Dr. M. Yaqub Afridi received his D.Sc. degree in electrical engineering from The George Washington University, Washington, DC, in 2002. As a graduate student, he was awarded a Graduate Research Fellowship with the National Institute of Standards and Technology (NIST), Gaithersburg, MD, from 1997 through 2002. His areas of expertise are analog and digital interface circuit design and fabrication technologies for MEMS-based microsensor devices. Dr. Afridi currently works in the NIST Nanoscale Metrology Group's MEMS Measurement Science and Standards Project.
Semiconductor & Dimensional Metrology Division
Nanoscale Metrology Group