2009 Allen V. Astin Award for Waveform Metrology

The Team is recognized for developing fundamentally new waveform metrology, providing a world-first method for simultaneously calibrating high-speed electrical test equipment in both the time- and frequency-domains with point-by-point uncertainty analysis, and for the first time making waveform calibrations traceable to fundamental physics. The new method improves accuracy in calibrations of oscilloscopes, common test instruments that measure voltage in communications and electronic devices, and potentially could boost performance and save money in other fields ranging from medical testing to structural analysis and remote sensing.