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1. Parameter Estimation and Uncertainty Evaluation in a Low Rician K-Factor Reverberation-Chamber Environment
Topic: Electromagnetics
Published: 10/15/2014
Authors: Chih-Ming Wang, Catherine A Remley, Ansgar T. Kirk, Ryan J. Pirkl, Christopher L Holloway, Dylan F Williams, Paul D Hale
Abstract: In this paper we study statistical methods for estimating the Rician K-factor when this parameter is small. A fiducial approach for making statistical inference on the K-factor is discussed. The approach requires a Monte Carlo method to compute the u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914638

2. Amplifier and Transistor Noise-Parameter Measurements
Topic: Electromagnetics
Published: 10/1/2014
Author: James Paul Randa
Abstract: Methods for measuring the noise parameters of amplifiers and on-wafer transistors are reviewed. After some preliminary background information and conventions, noise parameters are defined and the most common measurement strategies are presented, bot ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915122

3. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Electromagnetics
Published: 7/23/2014
Authors: Nathan Daniel Orloff, Jan Obrzut, Christian John Long, Thomas Fung Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

4. Absorptive Limiter for Frequency Selective Circuits
Topic: Electromagnetics
Published: 6/1/2014
Authors: Juan C. Collado Gomez, Eduard Rocas, James C Booth, Jordi Mateu, J. M. O'Callaghan, J. Verdu, A. Hueltes
Abstract: This paper describes a novel absorptive limiter for frequency selective circuits. The proposed circuit allows the design of absorptive limiters based on a bi-state phase shifter, which is appropriate for integration into channelizing devices, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914262

5. G-band micro-fabricated frequency-steered arrays with 2{degree}/GHz beam steering
Topic: Electromagnetics
Published: 7/17/2013
Authors: Leonardo Matteo Ranzani, Daniel G. Kuester, Kenneth Vanhille, Anatoliy Boryssenko, Erich N Grossman, Zoya Popovic
Abstract: In this paper, we describe micro-fabricated frequency-scanned slot waveguide arrays operating between 130 and 180 GHz for planetary landing radar. The group delay dispersion of the feed line is increased by corrugating the bottom rectangular wave ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913446

6. Characterizing Large-Form-Factor Devices in a Reverberation Chamber
Topic: Electromagnetics
Published: 7/15/2013
Authors: Catherine A Remley, Gerrit Stefan van de Beek, Christopher L Holloway, John M Ladbury
Abstract: Abstract,With new technologies such as machine-to-machine communications there is a growing need to test large-formfactor devices in reverberation chambers. The performance of the reverberation chamber can be degraded by the physical characteristics ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911733

7. Accelerated Stress Test Assessment of Through-Silicon Vias Using RF Signals
Topic: Electromagnetics
Published: 6/1/2013
Authors: Chukwudi Azubuike Okoro, Pavel Kabos, Jan Obrzut, Klaus Hummler, Yaw S Obeng
Abstract: In this work, radio frequency (RF) signal is demonstrated as an effective metrology tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity of TSV da ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912850

8. Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis
Topic: Electromagnetics
Published: 5/28/2013
Authors: Chukwudi Azubuike Okoro, Yaw S Obeng, Jan Obrzut, Pavel Kabos, Klaus Hummler
Abstract: In this work, we used radio frequency (RF) based measurement technique is used as a prognostic tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913332

9. MIMO Capacity in 2-D and 3-D Isotropic Environments
Topic: Electromagnetics
Published: 5/21/2013
Authors: Ryan J. Pirkl, Catherine A Remley
Abstract: We analyze the distribution of MIMO channel capacity for different antennas in 2-D and 3-D statistically isotropic environments. These represent possible test environments that may be generated by multi-probe anechoic and reverberation chambers, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910357

10. NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications
Series: Handbook (NIST HB)
Report Number: 150-11
Topic: Electromagnetics
Published: 4/25/2013
Authors: Bethany E Hackett, Bradley W Moore, Dennis G. Camell
Abstract: NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Electromagnetic Compatibility and Telecommunications (ECT) LAP. I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913586



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