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Nanoelectronics Group

Welcome

The Nanoelectronics Group conducts basic research to advance the optical and electrical measurement science infrastructure necessary for innovation in future nanoelectronic and thin-film devices, and their component materials. The Group pushes the frontiers of optical spectroscopies (e.g., Raman spectroscopy, spectroscopic ellipsometry, and infrared spectroscopy) and electrical measurements (e.g., magnetotransport, nanoelectronic test structure development, and temperature dependent current-voltage spectroscopy). The Group develops and advances novel measurements that combine and correlate optical and electrical methods such as internal photoemission, magneto-optical spectroscopy, and transient photocurrent spectroscopy. This new metrology supports the measurement and standards needs of the electronics, semiconductor, energy, health, defense, and other industries.

Nanoelectronics Group

Programs/Projects

Optical Spectroscopy of Nanostructures—Understanding the underlying chemistry and physics of nanomaterials, including noble and transition metallic nanoparticles, carbon nanotubes, and graphene is the driver. While the tool of choice is …

Nanoelectronic Device Metrology—The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging “Beyond-CMOS” nanoelectronic information processing technologies – …

Thin Film Electronics—The Thin Film Electronics Project enables the commercialization of emerging and future semiconductor electronic device technologies, such as flexible/printed electronics, replacements to scaled Si …

 
Curt Richter, photo copyright Robert Rathe
Contact

Physical Measurement Laboratory (PML)
Semiconductor & Dimensional Metrology Division

Nanoelectronics Group
Dr. Curt Richter, Leader
301-975-2082

General Information:
Terri Kroft, Office Manager
301-975-2052 Telephone
301-975-5668 Facsimile

100 Bureau Drive, M/S 8120

Gaithersburg, Maryland 20899-8120