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Nathan Nakamura (Assoc)

Nathan Nakamura is a physicist in the Quantum Sensors Group at NIST. His research interests include the use of superconducting x-ray microcalorimeters for applications such as computed tomography and x-ray spectroscopy and the application of Monte Carlo approaches to model superconducting x-ray sensors and associated instrumentation. He joined NIST in 2020 as a National Research Council (NRC) postdoctoral fellow.

Publications

Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer

Author(s)
Nathan Nakamura, Paul Szypryt, Amber Dagel, Bradley Alpert, Douglas Bennett, W.Bertrand (Randy) Doriese, Malcolm Durkin, Joseph Fowler, Dylan Fox, Johnathon Gard, Ryan Goodner, James Zachariah Harris, Gene C. Hilton, Edward Jimenez, Burke Kernen, Kurt Larson, Zachary H. Levine, Daniel McArthur, Kelsey Morgan, Galen O'Neil, Christine Pappas, Carl D. Reintsema, Dan Schmidt, Peter Schulz, Daniel Swetz, Kyle Thompson, Joel Ullom, Leila R. Vale, Courtenay Vaughan, Christopher Walker, Joel Weber, Jason Wheeler
X-ray nanotomography is a powerful tool for the characterization of nanoscale materials and structures, but it is difficult to implement due to the competing

A tabletop x-ray tomography instrument for nanometer-scale imaging: demonstration of the 1,000-element transition-edge sensor subarray

Author(s)
Paul Szypryt, Nathan J. Nakamura, Dan Becker, Douglas Bennett, Amber L. Dagel, W.Bertrand (Randy) Doriese, Joseph Fowler, Johnathon Gard, J. Zachariah Harris, Gene C. Hilton, Jozsef Imrek, Edward S. Jimenez, Kurt W. Larson, Zachary H. Levine, John Mates, Daniel McArthur, Luis Miaja Avila, Kelsey Morgan, Galen O'Neil, Nathan Ortiz, Christine G. Pappas, Dan Schmidt, Kyle R. Thompson, Joel Ullom, Leila R. Vale, Michael Vissers, Christopher Walker, Joel Weber, Abigail Wessels, Jason W. Wheeler, Daniel Swetz
We report on the 1,000-element transition-edge sensor (TES) x-ray spectrometer implementation of the TOMographic Circuit Analysis Tool (TOMCAT). TOMCAT combines

Design of a 3000 pixel transition-edge sensor x-ray spectrometer for microcircuit tomography

Author(s)
Paul Szypryt, Douglas Bennett, William J. Boone, Amber L. Dagel, G Dalton, William Doriese, Malcolm Durkin, Joseph Fowler, Edward Garboczi, Jonathon D. Gard, Gene Hilton, Jozsef Imrek, E S. Jimenez, Vincent Y. Kotsubo, K Larson, Zachary H. Levine, John Mates, D McArthur, Kelsey Morgan, Nathan J. Nakamura, Galen O'Neil, Nathan Ortiz, Christine G. Pappas, Carl Reintsema, Dan Schmidt, Daniel Swetz, K R. Thompson, Joel Ullom, C Walker, Joel C. Weber, Abigail Wessels, J W. Wheeler
Feature sizes in integrated circuits have decreased substantially over time, and it has become increasingly difficult to three-dimensionally image these complex
View more Publications
Created September 2, 2020, Updated October 11, 2023