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Author: Dylan Williams

Displaying records 1 to 10 of 155 records.
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1. Characterizing a Noninsertable Directional Device Using the NIST Uncertainty Framework
Published: 6/6/2014
Authors: Jeffrey A Jargon, Dylan F Williams, Paul D Hale, Michael D Janezic
Abstract: We characterize and provide uncertainties for a noninsertable, directional device over a frequency range of 90 to 100 GHz using the NIST Microwave Uncertainty Framework in conjunction with a commercial vector network analyzer. Our device consists of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913524

2. Calibrated Oscilloscope Measurements for System-Level Characterization of Weakly Nonlinear Sources
Published: 4/4/2014
Authors: Catherine A Remley, Dylan F Williams, Paul D Hale, Chih-Ming Wang, Jeffrey A Jargon, Youngcheol Park
Abstract: We present a technique to characterize and correct for linear and weakly nonlinear distortion introduced by the nonideal response of a wideband, high-frequency modulated-signal source. The magnitude and phase relationships between frequency component ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915592

3. Baseband Corrections for Precision Millimeter Wave Signal Measurements
Published: 8/12/2013
Authors: Catherine A Remley, Saeed Farsi, Dominique Schreurs, Dylan F Williams, Paul D Hale, Chih-Ming Wang
Abstract: NA
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914309

4. The Impact of Characteristic Impedance on Waveform Calibrations
Published: 6/7/2013
Authors: Dylan F Williams, Jeffrey A Jargon, Paul D Hale
Abstract: We examine the impact of the characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912864

5. A Precision Millimeter-Wave Modulated-Signal Source
Published: 6/6/2013
Authors: Catherine A Remley, Paul D Hale, Dylan F Williams, Chih-Ming Wang
Abstract: We develop and characterize a modulated-signal source for use at millimeter-wave frequencies. Components within the source are phase locked by a 10 GHz reference source to minimize drift and improve synchronization. The complex frequency response of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912855

6. Characterizing WR-8 Waveguide-to-CPW Probes Using Two Methods Implemented within the NIST Uncertainty Framework
Published: 11/30/2012
Authors: Jeffrey A Jargon, Uwe Arz, Dylan F Williams
Abstract: We individually characterize and provide uncertainties for a pair of WR-8 rectangular waveguide-to-coplanar waveguide (CPW) probes over a frequency range of 90 to 140 GHz utilizing two methods implemented within the NIST Microwave Uncertainty Framew ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912557

7. Sequential Estimation of Timebase Corrections for an Arbitrarily Long Waveform
Published: 10/1/2012
Authors: Chih-Ming Wang, Paul D Hale, Jeffrey A Jargon, Dylan F Williams, Catherine A Remley
Abstract: We present a procedure for correcting the timebase distortion and jitter of temporal waveforms of arbitrary lengths. This is achieved by estimating the timebase distortion and jitter sequentially with overlapping measurements and using the informatio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909866

8. Traceability of high-speed electrical waveforms at NIST, NPL, and PTB
Published: 7/6/2012
Authors: Paul D Hale, Dylan F Williams, Andrew M Dienstfrey, Chih-Ming Wang, Jeffrey A Jargon, David Humphreys, Matthew Harper, Heiko Fuser, Mark Bieler
Abstract: Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-op ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910633

9. Verifying Traceability of Electronic Calibration Units Using the NIST Microwave Uncertainty Framework
Published: 6/22/2012
Authors: Jeffrey A Jargon, Dylan F Williams, Thomas M Wallis, Denis X LeGolvan, Paul D Hale
Abstract: We present a method for providing traceability to a commercial electronic calibration unit for vector network analyzers by characterizing its scattering parameters with repeated multiline thru-reflect-line (TRL) calibrations and utilizing the NIST Mi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910883

10. A statistical study of de-embedding applied to eye diagram analysis
Published: 2/1/2012
Authors: Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
Abstract: We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907585



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