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News in PML - Semiconductor and Dimensional Metrology

10/27/14
  • Building Better Body Armor: PML Provides Standards for US Army

  • 09/09/14
  • NIST Helps Develop New Standard for Microsensor Technology

  • 09/02/14
  • Scientists Shed Light on Organic Photovoltaic Characteristics

  • 08/26/14
  • Optical Microscope Technique Confirmed as Valid Nano-Measurement Tool

  • 07/10/14
  • Manipulating Magnetic Field Effects in Organic Semiconductors

  • 05/21/14
  • Thermal Conductivity of MoS2

  • 05/06/14
  • Nanotube-Infused Clothing May Protect Against Chemical Weapons

  • 04/23/14
  • PML Leadership Prominent Throughout Newly Released ITRS

  • 03/20/14
  • PML Scientists Develop 3D SEM Metrology for 10 nm Structures

  • 03/05/14
  • PML Contributes to Formation of Landmark IEEE Standards Committee and Working Group for MEMS Sensor Performance Parameters

  • 01/15/14
  • PML Measurements Drive Development of New Length Artifact

  • 12/12/13
  • PML Study Supports Validity of Toolmark Identification in Forensics

  • 08/20/13
  • Collaboration with Industry Leads to Improved Forensics Work and Industry Growth

  • New Explanation for Key Step in Anthrax Infection Proposed by NIST and USAMRIID

  • 07/12/13
  • NIST Chip Measurement Advance Earns 'Oscar of Innovation'

  • 06/25/13
  • Microscopy Technique Could Help Computer Industry Develop 3-D Components

  • Promoting Nanomaterial Manufacturing by Characterizing and Minimizing Environmental Risks

  • 05/13/13
  • New 3D Defect Detection Fills Important Industry Gap

  • 05/08/13
  • SRC, NIST Introduce Second Phase of Nanoelectronics Research Initiative with $5 Million in Annual Funding to Develop Post-CMOS Electronics

  • 04/30/13
  • New NIST Measurement Tool Is On Target for the Fast-Growing MEMS Industry

  • 04/09/13
  • PML Researchers Open Door to Advanced Molecular Electronic Metrology

  • 03/13/13
  • PML Scientists Make Better SEM Imaging and Measurements in the Nano Era Possible

  • 03/05/13
  • Nanoelectronics Conference Will Focus on Semiconductor Industry's Future

  • Temp-Controlled 'Nanopores' May Allow Detailed Blood Analysis

  • 02/06/13
  • Gauging the Needs of the Petroleum Industry

  • 01/08/13
  • NIST Patent Could Give 'Lab on a Chip' Technology Long Shelf Life

  • 12/14/12
  • Electron Spin Transport Demonstrated for First Time in an Organic Device

  • 11/27/12
  • NIST-VA Agreement Leads to New Research on Hearing Aids

  • 10/16/12
  • New Method Measures Movements of Tiny Devices-At Every Step

  • NRI to Lead New Five-Year Effort to Develop Post-CMOS Electronics

  • 10/11/12
  • New Measurement Technique to Fill Critical Need for Fiber Optic Cable Industry

  • 10/02/12
  • NIST, Columbia Engineering Collaborate on Inexpensive DNA Sequencing Method

  • 09/05/12
  • NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips

  • 08/08/12
  • NIST Focuses on Testing Standards to Support Lab on a Chip Commercialization

  • PML Uses Combined Optical Techniques to Provide Important Answers on Graphene Structures

  • Shelling Out Evidence: NIST Ballistic Standard Helps Tie Guns to Criminals

  • 07/23/12
  • New SRM for Bullet Casings

  • 06/27/12
  • NIST Goes the Distance for the Olympics

  • 06/07/12
  • MEMS Reference Material Released

  • 05/02/12
  • Light Touch Keeps a Grip on Delicate Nanoparticles

  • 03/20/12
  • 'Nanoslinky': A Novel Nanofluidic Technology for DNA Manipulation and Measurement

  • NIST Announces $2.6 Million in Funding for Novel Semiconductor Research

  • 02/21/12
  • NIST Reveals Switching Mechanism in Promising Computer Memory Device

  • 02/06/12
  • Laying the Groundwork for 3D Stacked Integrated Circuits

  • 01/26/12
  • PML's Pernstich Develops Open-Source Software to Automate Test Equipment

  • 12/07/11
  • PML Researchers Create Tool for 'Circuit-Aware' Reliability Testing

  • 09/27/11
  • NIST Polishes Method for Creating Tiny Diamond Machines

  • 08/16/11
  • Kinder, Gentler Cell Capture Method Could Aid Medical Research

  • 06/07/11
  • NIST 'Catch and Release' Program Could Improve Nanoparticle Safety Assessment

  • 05/24/11
  • Broadening Uses Put MEMS Technology on the Map(s)

