Publications by Dylan Williams (Topic Based)
A Prescription for THz Transistor Characterization An onwafer measurement tutorial narrated in PowerPoint with embedded references.
Topics
Circuit Theory
 J. Verspecht, D.F. Williams, D. Schreurs, K.A. Remley, and M.D. McKinley, "Linearization of largesignal scattering functions," IEEE Trans. Microwave Theory and Tech., vol. 53, no. 4, pp. 13691376, April, 2005.
 D.F. Williams, F. Ndagijimana, K.A. Remley, J. Dunsmore, and S. Hubert, "Scatteringparameter models and representations for microwave mixers," IEEE Trans. Microwave Theory and Tech., vol. 53, no. 1. pp. 314321, Jan. 2005.
 K. A. Remley, D. F. Williams, D. F. Schreurs, and J. Wood, "Simplifying and interpreting twotone measurements," IEEE Trans. Microwave Theory and Tech., vol. 52, no. 11, pp. 25762584, Nov. 2004.
 D. F. Williams, B.K. Alpert, U. Arz, D.K. Walker, and H. Grabinski, "Causal characteristic impedance of planar transmission lines," IEEE Transactions on Advanced Packaging, vol. 26, no. 2, pp. 165171, May, 2003.
 D. F. Williams and B.K. Alpert, "Causality and waveguide circuit theory," IEEE Transactions on Microwave Theory and Techniques, vol. 49, no. 4, pp. 615623, April 2001.
 D. F. Williams, B.K. Alpert, U. Arz, and H. Grabinski, "Causal characteristic impedance of planar transmission lines," submitted to IEEE Transactions on Microwave Theory and Techniques.
 D.F. Williams and R.C. Wittmann, "Computation of causal characteristic impedances,"2000 International Microwave Symposium Digest, pp. 18131816, June 1116, 2000.
 D.F. Williams and B.K. Alpert, "Causality and characteristic impedance," 54^{th} ARFTG Conference Digest, Dec. 12, 1999.
 D.F. Williams and B.K. Alpert, "Characteristic impedance of microstrip on silicon," 8^{th} Topical Conference on Electrical Performance of Electronic Packaging, pp. 181184, Oct. 2527, 1999.
 D.F. Williams and B.K. Alpert, "A causal microwave circuit theory and its implications," 1999 URSI General Assembly, Toronto, Canada, August 1321, 1999.
 D.F. Williams and B.K. Alpert, "Characteristic impedance, causality, and microwave circuit theory," IEEE Workshop on Signal Propagation on Interconnects, TitiseeNeustadt, Germany, May 1921, 1999.
 D. F. Williams and B.K. Alpert, "Characteristic impedance, power, and causality," IEEE Microwave and Guided Wave Lett., vol. 9, no. 5, pp. 181182, May 1999.
 D. F. Williams, L. A. Hayden, and R. B. Marks, "A Complete Multimode EquivalentCircuit Theory for Electrical Design," NIST Journal of Research, vol. 102, no. 4, pp. 405423, JulyAug. 1997.
 D. F. Williams and F. Olyslager, "Modal Cross Power in QuasiTEM Transmission Lines", IEEE Microwave and Guided Wave Letters, vol. 6, no. 11, pp. 413415, November 1996.
 D. F. Williams, "Thermal Noise in Lossy Waveguides," IEEE Transactions on Microwave Theory and Techniques, vol. 44, no. 7, July 1996.
 R. B. Marks and D. F. Williams, "Comments on 'Conversions Between S, Z, Y, h, ABCD, and T Parameters which are Valid for Complex Source and Load Impedances," IEEE Transactions on Microwave Theory and Techniques, vol. 43, no. 4, pp. 914915, April 1995.
 D. F. Williams and R. B. Marks, "Reciprocity Relations in Waveguide Junctions," IEEE Transactions on Microwave Theory and Techniques, vol. 41, no. 7, pp. 11051110, July 1993.
 D. F. Williams, R. B. Marks, D. K. Walker, and F. R. Clague, "Wafer Probe Transducer Efficiency," IEEE Microwave and Guided Wave Letters, vol. 2, no. 10, pp. 388390, Oct. 1992.
 R. B. Marks and D. F. Williams, "A General Waveguide Circuit Theory," Journal of Research of the National Institute of Standards and Technology, vol. 97, no. 5, pp. 533562, Sep.Oct. 1992. (Best paper award, Electronics and Electrical Engineering Laboratory)
 R. B. Marks and D. F. Williams, "Reciprocity relations for onwafer power measurement," 38th ARFTG Conference Digest, pp. 8289, Dec. 1991.
 D. F. Williams and R. B. Marks, "The Interpretation and Use of SParameters in Lossy Lines," 36th ARFTG Conference Digest, pp. 8490, Nov. 1990. (Best Paper Award)
OnWafer Measurement and Calibration
 D.F. Williams, P. Corson, J. Sharma, H. Krishnaswamy, W. Tai, Z. George, D. Ricketts, P. Watson, E. Dacquay, and S. Voinigescu, "Calibrationkit design for millimeterwave silicon integrated circuits," submitted to IEEE Trans. Microwave Theory and Tech.
 D.F. Williams, A.C. Young, and M. Urteaga, "A prescription for submillimeterwave transistor characterization," submitted to IEEE Trans. Terahertz Sci. and Technol.
 F.J. Schmuckle, R. Doerner, G.N. Phung, W.A. Heinrich, D.F. Williams, U. Arz, "Radiation, multimode propagation, and substrate modes in Wband CPW calibration," 41st European Microwave Conference, pp. 297300, Oct. 2011. (Winner European Microwave Prize)
 D.F. Williams, C.M. Wang, and U. Arz, "An optimal vectornetworkanalyzer calibration algorithm," IEEE Trans. Microwave Theory and Tech., vol. 51, no. 12, pp. 23912401, Dec. 2003.
 D.F. Williams, C.M. Wang, and U. Arz, "An optimal multiline TRL calibration algorithm," 2003 Int. Microwave Symp. Dig., pp. 18191822, June 1012, 2003.
 U. Arz and D.F. Williams, "Applications of calibration comparison in onwafer measurement," URSIGA 2002, Aug. 1724, 2002.
 U. Arz, D.F. Williams, and H. Grabinski, "Characteristic impedance measurement of planar transmission lines," URSIGA 2002, Aug. 1724, 2002.
