The CMOS and Novel Devices Group develops measurement science to accelerate the commercialization and manufacture of high performance and reliable electron devices for the electronics industry by developing new characterization techniques, physics-based models, and data analysis methods. The Group develops the advanced metrology tools to enable quantitative and mechanistic assessment of reliability issues in emerging electronic devices. Another key thrust is to develop new measurements, physical models, and data analysis techniques to accelerate the development and commercialization of nanoelectronic device-based medical technology for life sciences and personalized health care.
Metrology for Advanced Bioelectronics—This new project's mission is to exploit the unique characteristics of novel electronic devices and new materials to advance healthcare diagnosis, monitoring, and therapy. A key thrust is to …
Back-End-of-Line Reliability Metrology—This project aims to develop the metrology to enable quantitative assessment of performance limiting reliability issues in emerging electronic devices related to new materials, processes, and …
Power Devices and Thermal Metrology—The Power Devices and Thermal Metrology Project develops electrical and thermal measurement methods and equipment to support development and application of advanced power semiconductor devices and …
CMOS Device and Reliability—The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) devices with sufficient reliability.These tools …
Nanobiotechnology—We are developing electronic chip-based technology for DNA and protein analysis for industry. This research will help revolutionize health care, emergency rooms and personalized medicine.
High-speed, amplified probe tip used to collect reliability data in the NIST Advanced Device Characterization and Reliability laboratory.
Physical Measurement Laboratory (PML)