  • NIST, AIP to Make Semiconductor Research Freely Available Online

  • 05/18/11
  • NIST 'Nanowire' Measurements Could Improve Computer Memory

  • 03/15/11
  • NIST to Cosponsor Conference in France on Nanoelectronics Metrology

  • 01/05/11
  • Extracting Cellular 'Engines' May Aid in Understanding Mitochondrial Diseases

  • 08/03/10
  • NIST Nanofluidic 'Multi-tool' Separates and Sizes Nanoparticles

  • 07/21/10
  • NIST Nanoscale Dimensioning Technique Wins R&D 100 Award

  • 06/23/10
  • NIST Team Advances in Translating Language of Nanopores

  • 06/09/10
  • Liposome-Hydrogel Hybrids: No Toil, No Trouble for Stronger Bubbles

  • 05/25/10
  • Robots Big and Small Showcase Their Skills at NIST Alaskan Events

  • 04/27/10
  • Lollipops and Ice Fishing: Molecular Rulers Used to Probe Nanopores

  • NIST, Maryland Researchers COMMAND a Better Class of Liposomes

  • Teams Gearing Up for Two NIST Robotic Competitions in Alaska

  • 03/30/10
  • Paintable Electronics? NIST Studies Spray-On Manufacturing of Transistors

  • 03/23/10
  • EEEL Sponsors INTEL VP’s Visit to NIST

  • 12/15/09
  • Deadline Extended for Entering NIST Microrobotics Challenge

  • 10/20/09
  • Is Your Microrobot Up for the (NIST) Challenge?

  • 09/08/09
  • NIST Calculations May Improve Temperature Measures for Microfluidics

  • 08/25/09
  • Hankering for Molecular Electronics? Grab the New NIST Sandwich

  • 08/11/09
  • Novel Temperature Calibration Improves NIST Microhotplate Technology

  • 06/16/09
  • Nanosoccer Robots Ready to Compete in Upcoming RoboCup Games

  • 06/02/09
  • Memory with a Twist: NIST Develops a Flexible Memristor

  • 05/20/09
  • NIST Engineers Discover Fundamental Flaw in Transistor Noise Theory

  • 04/21/09
  • Conference Offers Insight Into Exploration of Nano-sized Electronics

  • 04/07/09
  • World’s First Nanofluidic Device with Complex 3-D Surfaces Built

  • 03/31/09
  • NIST-Cornell Team Builds World's First Nanofluidic Device with Complex 3-D Surfaces -- Chamber Separates Nanoparticles Like a 'Coin Sorter'

  • 02/10/09
  • Conference to Focus on Anti-Counterfeiting, Consumer Protection

  • 01/13/09
  • NIST Helps Preserve the 500-year-old Waldseemüller Map

  • 12/23/08
  • Cracking a Tough Nut for the Semiconductor Industry

  • 11/12/08
  • Let the Games Begin! Nanosoccer at 2009 RoboCup in Austria

  • 10/28/08
  • Nanoscale Dimensioning Is Fast, Cheap with New NIST Optical Technique

  • 09/03/08
  • NIST Studies How New Helium Ion Microscope Measures Up

  • 08/19/08
  • Stop the Waste: Making Measurements Measure Up to Standards

  • 06/24/08
  • ‘Electron Trapping’ May Impact Future Microelectronics Measurements

  • 06/10/08
  • ‘Nanoglassblowing’ Seen as Boon to Study of Individual Molecules

  • 05/28/08
  • Learn About 'NIST and Nanosoccer' from New Web Site and Video

  • 05/13/08
  • Public Invited to See Nanosoccer Robots in Action in Pittsburgh

  • 03/18/08
  • NIST Team Proves Bridge from Conventional to Molecular Electronics Possible

  • 03/05/08
  • Good Vibrations Probe Innards of Molecular Electronic Junctions

  • 02/19/08
  • Directed Self-Ordering of Organic Molecules for Electronic Devices

  • 01/08/08
  • NIST Reference Materials Are 'Gold Standard' for Bio-Nanotech Research

  • 11/08/07
  • Micro Microwave Does Pinpoint Cooking for Miniaturized Labs

  • 05/10/07
  • DNA Sieve: Nanoscale Pores Can Be Tiny Analysis Labs

  • 12/07/06
  • New Targets May Hit Bull’s-Eye for Chip Makers

  • 10/12/06
  • NIST Releases New Standard for Semiconductor Industry

  • 07/20/06
  • Novel Nano-Etched Cavity Makes LEDs 7 Times Brighter

  • 01/17/06
  • Simulation Program Predicts Resistivity in Nanodevices

  • 07/13/05
  • NIST Finds Rough Spot in Surface Measurement

  • 06/30/05
  • Reference Materials Planned for Semiconductor Industry

  • 06/02/05
  • Shadow Technique Improves Measurement of Micro Holes
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