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Author: Robert Vest
Displaying records 1 to 10 of 58 records.
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1.
SURF III: A flexible Synchrotron Radiation Source for Radiometry and Research
Published: 9/1/2011
Authors: Uwe Arp, Charles W Clark, Lu Deng, Nadir Sabirovich Faradzhev, Alex P. Farrell, Mitchell L. Furst, Steven Grantham, Edward Walter Hagley, Shannon Bradley Hill, Thomas B Lucatorto, Ping-Shine Shaw, Charles S. Tarrio, Robert Edward Vest
Abstract: The calculability of synchrotron radiation (SR) makes electron storage rings wonderful light sources for radiometry. The broadband nature of SR allows coverage of the whole spectral region from the x-ray to the far-infrared. Compact low-energy storag
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http://nist.gov/manuscript-publication-search.cfm?pub_id=906750
2.
Measuring Pulse Energy With Solid-State Photodiodes
Published: 4/10/2009
Authors: Robert Edward Vest, Shannon Bradley Hill, Steven Grantham
Abstract: With the advent of extreme ultraviolet lithography (EUVL) the measurement of the energy contained in pulses of short-wavelength radiation is becoming increasingly important. Even low average power sources can deliver pulses of radiation with high pea
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http://nist.gov/manuscript-publication-search.cfm?pub_id=840222
3.
Metrology for EUVL Sources and Tools,ed. by V. Bakshi
Published: 1/1/2006
Authors: S Grantham, Charles S. Tarrio, Robert Edward Vest, Thomas B Lucatorto
http://nist.gov/manuscript-publication-search.cfm?pub_id=100158
4.
NIST VUV Metrology Programs to Support Space Based Research,
Published: 1/1/2006
Authors: Robert Edward Vest, Yaniv Barad, Mitchell L. Furst, Steven Grantham, Charles S. Tarrio, Ping-Shine Shaw
http://nist.gov/manuscript-publication-search.cfm?pub_id=101784
5.
NIST VUV metrology programs to support space-based research
Published: 1/1/2006
Authors: Robert Edward Vest, Yaniv Barad, Mitchell L. Furst, Steven Grantham, Charles S. Tarrio, Ping-Shine Shaw
http://nist.gov/manuscript-publication-search.cfm?pub_id=104243
6.
Saturation effects in solid state photodiodes and impact on EUVL pulse energy measurements,
Published: 1/1/2006
Authors: Robert Edward Vest, Shannon Bradley Hill, Steven Grantham
http://nist.gov/manuscript-publication-search.cfm?pub_id=101785
7.
EUV component and system characterization at NIST for the support of extreme-ultraviolet lithography, ed. by R.S. Mackay
Published: 5/13/2005
Authors: S Grantham, Shannon Bradley Hill, Charles S. Tarrio, Robert Edward Vest, Thomas B Lucatorto
http://nist.gov/manuscript-publication-search.cfm?pub_id=100159
8.
A Simple Transfer-Optics System for an Extreme-Ultraviolet Synchrotron Beamline
Published: 4/1/2005
Authors: Charles S. Tarrio, Steven Grantham, Robert Edward Vest, K Liu
Abstract: Beamlines at synchrotron radiation facilities often have interchangeable endstations to allow several different experiments to use the output of a single monochromator. However, for endstations that are sufficiently large, this is not possible. We
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http://nist.gov/manuscript-publication-search.cfm?pub_id=840198
9.
A simple transfer-optics system for an extreme-ultraviolet synchrotron beamline,
Published: 1/1/2005
Authors: Charles S. Tarrio, Steven Grantham, Robert Edward Vest, K Liu
http://nist.gov/manuscript-publication-search.cfm?pub_id=101759
10.
External efficiency of Pt/n-GaN Schottky diodes in the spectral range 5-500 nm
Published: 1/1/2005
Authors: S Aslam, Robert Edward Vest, D Franz, F Yan, Y Zhao, D B Mott
http://nist.gov/manuscript-publication-search.cfm?pub_id=101401