. Migdall, and A. Sergienko

Thermodynamic Temperatures of the Triple Points of Mercury and Gallium and in the Interval 217 K to 303 K, p. 11
M. R. Moldover, S. J. Boyes, C. W. Meyer, and A. R. H. Goodwin

Trilateral Intercomparison of Photometric Units Maintained at NIST (USA), NPL (UK), and PTB (Germany), p. 47
Yoshi Ohno, Teresa Goodman, and Georg Sauter

The NIST Quantitative Infrared Database, p. 59
P. M. Chu, F. R. Guenther, G. C. Rhoderick, and W. J. Lafferty

Toward a National Standards Strategy to Meet Global Needs, p. 83
Walter G. Leight and Krista Johnsen Leuteritz

Overview of the Federal Technical Standards Conference, p. 91
Krista Johnsen Leuteritz

First Advanced Encryption Standard (AES) Candidate Conference, p. 97
Edward Roback and Morris Dworkin

Issue 2 March-April 1999


Comparison of the NIST and BIPM Air-Kerma Standards for Measurements in the Low-Energy X-Ray Range, p. 135
D. T. Burns, P. Lamperti, and M. O'Brien

Validation of New Instrumentation for Isotope Dilution Mass Spectrometric Determination of Organic Serum Analytes, p. 141
P. Ellerbe, C. S. Phinney, L. T. Sniegoski, and M. J. Welch

Crystal Structures and Reference Powder Patterns of BaR2ZnO5(R = La, Nd, Sm, Eu, Gd, Dy, Ho, Y, Er, and Tm), p. 147
J. A. Kaduk, W. Wong-Ng, W. Greenwood, J. Dillingham, and B. H. Toby

Estimation of Concentration and Bonding Environment of Water Dissolved in Common Solvents Using Near Infrared Absorptivity, p. 173
Brian Dickens and Sabine H. Dickens

Near Infrared 45°/0° Reflectance Factor of Pressed Polytetrafluoroethylene (PTFE) Powder, p. 185
Maria E. Nadal and P. Yvonne Barnes

A Fast Method of Transforming Relaxation Functions Into the Frequency Domain, p. 189
Frederick I. Mopsik

Manufacturer's CORBA Interface Testing Toolkit: Overview, p. 193
David Flater

Issue 3 May-June 1999


The NIST Length Scale Interferometer, p. 225
John S. Beers and William B. Penzes

Vacuum Processing Technique for Development of Primary Standard Blackbodies, p. 253
M. Navaro, S. S. Bruce, B. Carol Johnson, A. V. Murthy, and R. D. Saunders

Small Angle Neutron Scattering by the Magnetic Microstructure of Nanocrystalline Ferromagnets Near Saturation, p. 261
J. Weissmüller, R. D. McMichael, A. Michels, and R. D. Shull

Primary Phase Field of the Pb-Doped 2223 High-Tc Superconductor in the (Bi, Pb)-Sr-Ca-Cu-O System, p. 277
W. Wong-Ng, L. P. Cook, A. Kearsley, and W. Greenwood

Electronic Commerce of Component Information Workshop, p. 291
James A. St. Pierre, Curtis H. Parks, and Ronald Waxman

Issue 4 July-August 1999


Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements, p. 323
M. E. Cage and A. Jeffery

A Conceptual Data Model of Datum Systems, p. 349
Michael R. McCaleb

Second Advanced Encryption Standard Candidate Conference, p. 401
Morris Dworkin

Issue 5 September-October 1999


Status Report on the First Round of the Development of the Advanced Encryption Standard, p. 435
James Nechvatal, Elaine Barker, Donna Dodson, Morris Dworkin, James Foti, and Edward Roback

Measurement of the Rheological Properties of High Performance Concrete: State of the Art Report, p. 461
Chiara F. Ferraris

On the Diffraction Limit for Lensless Imaging, p. 479
Klaus D. Mielenz

Comparative Calibration of Heat Flux Sensors in Two Blackbody Facilities, p. 487
A. V. Murthy, B. K. Tsai, and R. D. Saunders

Second Process Specification Language (PSL) Roundtable, p. 495
Craig Schlenoff

Issue 6 November-December 1999


Equivalent Electrical Circuit Representations of AC Quantized Hall Resistance Standards, p. 529
M. E. Cage, A. Jeffery, and J. Matthews

Performance Verification of Impact Machines for Testing Plastics, p. 557
T. A. Siewert, D. P. Vigliotti, L. B. Dirling, and C. N. McCowan

Applicability of Metrology to Information Technology, p. 567
Martha M. Gray

Formulation of Multiple Diffraction by Trees and Buildings for Radio Propagation Predictions for Local Multipoint Distibution Service, p. 579
Wei Zhang

Dynamic Power-Conscious Routing for MANETs: An Initial Approach, p. 587
Madhavi W. Subbarao

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