NIST 'Catch and Release' Program Could Improve Nanoparticle Safety Assessment
NIST 'Nanowire' Measurements Could Improve Computer Memory
NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
NIST Electromechanical Circuit Sets Record Beating Microscopic 'Drum'
NIST Focuses on Testing Standards to Support Lab on a Chip Commercialization
NIST Reference Materials Are 'Gold Standard' for Bio-Nanotech Research
NIST Studies How New Helium Ion Microscope Measures Up
NIST Team Advances in Translating Language of Nanopores
NIST to Cosponsor Conference in France on Nanoelectronics Metrology
NIST's 'Nanotubes on a Chip' May Simplify Optical Power Measurements
NIST’s Microscopic Drum Could Link Electromagnetic, Mechanical Motion at Quantum Level
NIST, UM Program To Support Nanotech Development
NIST-Cornell Team Builds World's First Nanofluidic Device with Complex 3-D Surfaces -- Chamber Separates Nanoparticles Like a 'Coin Sorter'
Nano 'Pin Art': NIST Arrays Are Step Toward Mass Production of Nanowires
Nanoelectronics Conference Will Focus on Semiconductor Industry's Future
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Date created: December 17, 2009 | Last updated: October 5, 2010