Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Optical Technology

Displaying records 1 to 10 of 22 records.
Resort by: Date / Title

1. On-Chip Silicon Waveguide Bragg Grating Photonic Temperature Sensor
Topic: Optical Technology
Published: 8/4/2015
Authors: Nikolai Nikolayevich Klimov, Sunil Mittal, Zeeshan Ahmed, Michaela Berger
Abstract: Resistance thermometry is a time-tested method for temperature measurements. Fundamental limits to resistance-based approaches, spurred our interest in developing photonic temperature sensors as a viable alternative. In this study we demonstrate that ...

2. Quantitative scheme for full-field polarization rotating fluorescence microscopy (PROM) using a liquid crystal variable retarder
Topic: Optical Technology
Published: 5/14/2015
Authors: John F. Lesoine, Ji Y. Lee, Hyeong G. Kang, Matthew Lawrence Clarke, Robert C. Chang, Ralph Nossal, Jeeseong Hwang
Abstract: We introduce real-time, full-field, polarization rotating fluorescence microscopy (PROM) to monitor the absorption dipole orientations of fluorescent molecules. A quarter-wave plate, in combination with a liquid crystal variable retarder (LCVR ...

3. Dimensional Metrology of Lab on a Chip Internal Structures: a Comparison of Optical Coherence Tomography with Coherence Fluorescence Microscopy
Topic: Optical Technology
Published: 4/8/2015
Authors: Darwin R Reyes-Hernandez, Michael W Halter, Jeeseong Hwang
Abstract: The characterization of internal structures in a polymeric device, specifically of a final product, will require a different set of metrology techniques than those traditionally use in the characterization of microelectronic devices. OCT is relati ...

4. IR-enhanced Si reference detectors for 1-step scale transfers from 300 nm to 1000 nm
Topic: Optical Technology
Published: 11/20/2014
Authors: George P Eppeldauer, Thomas C Larason, Jeanne M Houston, Robert Edward Vest, Uwe Arp, Howard W Yoon
Abstract: IR-enhanced Si photodiodes have improved radiometric and electronic characteristics as compared to other widely used Si photodiodes and can be used as responsivity standards in the wavelength range from 300 nm to 1000 nm. Their low predicted uncerta ...

5. Standoff passive video imaging at 350 GHz with 251 superconducting detectors
Topic: Optical Technology
Published: 6/20/2014
Authors: Daniel Thomas Becker, James A Beall, Hsiao-Mei Cho, Gene C Hilton, Nicholas G Paulter Jr., Carl D Reintsema, Robert E Schwall, Cale Gentry, Ilya Smirnov, Peter Ade, W D Duncan, Mark Halpern, Carole Tucker
Abstract: Millimeter wavelength radiation holds promise for detection of security threats at a distance, including suicide bomb belts and maritime threats in poor weather. The high sensitivity of superconducting Transition Edge Sensor (TES) detectors makes the ...

6. Development of in-situ calibration method for current-to-voltage converters for high-accuracy SI-traceable low-DC-current measurements
Topic: Optical Technology
Published: 9/20/2013
Authors: George P Eppeldauer, Howard W Yoon, Dean G Jarrett, Thomas C Larason
Abstract: For photocurrent measurements with low uncertainties, wide-dynamic range reference current-to-voltage converters and a new converter calibration method have been developed at the National Institute of Standards and Technology (NIST). The high feedba ...

7. Harnessing 3D Scattered Optical Fields for sub-20 nm Defect Detection
Topic: Optical Technology
Published: 6/24/2013
Authors: Bryan M Barnes, Martin Y Sohn, Francois R. Goasmat, Hui Zhou, Richard M Silver, Abraham Arceo
Abstract: Experimental imaging at =193 nm of sub-resolved defects performed at several focus positions yields a volume of spatial and intensity data. Defects are located in a differential volume, given a reference, with up to 5x increase in sensitivity ...

8. Spectral responsivity based calibration of photometer and colorimeter standards
Topic: Optical Technology
Published: 6/19/2013
Author: George P Eppeldauer
Abstract: Several new generation transfer- and working-standard illuminance meters and tristimulus colorimeters have been developed at the National Institute of Standards and Technology (NIST) to measure all kinds of light sources with low uncertainty. The spe ...

9. Chapter 13. Color Quality of White LEDs
Topic: Optical Technology
Published: 5/24/2013
Author: Yoshihiro Ohno
Abstract: This chapter overviews the fundamentals of chromaticity and color rendering as the two important aspects of color quality of light sources for general illumination, with special focus on the use for solid state light sources. The section for chrom ...

10. An Analysis of the Probability Distribution of Spectral Angle and Euclidean Distance in Hyperspectral Remote Sensing Using Microspectroscopy
Topic: Optical Technology
Published: 5/18/2013
Authors: Ronald Resmini, Christopher Deloye, David W Allen
Abstract: Determining the probability distribution of hyperspectral imagery (HSI) data and of the results of algorithms applied to those data, is critical to understanding algorithm performance and for establishing performance metrics such as probability o ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series