Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal

Volume 95

 ISSN: 1044-677X

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6




Issue 1 January 1990

 

New program and directions at the National Institute of Standards and Technology, p. 1
Johnson, D.R.
http://dx.doi.org/10.6028/jres.095.002

Apparatus for simultaneous small-angle neutron scattering and steady shear viscosity studies of polymer melts and solutions, p. 7
Nakatani, A.I.; Kim, H.; Han, C.C.
http://dx.doi.org/10.6028/jres.095.003

Dynamics of the bell prover, II, p. 15
Ruegg, F.W.; Ruegg, F.C.
http://dx.doi.org/10.6028/jres.095.004

A proposed dynamic pressure and temperature primary standard, p. 33
Rosasco, G.J.; Bean, V.E.; Hurst, W.S.
http://dx.doi.org/10.6028/jres.095.005

Spectroradiometric determination of the freezing temperature of gold, p. 49
Mielenz, K.D.; Saunders, R.D.; Shumaker, J.B.
http://dx.doi.org/10.6028/jres.095.006

Special report on the International Temperature Scale of 1990 - Report on the 17Th Session of the Consultative Committee on thermometry, p. 69
Mangum, B.W.
http://dx.doi.org/10.6028/jres.095.007

New assignment of mass values and uncertainties to NIST working standards, p. 79
Davis, R.S.
http://dx.doi.org/10.6028/jres.095.008

Observation and an explanation of breakdown of the quantum Hall effect, p. 93
Cage, M.E.; Yu, D.Y.; Reedtz, G.M.
http://dx.doi.org/10.6028/jres.095.009

News briefs, p. 101
http://dx.doi.org/10.6028/jres.095.0010


Issue 2 March 1990

 

Radon measurement standards and calibration, Preface
Hutchinson, J.M.R.; Colle, R.
http://dx.doi.org/10.6028/jres.095.001

Calibration of Rn-222 reference instrument in Sweden, p. 115
Falk, R.; More, H.; Nyblom, L.
http://dx.doi.org/10.6028/jres.095.011

Bureau of Mines method of calibrating a primary radon measuring apparatus, p. 121
Holub, R.F.; Stroud, W.P.
http://dx.doi.org/10.6028/jres.095.012

A calibration and quality assurance program for environmental radon measurements, p. 127
Fisenne, I.M.; George, A.C.; Keller, H.W.
http://dx.doi.org/10.6028/jres.095.013

U.K. National Radiological Protection Board radon calibration procedures, p. 135
Cliff, K.D.
http://dx.doi.org/10.6028/jres.095.014

Enea reference atmosphere facility for testing radon and daughters measuring equipment, p. 139
Sciocchetti, G.; Scacco, F.; Tosti, S.; Baldassini, P.G.; Soldano, E.
http://dx.doi.org/10.6028/jres.095.015

Calibration of scintillation cells for radon-222 measurements at the U.S. Environmental Protection Agency, p. 143
Sensintaffar, E.L.; Windham, S.T.
http://dx.doi.org/10.6028/jres.095.016

ICARE radon calibration device, p. 147
Zettwoog, P.
http://dx.doi.org/10.6028/jres.095.017

The NIST primary radon-222 measurement system, p. 155
Colle, R; Hutchinson, J.M.R.; Unterweger, M.P.
http://dx.doi.org/10.6028/jres.095.018

The closed-can exhalation method for measuring radon, p. 167
Samuelsson, C.
http://dx.doi.org/10.6028/jres.095.019

Standarization of Rn-222 at the Australian Radiation Laboratory, p. 171
Gan, T.H.; Solomon, S.B.; Peggie, J.R.
http://dx.doi.org/10.6028/jres.095.020

Standardization of radon measurements: II. Accuracy and proficiency testing, p. 177
Matuszek, J.M.
http://dx.doi.org/10.6028/jres.095.021

Conference on Fifty Years With Nuclear Fission - Washington, DC and Gaithersburg, MD- April 25-28, 1989, p. 183
Wasson, O.A.
http://dx.doi.org/10.6028/jres.095.022

Twelfth National Computer Security Conference - Baltimore, MD - October 10-13, 1989, p. 189
Lennon, E.B.
http://dx.doi.org/10.6028/jres.095.023

Second International Conference on Chemical Kinetics - Gaithersburg, MD - July 24-27, 1989, p. 195
Herron, J.T.; Tsang, W.
http://dx.doi.org/10.6028/jres.095.024

News briefs, p. 199
http://dx.doi.org/10.6028/jres.095.025


Issue 3 May 1990

 

Operation of NIST Josephson array voltage standards, p. 219
Hamilton, C.A.; Burroughs, C.; Chieh, K.
http://dx.doi.org/10.6028/jres.095.026

The calibration of dc voltage standards at NIST, p. 237
Field, B.F.
http://dx.doi.org/10.6028/jres.095.027

NBS/NIST gas thermometry from 0°C to 660°C, p. 255
Schooley, J.F.
http://dx.doi.org/10.6028/jres.095.028

Phase equilibria and crystal chemistry in portions of the system SrO-CaO-Bi2O3-CuO, Part II - The system SrO-Bi2O3-CuO, p. 291
Roth, R.S.; Rawn, C.J.; Burton, B.P.; Beech, F.
http://dx.doi.org/10.6028/jres.095.029

