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NACMA 2011 Annual Workshop and Conference: Meet World Experts on GD&T, Dimensional Measurement Uncertainty, and Coordinate Measuring Machine (CMM) Accuracy

Purpose:

To contribute to the growth of expertise in coordinate measuring machine technology, improve measurement accuracy and traceability, and to promote awareness and usage of recognized practices and national and international standards. The workshop and conference topics are geometric dimensioning and tolerancing, measurement uncertainty, economics of measurement, small feature measurement, computer tomography, coordinate measuring machine operation certification, and much more.


About NACMA:
The North American Coordinate Metrology Association (NACMA) is a not-for-profit organization that specifically addresses coordinate metrology through workshops and conferences each year, providing one of the largest annual meetings for dimensional metrologists.

The 2011 NACMA officers are members of national laboratories and industry leaders:

National Institute of Standards and Technology (NIST), USA
Centro Nacional de Metrología (CENAM), Mexico
International Institute of Geometric Dimensioning & Tolerancing (IIGDT), USA
Kotem Technologies Inc., Canada


NACMA 2011 Annual Workshop and Conference

Agenda:

Online detailed agenda

The three-day event with workshop and conference lectures will be held on Wednesday, November 2, 2011 through Friday, November 4, 2011. Registration will be held first two mornings. Registration fee will include daily continental breakfast, coffee breaks, and lunch, and also one dinner.

Workshop and Conference Topics:

Day 1: Wednesday November 2, 2011 Workshop
Tutorial on GD&T: Overview of ASME Y14.5-2009
Tutorial on Dimensional Metrology Measurement Uncertainty
 
Day 2: Thursday November 3, 2011 Conference
Development of freeform verification artifacts for optical based co-ordinate measuring systems
How a measurement uncertainty statement can be used for product development, rather than just end item inspection of aerospace parts
Evaluating traceable microparts on CT Devices – illustrating new application of micro gears
NACMA—CMM Certification
Integrating iGPS on aircraft flaps adjustment manufacturing assembly system
Integration of automated metrology in complex machining operation
Multisensor coordinate measurement technology applied to microprecision dimensional metrology Issues
Optical-Probe CMMs: Task-specific techniques to reduce measurement uncertainty
 
Day 3: Friday November 4, 2011 Conference
NRCC portable target case for short-range 3-D imaging systems characterization
The GD&T measurement conundrum
Impact of measurement uncertainty on development and manufacturing
Applications of computer simulation in coordinate measuring machine uncertainty evaluation
NACMA Business, Annual Report, Election of Officers
Tours

Conference Web site:

http://iigdt.com/NACMA/2011/

Details:

Start Date: Wednesday, November 2, 2011
End Date: Friday, November 4, 2011
Location: <br><b>Aerospace Technology Center</b><br/>Montréal, Quebec, Canada
Format: Workshop

Sponsor(s):

Benefits of becoming a NACMA sponsor

Sponsors of NACMA support an important educational and outreach program while networking with hundreds of dimensional metrologists focused on coordinate metrology.

Online sponsor registration

Sponsorship Fees (per sponsor)
 $1,250 USD  NACMA Sponsor
 $2,500 USD  Silver Level Sponsor & Exhibitor
 $5,000 USD  Gold Level Sponsor & Exhibitor
$10,000 USD  Platinum Level Sponsor & Exhibitor

Registration:

Registration Fees (per person)
$195 USD  Workshop, November 2, 2011
$395 USD  Conference, November 3-4, 2011
$495 USD  Workshop and Conference, November 2-4, 2011
$375 USD  Student Promotion, 25% Discount*, Workshop and Conference
*Note: Valid student ID must be presented at arrival.

Registration Contact:

Edward Yaris
GDT Consultants
653 Sara Court
Lewiston, New York 14092, USA
Phone: (716) 535-0966
E-mail: ed.yaris@gdt-consultants.com
Website: www.gdt-consultants.com

Accommodations:

Technical Contact:

Physical Measurement Laboratory (PML)
Semiconductor & Dimensional Metrology Division
Dimensional Metrology Group (683.01)
Dr. Steven D. Phillips
100 Bureau Drive, M/S 8211
Gaithersburg, Maryland 20899-8211, USA