 U. Arz, H.C. Reader, P. Kabos, D.F. Williams, "Wideband FrequencyDomain Characterization of HighImpedance Probes," 58th ARFTG Conference Digest, pp. 117124, Nov. 2930, 2001.
 D.F. Williams, U. Arz, H. Grabinski, "CharacteristicImpedance Measurement Error on Lossy Substrates," IEEE Microwave and Wireless Components Letters, vol. 11, no. 7, pp. 299301, July 2001.
 D.K. Walker, R.F. Kaiser, D.F. Williams, and K.J. Coakley, "Lumpedelement models for highfrequency calibration,"56th ARFTG Conference Digest, pp. 8992, Nov. 30Dec. 1, 2000.
 D.F. Williams, A.C. Byers, V.C. Tyree, D.K. Walker, J.J. Ou, X. Jin, M. PiketMay, and C. Hu, "Contactpad design for highfrequency silicon measurements," 9^{th} Topical Conference on Electrical Performance of Electronic Packaging, pp. 131134, Oct. 2325, 2000.
 W. Waitr, D.K. Walker, and D.F. Williams, "Coplanarwaveguidetomicrostriptransition model,"2000 International Microwave Symposium Digest, June 1116, 2000.
 D. F. Williams and D. K. Walker, "Lumpedelement impedance standards," 51^{st} ARFTG Conference Digest, pp. 9193, June 12, 1998.
 D. K. Walker and D. F. Williams, "Comparison of SOLR and TRL calibrations," 51^{st} ARFTG Conference Digest, pp. 8387, June 12, 1998.
 D. F. Williams and D. Walker, "SeriesResistor Calibration," 50^{th} ARFTG Conference Digest, pp. 131137, Dec. 45, 1997.
 D. Walker and D.F. Williams, "Compensation for Geometrical Variation in Coplanar Waveguide Probetip Calibration," IEEE Microwave and Guided Wave Letters, vol. 7, no. 4, pp. 9799, April 1997.
 D.C. DeGroot, D.K. Walker, and R.B. Marks, "Impedance mismatch effects on propagation constant measurements," 5th EPEP Conference, pp. 141143, Oct. 2830, 1996.
 D. F. Williams, J. M. Belquin, G. Dambrine, and R. Fenton, "OnWafer Measurement at Millimeter Wave Frequencies", 1996 IEEE MTTS Symposium Digest, vol. 3, pp. 16831686, June 1721, 1996.
 D. F. Williams and J. B. Schappacher, "LineReflectMatch Calibrations with Nonideal Microstrip Standards," 46th ARFTG Conference Digest, pp. 3538, Nov. 30Dec. 1, 1995.
 J. A. Jargon, R. B. Marks, and D. F. Williams, "Coaxial LineReflectMatch Calibration," Proc. of the AsiaPacific Microwave Conf., Oct. 1995.
 D. F. Williams and R. B. Marks, "LRM ProbeTip Calibrations using Nonideal Standards," IEEE Microwave Theory and Techniques, vol. 43, no. 2, pp. 466469, Feb. 1995.
 D. F. Williams and R. B. Marks, "Compensation for Substrate Permittivity in ProbeTip Calibration," 44th ARFTG Conference Digest, pp. 2030, Dec. 1994.
 D. F. Williams and R. B. Marks, "OnWafer Impedance Measurement on Lossy Substrates," IEEE Microwave and Guided Wave Letters, vol. 4, no. 6, pp. 175176, June 1994.
 D. F. Williams and R. B. Marks, "LRM ProbeTip Calibrations with Imperfect Resistors and Lossy Lines," 42nd ARFTG Conference Digest, pp. 3236, Dec. 1993. (Best Paper Award)
 D. F. Williams and R. B. Marks, "Calibrating OnWafer Probes to the Probe Tips," 40th ARFTG Conference Digest, pp. 136143, Dec. 1992.
 D. K. Walker, D. F. Williams, and J. M. Morgan, "Planar Resistors for Probe Station Calibration," 40th ARFTG Conference Digest, pp. 19, Dec. 1992.
 D. F. Williams, R. B. Marks, D. K. Walker, and F. R. Clague, "Wafer Probe Transducer Efficiency," IEEE Microwave and Guided Wave Letters, vol. 2, no. 10, pp. 388390, Oct. 1992.
 R. B. Marks and D. F. Williams, "A General Waveguide Circuit Theory," Journal of Research of the National Institute of Standards and Technology, vol. 97, no. 5, pp. 533562, Sep.Oct. 1992. (Best paper award, Electronics and Electrical Engineering Laboratory)
 R. B. Marks and D. F. Williams, "Traceability for onwafer MMIC measurements," Conference on Precision Electromagnetic Measurements, pp. 371372, June 1992.
 D. F. Williams, R. B. Marks, and A. Davidson, "Comparison of OnWafer Calibrations," 38th ARFTG Conference Digest, pp. 6881, Dec. 1991.
 R. B. Marks and D. F. Williams, "Reciprocity relations for onwafer power measurement," 38th ARFTG Conference Digest, pp. 8289, Dec. 1991.
 R. Furlow, R. Y. Shimoda, D. F. Williams, R. B. Marks, and K. C. Gupta, "Benchmark for the Validation of Microwave CAD Software," 38th ARFTG Conference Digest, pp. 97106, Dec. 1991.
 D. F. Williams and R. B. Marks, "Transmission Line Capacitance Measurement," IEEE Microwave and Guided Wave Letters, vol. 1, no. 9, pp. 243245, Sept. 1991.
 R. B. Marks and D. F. Williams, "Characteristic Impedance Determination using Propagation Constant Measurement," IEEE Microwave and Guided Wave Letters, vol. 1, no. 6, pp. 141143, June 1991.
 T. H. Miers, A. Cangellaris, D. Williams, and R. Marks, "Anomalies Observed in Wafer Level Microwave Testing," 1991 International Microwave Symposium Digest, pp. 11211124, June 1991.
 D. F. Williams, R. B. Marks, and K. R. Phillips, "Translate LRL and LRM calibrations," Microwaves and RF, vo. 30, pp. 7884, Feb. 1991.
