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Nanoscale Spectroscopy Group

Conducts basic research to advance the optical and electrical measurement science infrastructure necessary for innovation in future thin-film devices and their component materials for nanoelectronic, optoelectronic, and quantum information applications.

The Nanoscale Spectroscopy Group harnesses light-matter interactions for nanoscale metrology of materials and devices in critical and emerging technologies. The group’s current expertise includes nanoscale scanned-probe spectroscopy, optical techniques for spectroscopy and dynamics, manipulation of matter on the nanoscale, electronic and photonic device physics, optoelectronic characterization of individual nano structures, and advancing metrology for defect-based devices. These capabilities are applied in research programs that support development in applications such as optoelectronics, future semiconductor electronics, quantum sensing, and quantum information science.

News and Updates

Projects and Programs

Accurate Mapping of Thermal Properties at the Nanoscale

Ongoing
Continuous advances in the performance and functionality of semiconductor devices have been driven by scale reduction, incorporation of new and nanomaterials, and by heterogeneous integration (HI). However, such scaling and integrated architecture has rendered existing thermal metrology inadequate...

Carrier Dynamics Measured by Ultrafast Time-Resolved Terahertz Spectroscopy

Ongoing
We employ ultrafast pulsed optical measurement techniques to directly monitor carrier generation, migration and relaxation dynamics in bulk semiconductors, polymers and mixed organic/organometallic photovoltaic nanofilms. These studies are conducted to measure (without contact) ultrafast carrier...

Exciton and Charge Transport Dynamics in Organic Semiconductors

Ongoing
Our approach toward establishing connections between the application space and physical phenomena includes developing electrical/optical devices and measurements that can be used for physical measurement, physical measurements that can be applied to real devices, and device design that can be tuned...

Femtosecond Nonlinear Optical Spectroscopy of Nanoscale Materials

Ongoing
The purpose of this project is to develop and refine spectroscopic techniques based on nonlinear optics for the study of novel materials. Measurements that isolate the nonlinear response are often better able to uncover physical processes that, in the linear response, are subtle and hard to isolate...

Publications

Kelvin probe force microscopy under ambient conditions

Author(s)
Amirhossein Zahmatkeshsaredorahi, Ruben Millan-Solsona, Devon Jakob, Liam Collins, Xiaoji Xu
Kelvin Probe Force Microscopy (KPFM), a technique derived from Atomic Force Microscopy (AFM), provides nanometer-scale spatial resolution for mapping surface...

Fully transparent GaN/InGaN LED as a position sensitive detector

Author(s)
Christine McGinn, Keith Behrman, Emily Bittle, Pragya Shrestha, Qingyuan Zeng, Vikrant Kumar, Christina Hacker, Ioannis Kymissis
Commercial imaging technologies have an increasing need for an accurate, in-situ beam locator to ensure laser alignment during operation. In this work, gallium...

Tools and Instruments

Ultrafast Terahertz Spectroscopy

Description: Three independent femtosecond laser systems are used for generating tunable ultrafast pulses in the mid-infrared (IR) and Terahertz (THz) spectral

Awards

Contacts

Group Leader

General Information

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