NIST logo
*

Dr. Christina A. Hacker

Dr. Hacker is a research chemist and Project Leader in the Nanoelectronics Group in the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). She joined NIST in 2002 as a National Research Council (NRC) Postdoctoral Fellow. Her work investigates formation and characterization of monolayers on semiconductors for molecular electronics applications. In addition to developing new measurement techniques, such as p-polarized backside reflection absorption infrared spectroscopy to investigate buried electronic layers, Christina has also been instrumental in developing a novel fabrication technique, flip-chip lamination, which is promising for many next generation electronic structures, including molecular electronics.

Dr. Hacker received her Ph.D. in Analytical Chemistry in 2002 at the University of Wisconsin-Madison studying optical measurements of the electronic interaction of molecular films on silicon surfaces in UHV. Since joining NIST, She has investigated the chemical and physical properties of many molecular monolayers on both metal and semiconductor surfaces and continues to be one of the world's experts in molecular layers on silicon.

Dr. Christina Hacker's general research interests include:

  • Chemical, physical, and electronic properties of organic monolayers for molecular electronics.
  • Utilization of molecular electronics, nanoelectronics, and interface engineering.
  • Surface and interface chemistry including interface modification and surface-sensitive analytical techniques.
Dr. Christina A. Hacker

Position:

Research Chemist
Semiconductor & Dimensional Metrology Division
Nanoelectronics Group

Employment History:

  • NIST Staff Scientist, 2004-present
  • NIST NRC postdoctoral fellowship, 2002-2004
  • University of Wisconsin-Madison Graduate Assistant, 1997-2002
  • University of Wisconsin-Madison Teaching Assistant, 1997-1999

Education:

  • University of Wisconsin-Madison, Madison, WI, August 2002
    • Ph.D., Analytical Chemistry
    • Thesis title: "Optical measurements of the electronic interaction between organic molecular films and silicon surfaces" Advisor: Professor Robert J. Hamers 1997-2002  
  • Clarke College, Dubuque, IA
    • B.S., Chemistry
    • May 1997, Minor in mathematics. Graduated summa cum laude.
Contact

Phone: 301-975-2233
Email: christina.hacker@nist.gov