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Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal 

Volume 117 (2012)

ISSN: 2165-7254

The Interaction of Radio-Frequency Fields with Dielectric
Materials at Macroscopic to Mesoscopic Scales

James Baker-Jarvis, and Sung Kim

Double-Focusing Thermal Triple-Axis Spectrometer at the

J. W. Lynn, Y. Chen, S. Chang, Y. Zhao, S. Chi, W. Ratcliff II, B. G. Ueland, and R. W. Erwin

of Broadband UV Measurements for 365 nm LED

George P. Eppeldauer

The Effect of Non-equispaced Sampling Instants, Sub-period
Record Epochs, and Timebase Gain on the Information Content of Discretized
Replicas of Periodic Signals

N. G. Paulter, Jr.

NIST Ionization Chamber "A" Sample-Height


Ryan Fitzgerald

Fractional diffusion, low exponent Lévy stable laws, and 'slow
motion' denoising of helium ion microscope nanoscale imagery

Alfred S. Carasso, and András E. Vladár

Measurements for the Development of a Simulated Naturally
Occurring Radioactive Material

This manuscript is being revised to correct an error in the original regarding a graph in Figure 2. The spectra did not display properly on the graph labeled “Fertilizer”. This version supersedes the version published in April 2012.
L. Pibida

A Comparison of Harwell & FWT Alanine Temperature
Coefficients From 25 °C to 80 °C

Marc F. Desrosiers, Anne M. Forney, and James M. Puhl

Computational Seebeck coefficient measurement

Joshua Martin

Instrument Control (iC) – An Open-Source Software to Automate
Test Equipment

K. P. Pernstich

Lunar Spectral Irradiance and Radiance (LUSI): New
Instrumentation to Characterize the Moon as a Space-Based Radiometric

Allan W. Smith, Steven R. Lorentz, Thomas C. Stone, and Raju V. Datla

Measurement of Scattering Cross Section with a
Spectrophotometer with an Integrating Sphere Detector

Adolfas K. Gaigalas, Lili Wang, Victoria Karpiak, Yu-Zhong Zhang,and Steven Choquette

A Model for Geometry-Dependent Errors in Length

Daniel Sawyer, Brian Parry, Steven Phillips, Chris Blackburn, and Bala Muralikrishnan

Sealed Gravitational Capillary Viscometry of Dimethyl Ether and
Two Next-Generation Alternative Refrigerants

Dylan S. Cousins and Arno Laesecke

Variances of Cylinder Parameters Fitted to Range

Marek Franaszek

Evolution of Microwave Spectroscopy at the National Bureau of
Standards (NBS) and the National Institute of Standards and Technology

F.J. Lovas, D.R. Lide Jr., R.D. Suenram, and D.R. Johnson

Reduction Formulae for Products of Theta

P.L. Walker

Evaluation of the Current Status of the Combinatorial Approach
for the Study of Phase Diagram

W. Wong-Ng

Optical-Fiber Power Meter Comparison between NIST and KRISS
I. Vayshenker, S. K. Kim, K. Hong, D.-H. Lee, D. J. Livigni, X. Li, and J. H. Lehman

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