NIST logo

Publications Portal

You searched on: Author: Catherine Cooksey

Displaying records 1 to 10 of 17 records.
Resort by: Date / Title


1. National Institute of Standards and Technology measurement service of the optical properties of biomedical phantoms: Current status
Published: 3/24/2016
Authors: Paul Lemaillet, Catherine C Cooksey, Zachary H Levine, Adam L Pintar, Jeeseong Hwang, David W Allen
Abstract: The National Institute for Standards and Technology (NIST) has maintained scales of reflectance and transmittance over several decades. Those scales are primarily intended for the regular transmittance, mirrors, and solid surface scattering diffusers ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920498

2. SPIE 9639-49 Creation and Validation of Spectralon BRDF Targets & Standards
Published: 10/12/2015
Authors: Catherine C Cooksey, Gael Obein, Georgi T Georgiev, Christopher Durell, Dan Scharpf, Greg McKee, Michelle L'Heureux
Abstract: Spectralon is an extremely stable, near-perfect lambertian reflecting diffuser and calibration standard material that has been used by national labs, space, aerospace and commercial sectors for over two decades. New uncertainty targets of 2% on-orb ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919590

3. Spectral reflectance variability of skin and attributing factors
Published: 5/21/2015
Authors: Catherine C Cooksey, Benjamin K Tsai, David W Allen
Abstract: Knowledge of the spectral reflectance signature of human skin over a wide spectral range will help advance the development of sensing systems for many applications, ranging from medical treatment to security technology. A critical component of the s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918494

4. Bidirectional reflectance scale comparison between NIST and PTB
Published: 5/1/2015
Authors: Catherine C Cooksey, Maria E Nadal, David W Allen, Kai-Olaf Hauer, Andreas Hoepe
Abstract: A comparison of bidirectional reflectance scales between the National Institute of Standards and Technology (NIST) and the Physikalisch-Technische Bundesanstalt (PTB) has been performed. Measurements of two sets of white diffuse reflectance standard ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913371

5. Establishment and application of the 0/45 reflectance factor scale over the shortwave infrared
Published: 4/1/2015
Authors: Catherine C Cooksey, David W Allen, Benjamin K Tsai, Howard W Yoon
Abstract: This paper describes the establishment and application of the 0/45 reflectance factor scale in the shortwave infrared (SWIR) from 1100 nm to 2500 nm. Design, characterization, and the demonstration of a 4-stage, extended indium-gallium-arsenide radi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917390

6. A collection and statistical analysis of skin reflectance signatures for inherent variability over the 250 nm to 2500 nm spectral range
Published: 6/4/2014
Authors: Catherine C Cooksey, Benjamin K Tsai, David W Allen
Abstract: The spectral reflectance signature of human skin provides opportunities to advance observations ranging from medical treatment to security applications. In this study 28 volunteers participated in a skin reflectance measurement of the inside of the r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916057

7. Sensor Calibration and Characterization to Meet Climate Monitoring Requirements
Published: 4/24/2014
Authors: Catherine C Cooksey, Gerald T Fraser, Howard W Yoon
Abstract: The challenge of detecting small changes in the Earth's climate system over decadal and longer time scales places stringent requirements on environmental monitoring systems. Sensors must be well calibrated and maintain their calibration in challengin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915271

8. Broadband transmission filter 2013 OIC manufacturing problem contest
Published: 1/10/2014
Authors: Catherine C Cooksey, Li Li, J. A. Dobrowolski, Michael Jacobson
Abstract: A broadband transmission filter from 400nm to 1100nm was selected for the manufacturing problem contest. The premise of the contest is to test the state of the art of current optical thin film manufacturing capabilities. A total 37 people from 15 tea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914720

9. Reflectance measurements of human skin from the ultraviolet to the shortwave infrared (250 nm to 2500 nm)
Published: 5/29/2013
Authors: Catherine C Cooksey, David W Allen
Abstract: While published literature of the optical properties of human skin is prevalent for the visible region, data are sparse in the ultra violet and shortwave infrared. Spectral imaging has expanded from primarily an earth remote sensing tool to a range ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913891

10. Tunable Supercontinuum Fiber Laser Source for BRDF Measurements in the STARR II Gonioreflectometer
Published: 9/27/2012
Authors: Heather J Patrick, Clarence Joseph Zarobila, Thomas Avery Germer, Victor Alan Ying, Catherine C Cooksey, Benjamin K Tsai
Abstract: STARR II is a planned NIST facility for spectral measurements of specular reflectance and diffuse bidirectional reflectance distribution function (BRDF) that is the follow-on to the current NIST STARR (Spectral Tri-function Automated Reference Reflec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912019



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series