Dr. Suehle is a supervisory electrical engineer in the CMOS Reliability and Advanced Devices Group in the Semiconductor & Dimensional Metrology Division of the Physical Measurement Laboratory at the National Institute of Standards and Technology NIST. He received his B.S., M.S., and Ph.D. degrees in electrical engineering from the University of Maryland, College Park, in 1980, 1982, and 1988, respectively. In 1981, he received a Graduate Research Fellowship with the National Institute of Standards and Technology (NIST), Gaithersburg, MD. Since 1982, he has been working in the Semiconductor Electronics Division at NIST.
Dr. Suehle's research activities include failure and wear-out mechanisms of semiconductor devices, radiation effects on microelectronic devices, micro-electro-mechanical-systems (MEMS), and molecular electronic devices. Dr. Suehle has published over 100 technical papers or conference proceedings and holds 5 U.S. patents.
Dr. Suehle serves as the chairman of the Oxide Integrity Working Group of the EIA/JEDEC JC 14.2 Standards Committee responsible for wafer-level reliability. His is a Fellow of the IEEE.
Leader, Supervisory Electrical Engineer
Semiconductor & Dimensional Metrology Division
CMOS Reliability and Advanced Devices Group