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Manipulating Magnetic Field Effects in Organic Semiconductors
NIST 'Catch and Release' Program Could Improve Nanoparticle Safety Assessment
NIST 'Nanowire' Measurements Could Improve Computer Memory
NIST Electromechanical Circuit Sets Record Beating Microscopic 'Drum'
NIST Focuses on Testing Standards to Support Lab on a Chip Commercialization
NIST Gets New Angle on X-Ray Measurements
NIST Reference Materials Are 'Gold Standard' for Bio-Nanotech Research
NIST Studies How New Helium Ion Microscope Measures Up
NIST System Replicated by Chip Maker
NIST Team Advances in Translating Language of Nanopores
NIST to Cosponsor Conference in France on Nanoelectronics Metrology
NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
NIST's 'Nanotubes on a Chip' May Simplify Optical Power Measurements
NIST, UM Program To Support Nanotech Development
NIST-Cornell Team Builds World's First Nanofluidic Device with Complex 3-D Surfaces -- Chamber Separates Nanoparticles Like a 'Coin Sorter'
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Date created: December 17, 2009 | Last updated: October 5, 2010