 D. F. Williams and R. B. Marks, "The Interpretation and Use of SParameters in Lossy Lines," 36th ARFTG Conference Digest, pp. 8490, Nov. 1990. (Best Paper Award)
 D. F. Williams, R. B. Marks, K. Phillips, and T. Miers "Progress toward MMIC onwafer standards," 36th ARFTG Conference Digest, pp. 7383, Nov. 1990.
 K. Phillips and D. Williams, "MMIC Package Characterization with Active Loads," 36th ARFTG Conference Digest, pp. 6472, Nov. 1990.
 D. F. Williams, "Deembedding and unterminating microwave test fixtures with nonlinear least squares," IEEE Trans. Microwave Theory and Techniques, vol. 38, no. 6, pp. 787791, June 1990.
 D. F. Williams and T. H. Miers, "Deembedding Coplanar Probes with Planar Distributed Standards," IEEE Trans. Microwave Theory and Techniques 36, pp. 18761880, Dec. 1988.
 D. F. Williams and T. H. Miers, "A Coplanar Probe to Microstrip Transition," IEEE Trans. Microwave Theory and Techniques 36, pp. 12191223, July 1988.
Calibration Accuracy and Verification
 D.F. Williams, A.C. Young, and M. Urteaga, "A prescription for submillimeterwave transistor characterization," submitted to IEEE Trans. Terahertz Sci. and Technol.
 D.F. Williams, "Comparison of submillimeterwave scatteringparameter calibrations with imperfect electrical ports," IEEE Trans. Terahertz Science and Technol., vol. 2, no. 1, pp. 144152, Jan. 2012.
 D.F. Williams, K.A. Remley, J.M. Gering, G.S. Lyons, C. Lineberry, G.S. Aivazian, "Comparison of largesignalnetworkanalyzer calibrations," IEEE Microwave and Wireless Components Letters, vol. 20, no. 2, pp. 118120, Feb. 2010.
 K.A. Remley, D.F. Williams, D. Schreurs, M. Myslinski, "Measurement bandwidth extension using multisine signals: Propagation of error," IEEE Trans. Microwave Theory Tech., vol. 58, no. 2, pp. 458467, Feb. 2010.
 D.F. Williams, A. Lewandowski, D. LeGolvan and R. Ginley, "Electronic vectornetworkanalyzer verification," IEEE Microwave Magazine, pp. 118123, Oct. 2009.
 Hale, P.D., Williams, D.F., Dienstfrey, A., Wang, J., Jargon, J., Humphreys, D., Harper, M., Fuser, H., Bieler, M., "Traceability of highspeed electrical waveforms at NIST, NPL, and PTB," Conference on Precision Electromagnetic Measurements, pp. 522523, 2012.
 Jargon, J.A., Williams, D.F., Wallis, T.M., LeGolvan, D.X., Hale, P.D., "Establishing traceability of an electronic calibration unit using the NIST Microwave Uncertainty Framework," 2012 79th ARFTG Microwave Measurements Conference, pp. 15, June 2012.
 D.F. Williams, "Rectangularwaveguide vectornetworkanalyzer calibrations with imperfect test ports," 76th ARFTG Microwave Measurement Symposium, pp. 18, Dec. 2010. (winner Best Paper Award)
 A. Lewandowski, W. Waitr, D. Williams, "Multifrequency approach to vectornetworkanalyzer scatteringparameter measurements," 2010 European Microwave Conference, pp. 260263, 2830 Sept. 2010.
 D.F. Williams, "500 GHz750 GHz rectangularwaveguide vectornetworkanalyzer calibrations," IEEE Trans. Terahertz Science and Technol., 2011.
 A. Lewandowski, D.F. Williams, P.D. Hale, C. M. Wang, and A. Dienstfrey, "CovarianceMatrixBased VectorNetworkAnalyzer Uncertainty Analysis for Timeand FrequencyDomain Measurements," IEEE Trans. Microwave Theory Tech, vol. 58, no. 7, pp. 18771886, July 2010.
 D.F. Williams, A. Lewandowski, D. LeGolvan, R. Ginley, C.M. Wang and J. Splett, "Use of Electronic Calibration Units for VectorNetworkAnalyzer Verification," 74th ARFTG Microwave Measurement Conference, Boulder, Colorado, Dec. 14, 2009.
 A. Lewandowski and D.F. Williams, "Stochastic modeling of coaxialconnector repeatability errors," 74th ARFTG Microwave Measurement Conference, Boulder, Colorado, Dec. 14, 2009.D.F. Williams, A. Lewandowski, D. LeGolvan and R. Ginley, "Electronic vectornetworkanalyzer verification," IEEE Microwave Magazine, pp. 118123, Oct. 2009.
 C.M. Wang, P.D. Hale and D.F. Williams, "Uncertainty of timebase corrections," IEEE Trans. Instr. Meas., vol. 58, no. 10, pp 34683472, Oct. 2009.
 A. Lewandowski and D.F. Williams, "Characterization and modeling of random vector network analyzer measurement errors," 17th International Conf. on Microwaves, Radar and Wireless Communications, 1921 May, 2008.
 P. D. Hale, C. M. Wang, D. F. Williams, K. A. Remley, and J. Wepman, "Compensation of random and systematic timing errors in sampling oscilloscopes," IEEE Trans. Instrum. Meas., vol. 55, no. 6. pp. 21462154, Dec. 2006.
 D. F. Williams, H. Khenissi, F. Ndagijimana, K. A. Remley, J. P. Dunsmore, P. D. Hale, C. M. Wang, and T. S. Clement, "SamplingOscilloscope Measurement of a Microwave Mixer with SingleDigit Phase Accuracy," IEEE Trans. Microwave Theory Tech.vol. 53, no. 3, pp. 12101217, March 2006.
 D. F. Williams, A. Lewandowski, T. S. Clement, C. M. Wang, P. D. Hale, J. M. Morgan, D. Keenan, and A. Dienstfrey, "CovarianceBased Uncertainty Analysis of the NIST Electrooptic Sampling System," IEEE Trans. Microwave Theory Tech., vol. 54, no. 1, pp. 481491, Jan. 2006.
 D.F. Williams, C.M. Wang, and U. Arz, "An optimal vectornetworkanalyzer calibration algorithm," IEEE Trans. Microwave Theory and Tech., vol. 51, no. 12, pp. 23912401, Dec. 2003.
