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Research Activities – Papers

Measurement Uncertainty


Uncertainty due to Finite Resolution Measurements, Phillips, Steven D. Dr., Tolman, B., Estler, William T. Dr. (Tyler), Journal of Research of the National Institute of Standards and Technology 113, pp. 143-153 (2008).

The Validation of CMM Task Specific Measurement Uncertainty Software, Phillips, Steven D. Dr., Borchardt, Bruce R., Abackerli, A., Shakarji, Craig M., Sawyer, Daniel S., Murray, P., Rasnick, B., Summerhays, K., Baldwin, J.M., Henke, M.P., Proceedings of American Society for Precision Engineering 2003 Summer Topical Meeting on Coordinate Measuring Machines, Charlotte, North Carolina, June 25–26 (2003).

A Careful Consideration of the Calibration Concept, Phillips, Steven D. Dr., Estler, William T. Dr. (Tyler), Doiron, Theodore D. Dr., Eberhardt, K., Levenson, M., Journal of Research of the National Institute of Standards and Technology 106, pp. 1–9 (2001).

Measurement Uncertainty and Uncorrected Bias, Phillips, Steven D. Dr., Eberhardt, K., Estler, William T. Dr. (Tyler), Proceedings of 1999 National Conference of Standards Laboratories Workshop and Symposium, Charlotte, North Carolina, pp. 831-845 (1999).

The Calculation of CMM Measurement Uncertainty via the Method of Simulation by Constraints, Phillips, Steven D. Dr., Borchardt, Bruce R., Sawyer, Daniel S., Estler, William T. Dr. (Tyler), Ward, David E., Eberhardt, K., Levenson, M., McClain, Marjorie A., Melvin, B., Hopp, Ted, Shen, Y., Proceedings of American Society for Precision Engineering, Norfolk, Virginia, pp. 443-446 (1997).

Tracker and Scanner Performance


Measuring scale errors in a laser tracker’s horizontal angle encoder through simple length measurement and two-face system tests, Muralikrishnan, B., Blackburn, C., Sawyer, D., Phillips, S., and Bridges, R., Journal of Research of the National Institute of Standards and Technology 115 (5), pp. 291-301 (2010).

Choosing test positions for laser tracker evaluation and future Standards development, Muralikrishnan, Bala, Sawyer, Daniel S., Blackburn, Christopher J., Phillips, Steven D., Shakarji, Craig M., Morse, Edward P., and Bridges, Robert, Proceedings of the Coordinate Metrology Systems Conference, Reno, Nevada (2010).

Dimensional measurement traceability of 3D imaging data, Phillips, Steve, Krystek, Michael, Shakarji, Craig, and Summerhays, Kim, Proceedings of the SPIE 7239 (72390E), San Jose, California, January 19 (2009).

ASME B89.4.19 Performance Evaluation Tests and Geometric Misalignments in Laser Trackers, Muralikrishnan, Bala, Sawyer, Daniel S., Blackburn, Christopher J., Phillips, Steven D. Dr., Borchardt, Bruce R., Estler, William T. Dr. (Tyler), Journal of Research of the National Institute of Standards and Technology 114, pp. 21-35 (2009).

Performance Evaluation of Laser Trackers, Muralikrishnan, Bala, Sawyer, Daniel S., Blackburn, Christopher J., Phillips, Steven D. Dr., Borchardt, Bruce R., Estler, William T. Dr. (Tyler), Performance Metrics for Intelligent Systems Workshop, PerMIS’08, Gaithersburg, Maryland, August 19-21 (2008) (This article has been selected to appear as a Springer book chapter).

Laser Tracker Testing at NIST using the ASME B89.4.19 Standard, Muralikrishnan, Bala, Blackburn, Christopher J., Sawyer, Daniel S., Borchardt, Bruce R., Estler, William T. Dr. (Tyler), Phillips, Steven D. Dr., Journal of the Coordinate Metrology Systems Conference 2 (2), Autumn 2007, pp. 11-17 (2007).

A Laser Tracker Calibration System, Sawyer, Daniel S., Borchardt, Bruce R., Phillips, Steven D. Dr., Fronczek, Charles, Estler, William T. Dr. (Tyler), Proceedings of Measurement Science Conference, Anaheim, California, January 24-25 (2002).

Artifacts for CMM Evaluation


A Novel Artifact for Testing Large Coordinate Measuring Machines, Phillips, Steven D. Dr., Sawyer, Daniel S., Borchardt, Bruce R., Ward, D.E., Beutel, D.E., Precision Engineering 25, pp. 29-34 (2001).

Error Compensation for CMM Touch Trigger Probes, Estler, William T. Dr. (Tyler), Phillips, Steven D. Dr., Borchardt, Bruce R., Hopp, Ted, Witzgall, G., Levenson, M., Eberhardt, K., McClain, Marjorie A., Shen, Y., Zhang, X., Precision Engineering 19, pp. 85-97 (1996).

Tape Tunnel


Large-Scale Metrology Performance Evaluations at NIST, Estler, William T. Dr. (Tyler), Sawyer, Daniel S., Borchardt, Bruce R., Phillips, Steven D. Dr., Journal of the Coordinate Metrology Systems Conference, 1 (2), pp. 27-32 (2006).

Recent Developments in Large-Scale Metrology, Peggs, G.N., Maropoulos, P.G., Hughes, E.B., Forbes, A.B., Robson, S., Zeibart, M., Muralikrishnan, B., Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture (in press).

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Physical Measurement Laboratory (PML)
Semiconductor & Dimensional Metrology Division

Dimensional Metrology Group (683.01)
Dr. Theodore D. Doiron, Leader

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