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Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal

Volume 104

 ISSN: 1044-677X

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6




Issue 1 January-February 1999

 

Tests of a Two-Photon Technique for Measuring Polarization Mode Dispersion With Subfemtosecond Precision, p. 1
Eric Dauler, Gregg Jaeger, Antoine Muller, A. Migdall, and A. Sergienko
http://dx.doi.org/10.6028/jres.104.001

Thermodynamic Temperatures of the Triple Points of Mercury and Gallium and in the Interval 217 K to 303 K, p. 11
M. R. Moldover, S. J. Boyes, C. W. Meyer, and A. R. H. Goodwin
http://dx.doi.org/10.6028/jres.104.002

Trilateral Intercomparison of Photometric Units Maintained at NIST (USA), NPL (UK), and PTB (Germany), p. 47
Yoshi Ohno, Teresa Goodman, and Georg Sauter
http://dx.doi.org/10.6028/jres.104.003

The NIST Quantitative Infrared Database, p. 59
P. M. Chu, F. R. Guenther, G. C. Rhoderick, and W. J. Lafferty
http://dx.doi.org/10.6028/jres.104.004

Toward a National Standards Strategy to Meet Global Needs, p. 83
Walter G. Leight and Krista Johnsen Leuteritz
http://dx.doi.org/10.6028/jres.104.005

Overview of the Federal Technical Standards Conference, p. 91
Krista Johnsen Leuteritz
http://dx.doi.org/10.6028/jres.104.006

First Advanced Encryption Standard (AES) Candidate Conference, p. 97
Edward Roback and Morris Dworkin
http://dx.doi.org/10.6028/jres.104.007


Issue 2 March-April 1999

 

Comparison of the NIST and BIPM Air-Kerma Standards for Measurements in the Low-Energy X-Ray Range, p. 135
D. T. Burns, P. Lamperti, and M. O'Brien
http://dx.doi.org/10.6028/jres.104.009

Validation of New Instrumentation for Isotope Dilution Mass Spectrometric Determination of Organic Serum Analytes, p. 141
P. Ellerbe, C. S. Phinney, L. T. Sniegoski, and M. J. Welch
http://dx.doi.org/10.6028/jres.104.010

Crystal Structures and Reference Powder Patterns of BaR2ZnO5(R = La, Nd, Sm, Eu, Gd, Dy, Ho, Y, Er, and Tm), p. 147
J. A. Kaduk, W. Wong-Ng, W. Greenwood, J. Dillingham, and B. H. Toby
http://dx.doi.org/10.6028/jres.104.011

Estimation of Concentration and Bonding Environment of Water Dissolved in Common Solvents Using Near Infrared Absorptivity, p. 173
Brian Dickens and Sabine H. Dickens
http://dx.doi.org/10.6028/jres.104.012

Near Infrared 45°/0° Reflectance Factor of Pressed Polytetrafluoroethylene (PTFE) Powder, p. 185
Maria E. Nadal and P. Yvonne Barnes
http://dx.doi.org/10.6028/jres.104.013

A Fast Method of Transforming Relaxation Functions Into the Frequency Domain, p. 189
Frederick I. Mopsik
http://dx.doi.org/10.6028/jres.104.014

Manufacturer's CORBA Interface Testing Toolkit: Overview, p. 193
David Flater
http://dx.doi.org/10.6028/jres.104.015


Issue 3 May-June 1999

 

The NIST Length Scale Interferometer, p. 225
John S. Beers and William B. Penzes
http://dx.doi.org/10.6028/jres.104.017

Vacuum Processing Technique for Development of Primary Standard Blackbodies, p. 253
M. Navaro, S. S. Bruce, B. Carol Johnson, A. V. Murthy, and R. D. Saunders
http://dx.doi.org/10.6028/jres.104.018

Small Angle Neutron Scattering by the Magnetic Microstructure of Nanocrystalline Ferromagnets Near Saturation, p. 261
J. Weissmüller, R. D. McMichael, A. Michels, and R. D. Shull
http://dx.doi.org/10.6028/jres.104.019

Primary Phase Field of the Pb-Doped 2223 High-Tc Superconductor in the (Bi, Pb)-Sr-Ca-Cu-O System, p. 277
W. Wong-Ng, L. P. Cook, A. Kearsley, and W. Greenwood
http://dx.doi.org/10.6028/jres.104.020

Electronic Commerce of Component Information Workshop, p. 291
James A. St. Pierre, Curtis H. Parks, and Ronald Waxman
http://dx.doi.org/10.6028/jres.104.021


Issue 4 July-August 1999

 

Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements, p. 323
M. E. Cage and A. Jeffery
http://dx.doi.org/10.6028/jres.104.023

A Conceptual Data Model of Datum Systems, p. 349
Michael R. McCaleb
http://dx.doi.org/10.6028/jres.104.024

Second Advanced Encryption Standard Candidate Conference, p. 401
Morris Dworkin
http://dx.doi.org/10.6028/jres.104.025


Issue 5 September-October 1999

 

Status Report on the First Round of the Development of the Advanced Encryption Standard, p. 435
James Nechvatal, Elaine Barker, Donna Dodson, Morris Dworkin, James Foti, and Edward Roback
http://dx.doi.org/10.6028/jres.104.027

Measurement of the Rheological Properties of High Performance Concrete: State of the Art Report, p. 461
Chiara F. Ferraris
http://dx.doi.org/10.6028/jres.104.028

On the Diffraction Limit for Lensless Imaging, p. 479
Klaus D. Mielenz
http://dx.doi.org/10.6028/jres.104.029

Comparative Calibration of Heat Flux Sensors in Two Blackbody Facilities, p. 487
A. V. Murthy, B. K. Tsai, and R. D. Saunders
http://dx.doi.org/10.6028/jres.104.030

Second Process Specification Language (PSL) Roundtable, p. 495
Craig Schlenoff
http://dx.doi.org/10.6028/jres.104.031


Issue 6 November-December 1999

 

Equivalent Electrical Circuit Representations of AC Quantized Hall Resistance Standards, p. 529
M. E. Cage, A. Jeffery, and J. Matthews
http://dx.doi.org/10.6028/jres.104.033

Performance Verification of Impact Machines for Testing Plastics, p. 557
T. A. Siewert, D. P. Vigliotti, L. B. Dirling, and C. N. McCowan
http://dx.doi.org/10.6028/jres.104.034

Applicability of Metrology to Information Technology, p. 567
Martha M. Gray
http://dx.doi.org/10.6028/jres.104.035

Formulation of Multiple Diffraction by Trees and Buildings for Radio Propagation Predictions for Local Multipoint Distibution Service, p. 579
Wei Zhang
http://dx.doi.org/10.6028/jres.104.036

Dynamic Power-Conscious Routing for MANETs: An Initial Approach, p. 587
Madhavi W. Subbarao
http://dx.doi.org/10.6028/jres.104.037

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