 D.F. Williams, C.M. Wang, and U. Arz, "An optimal multiline TRL calibration algorithm," 2003 Int. Microwave Symp. Dig., pp. 18191822, June 1012, 2003.
 K.A. Remley, D.F. Williams, Dominique Schreurs, Giovanni Loglio, and Alessandro Cidronali, "Phase detrending for measured multisine signals," 61st ARFTG Microwave Measurement Conference Digest, pp. 7383, June 13, 2003. (ARFTG best paper award)
 U. Arz and D.F. Williams, "Applications of calibration comparison in onwafer measurement," URSIGA 2002, Aug. 1724, 2002.
 U. Arz, H.C. Reader, P. Kabos, D.F. Williams, "Wideband FrequencyDomain Characterization of HighImpedance Probes," 58th ARFTG Conference Digest, pp. 117124, Nov. 2930, 2001.
 D.F. Williams, U. Arz, H. Grabinski, "CharacteristicImpedance Measurement Error on Lossy Substrates," IEEE Microwave and Wireless Components Letters, vol. 11, no. 7, pp. 299301, July 2001.
 D. F. Williams and K.A. Remley, "Analytic samplingcircuit model," IEEE Transactions on Microwave Theory and Techniques, vol. 49, no. 6, pp. 10131019, June 2001.
 K.A. Remley, D. F. Williams, D.C. DeGroot, J. Verspecht, and J. Kerley, "Effects of nonlinear diode junction capacitance on the nosetonose calibration," IEEE Microwave and Wireless Components Letters, vol. 11, no. 5, pp. 196198, May 2001.
 D.K. Walker, R.F. Kaiser, D.F. Williams, and K.J. Coakley, "Lumpedelement models for highfrequency calibration,"56th ARFTG Conference Digest, pp. 8992, Nov. 30Dec. 1, 2000.
 K.A. Remley, D.F. Williams, and D.C. DeGroot, "Realistic samplingcircuit model for a nosetonose simulation,"2000 International Microwave Symposium Digest, pp. 14731476, June 1116, 2000.
 D.F. Williams, K.A. Remley, and D.C. DeGroot, "NosetoNose Response of a 20GHz Sampling Circuit," 54^{th} ARFTG Conference Digest, Dec. 12, 1999.
 R.F. Kaiser and D.F. Williams, "Sources of Error in CoplanarWaveguide TRL Calibrations," 54^{th} ARFTG Conference Digest, Dec. 12, 1999.
 D.F. Williams and D.K. Walker, "0.110 GHz CMOS Voltage Standard," IEEE Workshop on Signal Propagation on Interconnects, TitiseeNeustadt, Germany, May 1921, 1999.
 D. F. Williams, "High frequency limitations of the JEDEC 123 guideline," 7^{th} Topical Meeting on Electrical Performance of Electronic Packaging, pp. 5457, Oct. 2628, 1998.
 D. F. Williams and D. K. Walker, "Lumpedelement impedance standards," 51^{st} ARFTG Conference Digest, pp. 9193, June 12, 1998.
 D. K. Walker and D. F. Williams, "Comparison of SOLR and TRL calibrations," 51^{st} ARFTG Conference Digest, pp. 8387, June 12, 1998.
 R. B. Marks, J. A. Jargon, and D. K. Rytting, "Accuracy of LumpedElement Calibrations for FourSampler Vector Network Analyzers," 1998 IEEE MTTS Symposium Digest, pp. 14871490, June 911, 1998.
 D. F. Williams, U. Arz, and H. Grabinski "Accurate Characteristic Impedance Measurement on Silicon," 1998 IEEE MTTS Symposium Digest, pp. 19171920, June 911, 1998.
 D. C. DeGroot, R. B. Marks, and J. A. Jargon, "A Method for Comparing Vector Network Analyzers," 50th ARFTG Conference Digest, pp. 107114, Portland, OR, Dec. 1997.
 D. Walker and D.F. Williams, "Compensation for Geometrical Variation in Coplanar Waveguide Probetip Calibration," IEEE Microwave and Guided Wave Letters, vol. 7, no. 4, pp. 9799, April 1997.
 R. B. Marks, J. A. Jargon, and J. R. Juroshek, "Calibration Comparison Method for Vector Network Analyzers," 48th ARFTG Conference Digest, pp. 3845, Clearwater, FL, Dec. 1996.
 D.C. DeGroot, D.K. Walker, and R.B. Marks, "Impedance mismatch effects on propagation constant measurements," 5th EPEP Conference, pp. 141143, Oct. 2830, 1996.
 D. F. Williams, J. M. Belquin, G. Dambrine, and R. Fenton, "OnWafer Measurement at Millimeter Wave Frequencies", 1996 IEEE MTTS Symposium Digest, vol. 3, pp. 16831686, June 1721, 1996.
 D. F. Williams and J. B. Schappacher, "LineReflectMatch Calibrations with Nonideal Microstrip Standards," 46th ARFTG Conference Digest, pp. 3538, Nov. 30Dec. 1, 1995.
 J. A. Jargon and R. B. Marks, "TwoTier Multiline TRL for Calibration of LowCost Network Analyzers," 46th ARFTG Conference Digest, pp. 18, Scottsdale, AZ, Nov.Dec. 1995.
 D. F. Williams and R. B. Marks, "LRM ProbeTip Calibrations using Nonideal Standards," IEEE Microwave Theory and Techniques, vol. 43, no. 2, pp. 466469, Feb. 1995.
 D. F. Williams and R. B. Marks, "Compensation for Substrate Permittivity in ProbeTip Calibration," 44th ARFTG Conference Digest, pp. 2030, Dec. 1994.
 D. F. Williams and R. B. Marks, "OnWafer Impedance Measurement on Lossy Substrates," IEEE Microwave and Guided Wave Letters, vol. 4, no. 6, pp. 175176, June 1994.
 R. B. Marks and D. F. Williams, "Verification of Commercial ProbeTip Calibrations," 42nd ARFTG Conference Digest, pp. 3744, Dec. 1993.
 D. F. Williams and R. B. Marks, "LRM ProbeTip Calibrations with Imperfect Resistors and Lossy Lines," 42nd ARFTG Conference Digest, pp. 3236, Dec. 1993. (Best Paper Award)
 D. F. Williams and R. B. Marks, "Calibrating OnWafer Probes to the Probe Tips," 40th ARFTG Conference Digest, pp. 136143, Dec. 1992.
