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Special tests for measuring the infrared optical properties of materials

Below is a list of special services we offer. Fees are determined individually, based on the level of effort involved, actual costs, time and labor, the number of test items, and the number of data points. Contact Leonard Hanssen for a quote.

Special Tests of Spectral Reflectance – Measurements of spectral reflectance can be made for the wavelength region 1.0 µm to 20 µm on submitted test items. This service includes both regular (or specular) and diffuse reflectance measurements taken at angles, wavelengths, and polarizations specified by the customer. For regular reflectance, measurements are made over the full spectral range, for incident angles from 10° to 80°, with an f/20 input cone. Separate measurements are made with s- and p-polarized input light. Samples less than 30 mm diameter can be temperature controlled between 10 K and 600 K. For the directional-hemispherical geometry incident angles of 0° and 8° are possible, with an f/6 input cone. The spectral range is limited by the custom detector to 1 µm to 14 µm. Samples smaller than 38 mm diameter can be temperature controlled between 295 K and 475 K. The test report includes reflectance values and expanded uncertainty estimates based on the instrument used to perform the measurement. Arrangements for these measurements on submitted test items must be made before shipment. NIST will decide whether and how to perform the measurements. Test items not accepted for measurement will be returned.

Special Tests of Spectral Transmittance – Measurements of spectral transmittance can be made for the wavelength region 1.0 µm to 20 µm on submitted test items. This service includes both regular and diffuse transmittance measurements taken at angles, wavelengths, and polarizations specified by the customer. For regular transmittance, measurements are made over the full spectral range, for incident angles from 10° to 80°, with an f/20 input cone. Separate measurements are made with s- and p-polarized input light. Samples less than 30 mm diameter can be temperature controlled between 10 K and 600 K. For the directional-hemispherical geometry incident angles of 0° and 8° are possible, with an f/6 input cone. The spectral range is limited by the custom detector to 1 µm to 14 µm. Samples smaller than 38 mm diameter can be temperature controlled between 295 K and 475 K. The test report includes reflectance values and expanded uncertainty estimates based on the instrument used to perform the measurement. Arrangements for these measurements on submitted test items must be made before shipment. NIST will decide whether and how to perform the measurements. Test items not accepted for measurement will be returned.

Other Special Tests – The feasibility of specialized measurements of sample emittance, index of refraction, ellipsometry, bi-directional reflectance distribution function (BRDF), etc. can be discussed with NIST staff for potential performance.

Reported uncertainties will follow, to the extent possible, the ISO Guide to the Expression of Uncertainty in Measurement (International Organization for Standardization, Geneva, Switzerland, 1993). Since 1994, the NIST policy has been conforming to this guide when reporting its activities, using an expanded uncertainty coverage factor (as defined in the Guide) of k = 2. See Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results for a detailed explanation of the NIST policy.

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Contact

Infrared optical properties of materials and components:
Leonard Hanssen, Project Leader
301-975-2344 Telephone
301-840-8551 Facsimile

100 Bureau Drive, M/S 8442
Gaithersburg, MD 20899-8442