NIST logo

Publications Portal

You searched on:
Author: Dylan Williams

Displaying records 1 to 10 of 149 records.
Resort by: Date / Title


1. Baseband Corrections for Precision Millimeter Wave Signal Measurements
Published: 8/12/2013
Authors: Catherine A Remley, Saeed Farsi, Dominique Schreurs, Dylan F Williams, Paul D Hale, Chih-Ming Wang
Abstract: NA
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914309

2. A Precision Millimeter-Wave Modulated-Signal Source
Published: 6/6/2013
Authors: Catherine A Remley, Paul D Hale, Dylan F Williams, Chih-Ming Wang
Abstract: We develop and characterize a modulated-signal source for use at millimeter-wave frequencies. Components within the source are phase locked by a 10 GHz reference source to minimize drift and improve synchronization. The complex frequency response of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912855

3. Sequential Estimation of Timebase Corrections for an Arbitrarily Long Waveform
Published: 10/1/2012
Authors: Chih-Ming Wang, Paul D Hale, Jeffrey A Jargon, Dylan F Williams, Catherine A Remley
Abstract: We present a procedure for correcting the timebase distortion and jitter of temporal waveforms of arbitrary lengths. This is achieved by estimating the timebase distortion and jitter sequentially with overlapping measurements and using the informatio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909866

4. A statistical study of de-embedding applied to eye diagram analysis
Published: 2/1/2012
Authors: Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
Abstract: We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907585

5. Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports
Published: 1/1/2012
Author: Dylan F Williams
Abstract: We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare four rectangular-waveguide calibration strategies at sub-millimeter wavelengths that correct for electrical-port impe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909155

6. On-Chip Security Using Electromagnetic Analysis
Series: Grant/Contract Reports (NISTGCR)
Report Number: 687-12-71
Published: 10/27/2011
Authors: James Schaffner, Dylan F Williams
Abstract: In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic mon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910062

7. Use of Electronic Calibration Units for Vector-Network-Analyzer Verification
Published: 7/30/2010
Authors: Dylan F Williams, Arkadiusz C. (Arkadiusz) Lewandowski, Denis X LeGolvan, Ronald A Ginley, Chih-Ming Wang, Jolene D Splett
Abstract: We present measurements indicating that electronic calibration units are stable enough to be used in place of mechanical vector-network-analyzer verification artifacts. This enables a new fully automated approach to verifying microwave vector-network ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903470

8. Identifying RF Identification Cards from Measurements of Resonance and Carrier Harmonics
Published: 5/27/2010
Authors: Henry Romero, Catherine A Remley, Dylan F Williams, Chih-Ming Wang, Timothy X. Brown
Abstract: We show that careful measurements of the unloaded resonant frequency and quality factor of radio frequency identification proximity cards allow identification of different card models and, for the set of cards we studied, identification with mini ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904644

9. Electro-optic sampling for traceable high-speed electrical measurements
Published: 5/23/2010
Authors: Paul D Hale, Dylan F Williams
Abstract: We will describe how the complex frequency response of a high-speed photodiode is calibrated by use of electro-optic sampling. Our uncertainty analysis includes a unique covariance-matrix based method that allows us to transform uncertainties between ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905205

10. Measurement Bandwidth Extension Using Multisine Signals: Propagation of Error
Published: 2/6/2010
Authors: Catherine A Remley, Dominique Schreurs, M. Myslinski, Dylan F Williams
Abstract: We describe a post-processing technique that can extend the effective measurement bandwidth of narrowband vector receivers by phase aligning overlapping measurements. The method requires only knowledge of the desired phases of a periodic, multisine e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901524



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series