 D. F. Williams and R. B. Marks, "Verification of scattering parameter measurements," Conference on Precision Electromagnetic Measurements, pp. 371372, June 1992.
 R. B. Marks and D. F. Williams, "Traceability for onwafer MMIC measurements," Conference on Precision Electromagnetic Measurements, pp. 371372, June 1992.
 D. F. Williams, R. B. Marks, and A. Davidson, "Comparison of OnWafer Calibrations," 38th ARFTG Conference Digest, pp. 6881, Dec. 1991.
 R. Furlow, R. Y. Shimoda, D. F. Williams, R. B. Marks, and K. C. Gupta, "Benchmark for the Validation of Microwave CAD Software," 38th ARFTG Conference Digest, pp. 97106, Dec. 1991.
 D. F. Williams, "Deembedding and unterminating microwave test fixtures with nonlinear least squares," IEEE Trans. Microwave Theory and Techniques, vol. 38, no. 6, pp. 787791, June 1990.
Planar Transmission Line Characterization
 D.F. Williams, U. Arz, H. Grabinski, "CharacteristicImpedance Measurement Error on Lossy Substrates," IEEE Microwave and Wireless Components Letters, vol. 11, no. 7, pp. 299301, July 2001.
 U. Arz, D.F. Williams, D.K. Walker, H. Grabinski, "HighFrequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers,"56th ARFTG Conference Digest, pp. 3237, Nov. 30Dec. 1, 2000.
 D.F. Williams and B.K. Alpert, "Characteristic impedance of microstrip on silicon," 8^{th} Topical Conference on Electrical Performance of Electronic Packaging.
 H. Grabinski, U. Arz, D. F. Williams, "Accurate Experimental Characterization of OnChip Interconnects," 1999 URSI General Assembly, Toronto, Canada, August 1321, 1999.
 H. Grabinski, U. Arz, D. F. Williams, "Accurate Experimental Characterization of OnChip Interconnects," 1999 URSI General Assembly, Toronto, Canada, August 1321, 1999.
 D. F. Williams, "Metalinsulatorsilicon transmission lines," IEEE Transactions on Microwave Theory and Techniques, vol. 47, no. 2, pp. 176181, Feb. 1999.
 D. F. Williams, "Metalinsulatorsilicon transmission line model," 51^{st} ARFTG Conference Digest, pp. 6571, June 12, 1998.
 D. F. Williams, U. Arz, and H. Grabinski "Accurate Characteristic Impedance Measurement on Silicon," 1998 IEEE MTTS Symposium Digest, pp. 19171920, June 911, 1998.
 V. Milanovic, M. Ozgur, D. C. DeGroot, J. A. Jargon, M. Gaitan, and M. Zaghloul, "Characterization of BroadBand Transmission for Coplanar Waveguides on CMOS Silicon Substrates," IEEE Transactions on Microwave Theory and Techniques, vol. 46, pp. 632640, May 1998.
 D. F. Williams, M. D. Janezic, A. Ralston, S. List, "QuasiTEM model for coplanar waveguide on silicon," 1997 EPEP Conference Digest, pp. 225228, Oct. 2729, 1997.
 D. F. Williams, J.M. Belquin, A. Spisser, A. Cappy, and D. Dambrine, "Characterization of coplanar waveguide on epitaxial layers," Electronics Letters, vol. 33, no. 17, pp. 14681469, Aug. 1997.
 M. D. Janezic and D. F. Williams, "Permittivity Characterization from TransmissionLine Measurement," IEEE International Microwave Symposium Digest, vol. 3, pp. 13431345, June 1012, 1997.
 D.C. DeGroot, D.K. Walker, and R.B. Marks, "Impedance mismatch effects on propagation constant measurements," 5th EPEP Conference, pp. 141143, Oct. 2830, 1996.
 D. F. Williams, J. M. Belquin, G. Dambrine, and R. Fenton, "OnWafer Measurement at Millimeter Wave Frequencies", 1996 IEEE MTTS Symposium Digest, vol. 3, pp. 16831686, June 1721, 1996.
 R. B. Marks and D. F. Williams, "Electrical characterization methods for highspeed interconnections," International Journal of Microelectronics and Electronic Packaging, vol. 18, pp. 207216, 1995.
 R. B. Marks and D. F. Williams, "Accurate electrical characterization of highspeed interconnections," Proceedings, 1994 International Symposium on Microelectronics, pp. 96101, Nov. 1994. (Best Paper of session Award)
 D. F. Williams and R. B. Marks, "OnWafer Impedance Measurement on Lossy Substrates," IEEE Microwave and Guided Wave Letters, vol. 4, no. 6, pp. 175176, June 1994.
 R. B. Marks and D. F. Williams, "Microwave Characterization of Printed Circuit Transmission Lines," NEPCON East, pp. 520527, June 1994.
 D. F. Williams and R. B. Marks, "Accurate Transmission Line Characterization," IEEE Microwave and Guided Wave Letters, vol. 3, no. 8, pp. 247249, Aug. 1993.
 R. B. Marks and D. F. Williams, "Interconnection Transmission Line Parameter Characterization," 40th ARFTG Conference Digest, pp. 8895, Dec. 1992.
 R. B. Marks and D. F. Williams, "Accurate Experimental Characterization of Interconnects: A Discussion of 'Experimental Electrical Characterization of Interconnects and Discontinuities in HighSpeed Digital Systems'," IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 15, no. 8, pp. 601602, Aug. 1992.
 D. F. Williams and R. B. Marks, "Comments on 'Characterization of resistive transmission lines by short pulse propagation'," IEEE Microwave and Guided Wave Letters, vol. 2, no. 8, pp. 346, Aug. 1992.
 D. F. Williams and R. B. Marks, "FrequencyDependent Transmission Line Parameters'," IEEE Topical Meeting on Electrical Performance of Electronic Packaging, pp. 125127, Apr. 1992.
 D. F. Williams, R. B. Marks, and A. Davidson, "Comparison of OnWafer Calibrations," 38th ARFTG Conference Digest, pp. 6881, Dec. 1991.
