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Six NIST Researchers Selected as IEEE Fellows

For Immediate Release: January 12, 2010

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Contact: Michael Baum
301-975-2763

Six researchers at the National Institute of Standards and Technology (NIST) have been named fellows of IEEE, as association for professionals involved in areas ranging from aerospace systems, computers and telecommunications to biomedical engineering, electric power and consumer electronics. The IEEE grade of Fellow is conferred by the board of directors upon a person with an extraordinary record of accomplishments in any of the IEEE fields of interest. IEEE Fellow is the highest grade of membership and is recognized by the technical community as a prestigious honor and an important career achievement.

The new IEEE fellows from NIST are:

  • James Baker-Jarvis of the Electronics and Electrical Engineering Laboratory for contributions to dielectric measurement and analysis of microwave measurement structures
  • Samuel Paul Benz of the Electronics and Electrical Engineering Laboratory for contributions to quantum-based Josephson junction array waveform synthesizer
  • Christopher L. Holloway of the Electronics and Electrical Engineering Laboratory for application of new material in the field of electromagnetic compatibility
  • Nicholas G. Paulter of the Electronics and Electrical Engineering Laboratory for contributions to ultra-high speed waveform measurements
  • P. Jonathon Phillips of the Information Technology Laboratory for contributions to the evolution of face recognition techniques
  • Jeffrey Mark Voas of the Information Technology Laboratory for leadership in the development of trustworthy software, including improved metrics and process optimization.


For more information on IEEE fellows, see www.ieee.org/web/aboutus/news/2009/3december.html