Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal

Volume 112

ISSN: 1044-677X

Issue 1	Issue 2
Issue 3	Issue 4
Issue 5	Issue 6

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Issue 1 January-February 2007

 

20 °C—A Short History of the Standard Reference Temperature for Industrial Dimensional Measurements, p. 1
Ted Doiron
http://dx.doi.org/10.6028/jres.112.001

Will Future Measurement Needs of the Semiconductor Industry Be Met?, p. 25
Herbert S. Bennett
http://dx.doi.org/10.6028/jres.112.002

“Once is Enough” in Radiometric Calibrations, p. 39
Gerald T. Fraser, Charles E. Gibson, Howard W. Yoon, and Albert C. Parr
http://dx.doi.org/10.6028/jres.112.003

“A Doubt is at Best an Unsafe Standard”: Measuring Sugar in the Early Bureau of Standards, p. 53
David Singerman
http://dx.doi.org/10.6028/jres.112.004

Complex Permittivity of Planar Building Materials Measured With an Ultra-Wideband Free-Field Antenna Measurement System, p. 67
Ben Davis, Chriss Grosvenor, Robert Johnk, David Novotny, James Baker-Jarvis, and Michael Janezic
http://dx.doi.org/10.6028/jres.112.005

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Issue 2 March-April 2007

 

4He Thermophysical Properties: New Ab Initio Calculations, p. 75
John J. Hurly and James B. Mehl
http://dx.doi.org/10.6028/jres.112.006

Cosmic Coincidences: Investigations for Neutron Background Suppression, p. 95
Craig R. Heimbach
http://dx.doi.org/10.6028/jres.112.007

Effect of Power Line Interference on Microphone Calibration Measurements Made at or Near Harmonics of the Power Line Frequency, p. 107
Randall P. Wagner and Victor Nedzelnitsky
http://dx.doi.org/10.6028/jres.112.008

Low Cost Digital Vibration Meter, p. 115
W. Vance Payne and Jon Geist
http://dx.doi.org/10.6028/jres.112.009

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Issue 3 May-June 2007

 

Comparison of Calibration Methods for Tristimulus Colorimeters, p. 129
James L. Gardner
http://dx.doi.org/10.6028/jres.112.010

Biophotonic Tools in Cell and Tissue Diagnostics, p. 139
Michael Brownstein, Robert A. Hoffman, Richard Levenson, Thomas E. Milner, M. L. Dowell, P. A. Williams, G. S. White, A. K. Gaigalas, and J. C. Hwang
http://dx.doi.org/10.6028/jres.112.011

Flow Control Through the Use of Topography, p. 153
D. L. Cotrell and A. J. Kearsley
http://dx.doi.org/10.6028/jres.112.012

Acoustic Eigenvalues of a Quasispherical Resonator: Second Order Shape Perturbation Theory for Arbitrary Modes, p. 163
James B. Mehl
http://dx.doi.org/10.6028/jres.112.013

Erratum: See correct description of Cover art for Volume 112, Number 2, March-April 2007, p. 175
http://dx.doi.org/10.6028/jres.112.014

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Issue 4 July-August 2007

 

Microwave Power Absorption in Low-Reflectance, Complex, Lossy Transmission Lines, p. 177
Jon Geist, Jayna J. Shah, Mulpuri V. Rao, and Michael Gaitan
http://dx.doi.org/10.6028/jres.112.015

Modeling of Photochemical Reactions in a Focused Laser Beam, p. 191
A. K. Gaigalas, F. Y. Hunt, and L. Wang
http://dx.doi.org/10.6028/jres.112.016

Extracting Electron Densities in N-Type GaAs From Raman Spectra: Theory, p. 209
Herbert S. Bennett
http://dx.doi.org/10.6028/jres.112.017

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Issue 5 September-October 2007

 

Electro-Physical Technique for Post-Fabrication Measurements of CMOS Process Layer Thicknesses, p. 223
Janet C. Marshall and P. Thomas Vernier
http://dx.doi.org/10.6028/jres.112.018

Measurement Tools for the Immersive Visualization Environment: Steps Toward the Virtual Laboratory, p. 257
John G. Hagedorn, Joy P. Dunkers, Steven G. Satterfield, Adele P. Peskin, John T. Kelso, and Judith E. Terrill
http://dx.doi.org/10.6028/jres.112.019

Convective Instabilities in Two Liquid Layers, p. 271
G. B. McFadden, S. R. Coriell, K. F. Gurski, and D. L. Cotrell
http://dx.doi.org/10.6028/jres.112.020

Comparison Between NIST and AF Laser Energy Standards Using High Power Lasers, p. 283
Xiaoyu Li, Thomas Scott, Chris Cromer, David Cooper, and Steven Comisford
http://dx.doi.org/10.6028/jres.112.021

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Issue 6 November-December 2007

 

Optical Frequency Metrology of an Iodine-Stabilized He-Ne Laser Using the Frequency Comb of a Quantum-Interference-Stabilized Mode-Locked Laser, p. 289
Ryan P. Smith, Peter A. Roos, Jared K. Wahlstrand, Jessica A. Pipis, Maria Belmonte Rivas, and Steven T. Cundiff
http://dx.doi.org/10.6028/jres.112.022

Comment on “Argon I Lines Produced in a Hollow Cathode Source, 332 nm to 5865 nm”, p. 297
Craig J. Sansonetti
http://dx.doi.org/10.6028/jres.112.023

Holmium Oxide Glass Wavelength Standards, p. 303
David W. Allen
http://dx.doi.org/10.6028/jres.112.024

A Quantum Algorithm Detecting Concentrated Maps, p. 307
Isabel Beichl, Stephen S. Bullock, and Daegene Song
http://dx.doi.org/10.6028/jres.112.025

Subject Index to Volume 112, p. 313

Author Index to Volume 112, p. 317