 D. F. Williams and R. B. Marks, "Transmission Line Capacitance Measurement," IEEE Microwave and Guided Wave Letters, vol. 1, no. 9, pp. 243245, Sept. 1991.
 R. B. Marks and D. F. Williams, "Characteristic Impedance Determination using Propagation Constant Measurement," IEEE Microwave and Guided Wave Letters, vol. 1, no. 6, pp. 141143, June 1991.
Multiconductor Transmission Lines
 P. Kabos, U. Arz, and D.F. Williams, "Multiport investigation of the coupling of highimpedance probes, IEEE Microwave and Wireless Components Letters, vol. 14, no. 11, pp. 510512, Nov. 2004.
 D.K. Walker, D.F. Williams, A. Padilla, U. Arz, and H. Grabinski, "FourPort Microwave Measurement System Speeds OnWafer Calibration and Test," Microwave Journal, pp. 144150, March 2001.
 U. Arz, D.F. Williams, D.K. Walker, H. Grabinski, "HighFrequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers,"56th ARFTG Conference Digest, pp. 3237, Nov. 30Dec. 1, 2000.
 U. Arz, D.F. Williams, D.K. Walker, and H. Grabinski, "Accurate electrical measurement of coupled lines on lossy silicon," 9^{th} Topical Conference on Electrical Performance of Electronic Packaging, pp. 181184, Oct. 2325, 2000.
 U. Arz, D.F. Williams, D.K. Walker, and H. Grabinski, "Asymmetric Coupled CMOS Lines: An Experimental Study," IEEE Transactions on Microwave Theory and Techniques, vol. 48, no. 12, Dec. 2000.
 U. Arz, D.F. Williams, D.K. Walker, J.E. Rogers, M. Rudack, D. Treytnar, and H. Grabinski, "Characterization of Asymmetric Coupled CMOS Lines,"2000 International Microwave Symposium Digest, pp. 609702, June 1116, 2000.
 D. F. Williams, J. E. Rogers, and C. L. Holloway, "Multiconductor transmission line characterization: representations, approximations, and accuracy," IEEE Transactions on Microwave Theory and Techniques, vol. 47, no. 4, pp. 403409, April 1999.
 D. F. Williams and D. K. Walker, "Inline multiport calibration," 51^{st} ARFTG Conference Digest, pp. 8890, June 12, 1998.
 D. F. Williams, L. A. Hayden, and R. B. Marks, "A Complete Multimode EquivalentCircuit Theory for Electrical Design," NIST Journal of Research, vol. 102, no. 4, pp. 405423, JulyAug. 1997.
 D. F. Williams, "Embedded multiconductor transmission line characterization," IEEE International Microwave Symposium Digest, vol. 3, pp. 17731776, June 1012, 1997.
 D. F. Williams, "Multiconductor Transmission Line Characterization," IEEE Transactions on Components, Packaging, and Manufacturing TechnologyPart B, vol. 20, no. 2, pp. 129132, May 1997.
 D. F. Williams, "Calibration in Multiconductor Transmission Lines," 48th ARFTG Conference Digest (Orlando, FL), pp. 4653, Dec. 46, 1996.
 D. F. Williams and F. Olyslager, "Modal Cross Power in QuasiTEM Transmission Lines", IEEE Microwave and Guided Wave Letters, vol. 6, no. 11, pp. 413415, November 1996.
 D. F. Williams, "Thermal Noise in Lossy Waveguides," IEEE Transactions on Microwave Theory and Techniques, vol. 44, no. 7, July 1996.
Electronic Packaging Characterization
 A. Louh, U. Arz, H. Grabinski, D.F. Williams, D.K. Walker, and A.Weisshaar, "Broadband impedance parameters of assymetric coupled CMOS interconnects: new closedform expressions and comparison with measurements," 7th IEEE Workshop on Signal Propagation on Interconnects., Siena, Italy, May 1114, 2003.
 U. Arz, P. Kabos, and D.F. Williams, "Measureing the invasiveness of highimpedance probes," 7th IEEE Workshop on Signal Propagation on Interconnects., Siena, Italy, May 1114, 2003.
 P. Kabos, H.C. Reader, U. Arz, and D.F. Williams, "Calibrated waveform measurement with highimpedance probes," IEEE Trans. Microwave Theory and Tech., vol. 51, no. 2, pp. 530535, February 2003.
 M.D. Janezic, D.F. Williams, V. Blaschke, A. Karamcheti, and C.S. Chang, "Permittivity characterization of lowk thin films from tranmissionline measurements," IEEE Trans. Microwave Theory and Tech., vol. 51, no. 1, pp. 132136, January 2003.
 D.F. Williams, U. Arz, H. Grabinski, "CharacteristicImpedance Measurement Error on Lossy Substrates," IEEE Microwave and Wireless Components Letters, vol. 11, no. 7, pp. 299301, July 2001.
 D.K. Walker, D.F. Williams, A. Padilla, U. Arz, and H. Grabinski, "FourPort Microwave Measurement System Speeds OnWafer Calibration and Test," Microwave Journal, pp. 144150, March 2001.
 U. Arz, D.F. Williams, D.K. Walker, H. Grabinski, "HighFrequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers,"56th ARFTG Conference Digest, pp. 3237, Nov. 30Dec. 1, 2000.
 D.F. Williams, A.C. Byers, V.C. Tyree, D.K. Walker, J.J. Ou, X. Jin, M. PiketMay, and C. Hu, "Contactpad design for highfrequency silicon measurements," 9^{th} Topical Conference on Electrical Performance of Electronic Packaging, pp. 131134, Oct. 2325, 2000.
 U. Arz, D.F. Williams, D.K. Walker, and H. Grabinski, "Accurate electrical measurement of coupled lines on lossy silicon," 9^{th} Topical Conference on Electrical Performance of Electronic Packaging, pp. 181184, Oct. 2325, 2000.
 U. Arz, D.F. Williams, D.K. Walker, and H. Grabinski, "Asymmetric Coupled CMOS Lines: An Experimental Study," IEEE Transactions on Microwave Theory and Techniques, vol. 48, no. 12, Dec. 2000.
 U. Arz, H. Grabinski, and D.F. Williams, "Influence of the Substrate Resistivity on the Broadband Propagation Characteristics of Silicon Transmission Lines," 54^{th} ARFTG Conference Digest, Dec. 12, 1999.
