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Son H. Bui

Mr. Bui is a guest researcher in the Surface & Nanostructure Metrology Group (683.02) in the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST).

Position:

Guest Researcher
Semiconductor & Dimensional Metrology Division
Surface & Nanostructure Metrology Group
Contact

Phone: 301-975-6595
Email: son.bui@nist.gov
Fax: 301-975-4396