The 2015 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) was held at the Hilton Dresden Downtown in Dresden, Germany, April 14-16, 2015.
While a city of notable art treasure, architectural sights, and a charming landscape, Dresden also has largest hub of microelectronics in Europe. Dresden is a center of materials science and engineering (more than 2000 materials scientists and engineers at TU Dresden and in several institutes).
The FCMN brought together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. All approaches were welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference summarized major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond.
Bios and pictures for many of our invited speakers are available on-line here.
- Alex Braun, "A Jaunt Through Nanotechnopolis,"
"If you want to meet, greet, and learn from the world's experts in metrology, this is the place to be."
- Dan Hutcheson, The Chip Insider,
Start Date: Tuesday, April 14, 2015
End Date: Thursday, April 16, 2015
Location: Hilton Dresden Downtown, Dresden, Germany
Audience: Industry, Government, Academia