 D.F. Williams and D.K. Walker, "0.110 GHz CMOS Voltage Standard," IEEE Workshop on Signal Propagation on Interconnects, TitiseeNeustadt, Germany, May 1921, 1999.
 D.F. Williams and D. C. DeGroot, "Electrical Measurements for Electronic Interconnections at NIST," 1999 URSI General Assembly, Toronto, Canada, August 1321, 1999.
 D. F. Williams, "Metalinsulatorsilicon transmission lines," IEEE Transactions on Microwave Theory and Techniques, vol. 47, no. 2, pp. 176181, Feb. 1999.
 D. F. Williams, "High frequency limitations of the JEDEC 123 guideline," 7^{th} Topical Meeting on Electrical Performance of Electronic Packaging, pp. 5457, Oct. 2628, 1998.
 D.C. DeGroot and D. F. Williams, "National Institute of Standards and Technology programs in electrical measurements for electronic interconnections," 7^{th} Topical Meeting on Electrical Performance of Electronic Packaging, pp. 4549, Oct. 2628, 1998.
 D. F. Williams and D. K. Walker, "Inline multiport calibration," 51^{st} ARFTG Conference Digest, pp. 8890, June 12, 1998.
 D. F. Williams, "Metalinsulatorsilicon transmission line model," 51^{st} ARFTG Conference Digest, pp. 6571, June 12, 1998.
 D. F. Williams, U. Arz, and H. Grabinski "Accurate Characteristic Impedance Measurement on Silicon," 1998 IEEE MTTS Symposium Digest, pp. 19171920, June 911, 1998.
 D. F. Williams, M. D. Janezic, A. Ralston, S. List, "QuasiTEM model for coplanar waveguide on silicon," 1997 EPEP Conference Digest, pp. 225228, Oct. 2729, 1997.
 M. D. Janezic and D. F. Williams, "Permittivity Characterization from TransmissionLine Measurement," IEEE International Microwave Symposium Digest, vol. 3, pp. 13431345, June 1012, 1997.
 R. B. Marks and D. F. Williams, "Electrical characterization methods for highspeed interconnections," International Journal of Microelectronics and Electronic Packaging, vol. 18, pp. 207216, 1995.
 R. B. Marks, J. A. Jargon, C. K. Pao, and C. P. Wen, "Electrical Measurements of Microwave FlipChip Interconnections," Proceedings of the International Symposium on Microelectronics, pp. 424429, Los Angeles, CA, Oct. 1995.
 R. B. Marks, J. A. Jargon, C. K. Pao, C. P. Wen, and Y. C. Shih, "Microwave Characterization of FlipChip MMIC Components," Proceedings of the Electronic Components and Technology Conference, pp. 343350, Las Vegas, NV, May 1995.
 R. B. Marks, J. A. Jargon, C. K. Pao, and C. P. Wen, "Microwave Characterization of FlipChip MMIC Interconnections," IEEE MTTS International Microwave Symposium Digest, Orlando, FL, pp. 14631466, May 1995.
 R. B. Marks and D. F. Williams, "Accurate electrical characterization of highspeed interconnections," Proceedings, 1994 International Symposium on Microelectronics, pp. 96101, Nov. 1994. (Best Paper of session Award)
 D. F. Williams and R. B. Marks, "OnWafer Impedance Measurement on Lossy Substrates," IEEE Microwave and Guided Wave Letters, vol. 4, no. 6, pp. 175176, June 1994.
 R. B. Marks and D. F. Williams, "Microwave Characterization of Printed Circuit Transmission Lines," NEPCON East, pp. 520527, June 1994.
 D. F. Williams and R. B. Marks, "Accurate Transmission Line Characterization," IEEE Microwave and Guided Wave Letters, vol. 3, no. 8, pp. 247249, Aug. 1993.
 R. B. Marks and D. F. Williams, "Interconnection Transmission Line Parameter Characterization," 40th ARFTG Conference Digest, pp. 8895, Dec. 1992.
 D. F. Williams and R. B. Marks, "FrequencyDependent Transmission Line Parameters'," IEEE Topical Meeting on Electrical Performance of Electronic Packaging, pp. 125127, Apr. 1992.
 K. Phillips and D. Williams, "MMIC Package Characterization with Active Loads," 36th ARFTG Conference Digest, pp. 6472, Nov. 1990.
 D. F. Williams, "Damping of the Resonant Modes of a Rectangular Metal Package," IEEE Trans. Microwave Theory and Techniques, vol. 37, no. 1, pp. 253256, Jan. 1989.
Electronic Materials Characterization
 M.D. Janezic, D.F. Williams, V. Blaschke, A. Karamcheti, and C.S. Chang, "Permittivity characterization of lowk thin films from tranmissionline measurements," IEEE Trans. Microwave Theory and Tech., vol. 51, no. 1, pp. 132136, January 2003.
 M. D. Janezic and J. A. Jargon, "Complex Permittivity Determination from Propagation Constant Measurements, IEEE Microwave and Guided Wave Letters, vol. 9, no. 2, pp. 7678, Feb. 1999.
 D. F. Williams, U. Arz, and H. Grabinski "Accurate Characteristic Impedance Measurement on Silicon," 1998 IEEE MTTS Symposium Digest, pp. 19171920, June 911, 1998.
 D. F. Williams, M. D. Janezic, A. Ralston, S. List, "QuasiTEM model for coplanar waveguide on silicon," 1997 EPEP Conference Digest, pp. 225228, Oct. 2729, 1997.
 D. F. Williams, J.M. Belquin, A. Spisser, A. Cappy, and D. Dambrine, "Characterization of coplanar waveguide on epitaxial layers," Electronics Letters, vol. 33, no. 17, pp. 14681469, Aug. 1997.
 M. D. Janezic and D. F. Williams, "Permittivity Characterization from TransmissionLine Measurement," IEEE International Microwave Symposium Digest, vol. 3, pp. 13431345, June 1012, 1997.
HighSpeed Electrical and Electrooptic Measurements
 Wang, C. M. J., Hale, P. D., Jargon, J. A., Williams, D. F., Remley, K. A., "Sequential Estimation of Timebase Corrections for an Arbitrarily Long Waveform," IEEE Trans. Instr. Meas., vol. 61, no. 10, pp. 26892694, Oct. 2012.
