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Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal

Volume 112

 ISSN: 1044-677X

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6

Issue 1 January-February 2007


20 °C—A Short History of the Standard Reference Temperature for Industrial Dimensional Measurements, p. 1
Ted Doiron

Will Future Measurement Needs of the Semiconductor Industry Be Met?, p. 25
Herbert S. Bennett

“Once is Enough” in Radiometric Calibrations, p. 39
Gerald T. Fraser, Charles E. Gibson, Howard W. Yoon, and Albert C. Parr

“A Doubt is at Best an Unsafe Standard”: Measuring Sugar in the Early Bureau of Standards, p. 53
David Singerman

Complex Permittivity of Planar Building Materials Measured With an Ultra-Wideband Free-Field Antenna Measurement System, p. 67
Ben Davis, Chriss Grosvenor, Robert Johnk, David Novotny, James Baker-Jarvis, and Michael Janezic

Issue 2 March-April 2007


4He Thermophysical Properties: New Ab Initio Calculations, p. 75
John J. Hurly and James B. Mehl

Cosmic Coincidences: Investigations for Neutron Background Suppression, p. 95
Craig R. Heimbach

Effect of Power Line Interference on Microphone Calibration Measurements Made at or Near Harmonics of the Power Line Frequency, p. 107
Randall P. Wagner and Victor Nedzelnitsky

Low Cost Digital Vibration Meter, p. 115
W. Vance Payne and Jon Geist

Issue 3 May-June 2007


Comparison of Calibration Methods for Tristimulus Colorimeters, p. 129
James L. Gardner

Biophotonic Tools in Cell and Tissue Diagnostics, p. 139
Michael Brownstein, Robert A. Hoffman, Richard Levenson, Thomas E. Milner, M. L. Dowell, P. A. Williams, G. S. White, A. K. Gaigalas, and J. C. Hwang

Flow Control Through the Use of Topography, p. 153
D. L. Cotrell and A. J. Kearsley

Acoustic Eigenvalues of a Quasispherical Resonator: Second Order Shape Perturbation Theory for Arbitrary Modes, p. 163
James B. Mehl

Erratum: See correct description of Cover art for Volume 112, Number 2, March-April 2007, p. 175

Issue 4 July-August 2007


Microwave Power Absorption in Low-Reflectance, Complex, Lossy Transmission Lines, p. 177
Jon Geist, Jayna J. Shah, Mulpuri V. Rao, and Michael Gaitan

Modeling of Photochemical Reactions in a Focused Laser Beam, p. 191
A. K. Gaigalas, F. Y. Hunt, and L. Wang

Extracting Electron Densities in N-Type GaAs From Raman Spectra: Theory, p. 209
Herbert S. Bennett

Issue 5 September-October 2007


Electro-Physical Technique for Post-Fabrication Measurements of CMOS Process Layer Thicknesses, p. 223
Janet C. Marshall and P. Thomas Vernier

Measurement Tools for the Immersive Visualization Environment: Steps Toward the Virtual Laboratory, p. 257
John G. Hagedorn, Joy P. Dunkers, Steven G. Satterfield, Adele P. Peskin, John T. Kelso, and Judith E. Terrill

Convective Instabilities in Two Liquid Layers, p. 271
G. B. McFadden, S. R. Coriell, K. F. Gurski, and D. L. Cotrell

Comparison Between NIST and AF Laser Energy Standards Using High Power Lasers, p. 283
Xiaoyu Li, Thomas Scott, Chris Cromer, David Cooper, and Steven Comisford

Issue 6 November-December 2007


Optical Frequency Metrology of an Iodine-Stabilized He-Ne Laser Using the Frequency Comb of a Quantum-Interference-Stabilized Mode-Locked Laser, p. 289
Ryan P. Smith, Peter A. Roos, Jared K. Wahlstrand, Jessica A. Pipis, Maria Belmonte Rivas, and Steven T. Cundiff

Comment on “Argon I Lines Produced in a Hollow Cathode Source, 332 nm to 5865 nm”, p. 297
Craig J. Sansonetti

Holmium Oxide Glass Wavelength Standards, p. 303
David W. Allen

A Quantum Algorithm Detecting Concentrated Maps, p. 307
Isabel Beichl, Stephen S. Bullock, and Daegene Song

Subject Index to Volume 112, p. 313

Author Index to Volume 112, p. 317

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