Scattered light and other corrections in absorption coefficient measurements in the vacuum ultraviolet: A systems approach, p. 337
Klein, R.; Braun, W.; Fahr, A.; Mele, A.; Okabe, H.
http://dx.doi.org/10.6028/jres.095.030

Hypertext Standardization Workshop - Gaithersburg, MD - January 16-18, 1990, p. 345
Baronas, J.
http://dx.doi.org/10.6028/jres.095.031

Sixth International Conference on High Temperatures - Chemistry of Inorganic Materials - Gaithersburg, MD - April 3-7, 1989, p. 349
Baronas, J.
http://dx.doi.org/10.6028/jres.095.032

News briefs, p. 359
http://dx.doi.org/10.6028/jres.095.033


Issue 4 July 1990

 

Standards for waveform metrology based on digital techniques, p. 377
Bell, B.A.
http://dx.doi.org/10.6028/jres.095.034

The diffusion of charged particles in collisional plasmas: Free and ambipolar diffusion at low and moderate pressures, p. 407
Phelps, A.V.
http://dx.doi.org/10.6028/jres.095.035

Tables of the inverse Laplace transform of the function e -S-Beta, p. 433
Dishon, M.; Bendler, J.T.; Weiss, G.H.
http://dx.doi.org/10.6028/jres.095.036

International Conference on Narrow-Gap Semiconductors and Related Materials - Gaithersburg, MD - June 12-15, 1989, p. 469
Seiler, D.G.; Littler, C.L.
http://dx.doi.org/10.6028/jres.095.037

News briefs, p. 483
http://dx.doi.org/10.6028/jres.095.038


Issue 5 September 1990

 

Recommended values of the fundamental physical constants: A status report, p. 497
Taylor, B.N.; Cohen, E.R.
http://dx.doi.org/10.6028/jres.095.039

An international comparison of absolute radiant power measurement capabilities, p. 525
Thomas, D.B.
http://dx.doi.org/10.6028/jres.095.040

Results of a CIE detector response intercomparison, p. 533
Thomas, D.B.; Zalewski, F.
http://dx.doi.org/10.6028/jres.095.041

Effects of the International Temperature Scale of 1990 (ITS-90) on CIE documentary standards for radiometry, photometry, and colorimetry, p. 545
Mielenz, K.D.; Hsia, J.J.
http://dx.doi.org/10.6028/jres.095.042

An accurate value for the absorption coefficient of silicon at 633 nm, p. 549
Geist, J.; Schaefer, A.R.; Song, J.F.; Wang, Y.H.; Zalewski, E.F.
http://dx.doi.org/10.6028/jres.095.043

Hard x-ray microscope with submicrometer spatial resolution, p. 559
Kuriyama, M.; Dobbyn, R.C.; Spal, R.D.; Burdette, H.E.; Black, D.R.
http://dx.doi.org/10.6028/jres.095.044

Software techniques to improve data reliability in superconductor and low-resistance measurements, p. 575
Goodrich, L.F.; Srivastava, A.N.
http://dx.doi.org/10.6028/jres.095.045

Workshop on Intelligent Processing for Primary Metals - Gaithersburg, MD - August 29-30, 1989, p. 591
Early, J.G.
http://dx.doi.org/10.6028/jres.095.046

Data Administration Management Association Symposium - Gaithersburg, MD - May 7-8, 1990, p. 597
Newton, J.
http://dx.doi.org/10.6028/jres.095.047

Cimcon'90 Conference - Computer Integrated Manufacturing (CIM) Architecture Conference (CON) - Gaithersburg, MD - May 22-24, 1990, p. 601
Jones, A.
http://dx.doi.org/10.6028/jres.095.048

News briefs, p. 605
http://dx.doi.org/10.6028/jres.095.049


Issue 6 November 1990

 

The 1990 NIST scales of thermal radiometry, p. 621
Mielenz, K.D.; Saunders, R.D.; Parr, A.C.; Hsia, J.J.
http://dx.doi.org/10.6028/jres.095.050

Low-contrast thermal resolution test targets: A new approach, p. 631
Geist, J.; Novotny, D.B.
http://dx.doi.org/10.6028/jres.095.051

Analysis of the spectrum of doubly ionized molybdenum (Mo-III), p. 647
Iglesias, L.; Cabeza, M.I.; Kaufman, V.
http://dx.doi.org/10.6028/jres.095.052

Survey of industrial, agricultural, and medical applications of radiometric gauging and process control, p. 689
Hubbell, J.H.
http://dx.doi.org/10.6028/jres.095.053

Vapor-liquid equilibrium of carbon dioxide with isobutane and n-butane: Modified leung-griffiths correlation and data evaluation, p. 701
Rainwater, J.C.; Ingham, H.; Lynch, J.J.
http://dx.doi.org/10.6028/jres.095.054

Fiftieth Annual Conference on Physical Electronics - Gaithersburg, MD - June 11-13, 1990, p. 719
Cavanagh, R.
http://dx.doi.org/10.6028/jres.095.055

North American Integrated Services Digital Network (ISDN) Users' Forum (NIU-Forum) - Gaithersburg, MD -August 6-9, 1990, p. 723
Lennon, E.B.
http://dx.doi.org/10.6028/jres.095.056

News briefs, p. 725
http://dx.doi.org/10.6028/jres.095.057

*
Bookmark and Share

iso logo
Contact

Information Desk:
301-975-3052 Telephone
301-869-8071 Facsimile
library@nist.gov

100 Bureau Drive, Stop 2500
Gaithersburg, MD 20899-2500