 P.D. Hale, J. Jargon, C.M. Wang, B. Grossman, J. Torres, A. Dienstfrey, D.F. Williams, "A Statistical Study of DeEmbedding Applied to Eye Diagram Analysis," IEEE Trans. Instr. Meas., Vol. 6, No. 2, pp. 475488, February 2012.
 A. Lewandowski and D.F. Williams, "Characterization and modeling of random vector network analyzer measurement errors," 17th International Conf. on Microwaves, Radar and Wireless Communications, 1921 May, 2008.
 C.M. Wang, P.D. Hale and D.F. Williams, "Uncertainty of timebase corrections," IEEE Trans. Instr. Meas., vol. 58, no. 10, pp 34683472, Oct. 2009.
 P.D. Hale, A. Dienstfrey, C.M. Wang, D.F. Williams, A. Lewandowski, D.A. Keenan and T.S. Clement "Traceable waveform calibration With a covarianceBased uncertainty analysis," IEEE Trans. Instr. Meas., vol. 58, no. 10, pp 35543568, Oct. 2009.
 D. F. Williams, T.S. Clement, K. A. Remley, and P. D. Hale, "Systematic error of the nosetonose sampling oscilloscope calibration," IEEE Trans. Microwave Theory Tech., vol. 55, no. 9, Sept. 2007, pp. 19511963.
 D.F. Williams, P.D. Hale, K.A. Remley, "The sampling oscilloscope as a microwave instrument," IEEE Microwave Magazine, Aug. 2007, pp. 5968.
 D.F. Williams, T.S. Clement, P.D. Hale, and A. Dienstfrey, "Terminology for highspeed samplingoscilloscope calibration," ARFTG Conf. Dig., pp. 914, Dec. 2006. (ARFTG best paper award)
 P. D. Hale, C. M. Wang, D. F. Williams, K. A. Remley, and J. Wepman, "Compensation of random and systematic timing errors in sampling oscilloscopes," IEEE Trans. Instrum. Meas., vol. 55, no. 6. pp. 21462154, Dec. 2006.
 A. Dienstfrey, P. D. Hale, D. A. Keenan, T. S. Clement, D. F. Williams, " Minimumphase calibration of sampling oscilloscopes," IEEE Trans. Microwave Theory Tech., pp. 3197  3208, Aug. 2006.
 T.S. Clement, P.D. Hale, D.F. Williams, C. M. Wang, A. Dienstfrey, and D.A. Keenan, "Calibration of sampling oscilloscopes with highspeed photodiodes," IEEE Trans. Microwave Theory Tech., pp. 3173  3181, Aug. 2006.
 D. F. Williams, H. Khenissi, F. Ndagijimana, K. A. Remley, J. P. Dunsmore, P. D. Hale, C. M. Wang, and T. S. Clement, "SamplingOscilloscope Measurement of a Microwave Mixer with SingleDigit Phase Accuracy," IEEE Trans. Microwave Theory Tech.vol. 53, no. 3, pp. 12101217, March 2006.
 D. F. Williams, A. Lewandowski, T. S. Clement, C. M. Wang, P. D. Hale, J. M. Morgan, D. Keenan, and A. Dienstfrey, "CovarianceBased Uncertainty Analysis of the NIST Electrooptic Sampling System," IEEE Trans. Microwave Theory Tech., vol. 54, no. 1, pp. 481491, Jan. 2006.
 D.F. Williams, P.D. Hale, T.S. Clement, and J.M. Morgan, "Calibrated 200 GHz Waveform Measurement," IEEE Trans. Microwave Theory and Tech., vol. 53, no. 4, pp. 13841389, April, 2005.
 D.F. Williams, P.D. Hale, T.S. Clement, C.M. Wang, "Uncertainty of the NIST electrooptic sampling system," NIST Tech. Note 1535, Dec. 2004.
 K. A. Remley, D. F. Williams, D. F. Schreurs, and J. Wood, "Simplifying and interpreting twotone measurements," IEEE Trans. Microwave Theory and Tech., vol. 52, no. 11, pp. 25762584, Nov. 2004.
 K.A. Remley and D.F. Williams, "Sampling oscilloscope models and calibrations," 2003 Int. Microwave Symp. Dig., pp. 15071510, June 1012, 2003. (invited)
 P.D. Hale and D.F. Williams, "Calibrated measurement of optoelectronic frequency response," IEEE Trans. Microwave Theory Techn., vol. 51, no. 4, pp. 14221429, April 2003. (Winner of the NIST Electronics and Electrical Engineering Laboratory 2003 Outstanding Authorship Award.)
 T.S. Clement, P.D. Hale, D.F. Williams, and J.M. Morgan, "Calibrating photoreciever response to 110 GHz," 15th Annual Meeting of the IEEE Lasers and ElectroOptics Society Confrence Digest, Nov. 1014, 2002, Glasglow, Scotland.
 U. Arz, H.C. Reader, P. Kabos, D.F. Williams, "Wideband FrequencyDomain Characterization of HighImpedance Probes," 58th ARFTG Conference Digest, pp. 117124, Nov. 2930, 2001.
 D.F. Williams, P.D. Hale, T.S. Clement, and J.M. Morgan, "Calibrating electrooptic sampling systems," Int. Microwave Symposium Digest, Phoenix, AZ, pp. 15271530, May 2025, 2001.
 P.D. Hale, T.S. Clement, D.F. Williams, E. Balta, and N.D. Taneja, "Measuring the Frequency Response of Gigabit Chip Photodiodes," J. Lightwave Technol., vol. 19, no. 9, pp. 13331339, September 2001.
 P.D. Hale, T.S. Clement, and D.F. Williams, "Frequency response metrology for highspeed optical receivers, "Optical Fiber Conference (OFC'01) Digest, Anaheim, CA, pp. WQ113, March 1722, 2001.
 P.D. Hale, T.S. Clement, and D.F. Williams, "Measuring frequency response of highspeed optical receivers requires microwave measurements," SPIE's OE Magazine, p. 56, March 2001.
 D.F. Williams, P.D. Hale, T.S. Clement, and J.M. Morgan, "Mismatch corrections for electrooptic sampling systems," 56th ARFTG Conference Digest, pp. 141145, Nov. 30Dec. 1, 2000. (Best Poster Award)
