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Dr. Bin Ming

Dr. Ming is a guest researcher in the Nanoscale Metrology Group (683.03) in the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST).

Position:

Guest Researcher
Semiconductor & Dimensional Metrology Division
Nanoscale Metrology Group
Contact

Phone: 301-975-2312
Email: bin.ming@nist.gov
Fax: 301-869-0822