Nanoscale Metrology Group

The Nanoscale Metrology Group in the Semiconductor & Dimensional Metrology Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST), develops length measurement science and technology for advanced manufacturing nanotechnology and nanoscience, including time-resolved length.  This measurement capability is critically needed, for example, by the semiconductor manufacturing industry for continued scaling and device integration, and for next-generation technology devices.  The Group disseminates the SI base unit of length down to the atomic scale, and the derived units of acceleration and acoustic pressure.  Current focus areas include three-dimensional metrology of nanostructures including nanoparticles; micro- and nano-fluidic devices; and micro-electromechanical systems (MEMS).  The Group develops and applies displacement interferometry and advanced microscopy methods such as scanning electron, atomic force, helium ion, and optical.