The 2017 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) will be held at the Monterey Marriott in Monterey, CA, Mar. 21-23, 2017.
Monterey is a scenic California coastal city that rises from the
pristine Monterey Bay to pine forested hillsides with sweeping bay
The FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond.
- Alex Braun, "A Jaunt Through Nanotechnopolis,"
"If you want to meet, greet, and learn from the world's experts in metrology, this is the place to be."
- Dan Hutcheson, The Chip Insider,
Start Date: Tuesday, March 21, 2017
End Date: Thursday, March 23, 2017
Location: Monterey Marriott, Monterey, CA
Audience: Industry, Government, Academia
On-line advanced registration will be available soon!