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Jay H. Zimmerman

Mr. Zimmerman is a computer scientist in the Dimensional Metrology Group (683.01) in the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). He enjoys a challenging and rewarding career associated with science and technology and works with professional staff that provide a range of products and services that improve the quality of U.S. organizations, goods, and services and enhance the technology and manufacturing infrastructure of the U.S.

NIST: Jay H. Zimmerman at work.

NIST: Jay H. Zimmerman at work.

Mr. Zimmerman serves as applications programmer for his group and webmaster for his division. His professional experience includes applied computing and physical measurement quality control and experimental design. His computer science work draws on his in-depth knowledge of the theoretical foundations of computer science, including computer system and system software organization, the theoretical models for the representation and transformation of information structures, and knowledge of relevant mathematical and statistical sciences.

His work and interests combines computer technology, dimensional metrology, and measurement assurance and standards. Mr. Zimmerman developed scientific software applications to measure precision length measuring standards, i.e., gage blocks, thread wires, precision cylinders and balls, angle blocks, using database management and statistical process control to improve measurement quality, which is used at NIST and other government or government-operated laboratories. He developed and worked with vision-based systems for calibrating dimensional gages and for measuring industrial prototypes and standards.

Mr. Zimmerman has conducted research in computer-aided design (CAD) directed inspection and analysis techniques using the Dimensional Measuring Interface Standard (DMIS) and incorporating these techniques into a flexible manufacturing environment of which the research included the integration of DMIS and vision-based data collection and inspection analysis techniques as well as post-process gauging support of the Quality in Automation (QIA) project. He developed and manages the Engineering Metrology Toolbox, which is a web-based dimensional measurement computer software tool.

Mr. Zimmerman, a native of Frederick, MD, has taught at Frederick Community College since 1989. At Frederick Community College and Hagerstown Community College, Mr. Zimmerman taught a microprocessor assembly language programming course as an interactive video teleconferencing classroom distance education class supported by the Maryland Distance Learning Network.

Jay H. Zimmerman

Position:

Computer Scientist
Semiconductor & Dimensional Metrology Division
Dimensional Metrology Group

Employment History:

National Institute of Standards and Technology
Gaithersburg, MD 20899
Computer Scientist, 1984–Present

Frederick Community College
Frederick, MD 21702
Adjunct Instructor, 1989–Present

Education:

Hood College Graduate School
Frederick, MD 21701
M.S., Computer Science, 1989

Hood College

Frederick, MD 21701
B.A., Chemistry with Secondary Education Certification, 1981

Frederick Community College
Frederick, MD 21702
A.A., General Studies, 1979
Contact

Phone: 301-975-3480
Email: jay.zimmerman@nist.gov
Fax: 301-975-5360