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You searched on: Topic Area: Microwave Measurement Services

Displaying records 1 to 10 of 28 records.
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1. On-wafer Magnetic Resonance of Magnetite Nanoparticles
Topic: Microwave Measurement Services
Published: 5/11/2015
Authors: Charles Anderson Enright Little, Stephen E Russek, James C Booth, Pavel Kabos, Robert J. Usselman
Abstract: Magnetic resonance measurements of ferumoxytol and TEMPO were made using an on-wafer transmission line technique with a vector network analyzer, allowing for broadband measurements of small sample volumes (4 nl) and a small numbers of spin (1 nmole). ...

2. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Microwave Measurement Services
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian John Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...

3. Colored Noise and Regularization Parameter Selection for Waveform Metrology
Topic: Microwave Measurement Services
Published: 7/8/2014
Authors: Andrew M Dienstfrey, Paul D Hale
Abstract: We study six regularization parameter selection algorithms applied to deconvolution problems relevant for characterization of high-speed communication measurement systems. In particular we investigate the performance of these selectors in the presen ...

4. Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope
Topic: Microwave Measurement Services
Published: 7/2/2014
Authors: Atif A. Imtiaz, Thomas M Wallis, Joel C Weber, Kevin J Coakley, Matthew David Brubaker, Paul T Blanchard, Kristine A Bertness, Norman A Sanford
Abstract: We used a broadband, atomic-force-microscope-based, scanning microwave microscope (AFM-SMM) to probe the axial dependence of the depletion in a GaN nanowire (NW) p-n junction structure. The NWs were c-axis oriented and grown by molecular beam epitax ...

5. Analysis for Dynamic Metrology
Topic: Microwave Measurement Services
Published: 1/30/2014
Authors: Andrew M Dienstfrey, Paul D Hale
Abstract: Diverse measurement contexts require estimates of time varying quantities. Ideally the measurement device responds to signal variations significantly more rapidly than the modulation of the signal itself. If so, then well-developed techniques may b ...

6. Full-Wave Analysis of Dielectric-Loaded Cylindrical Waveguides and Cavities Using a New Four-Port Ring Network
Topic: Microwave Measurement Services
Published: 8/31/2012
Authors: Felipe Penaranda-foix, Michael D. Janezic, Jose M. Catala-Civera, Antoni J. Canos-Marin
Abstract: In this paper, a full-wave method for the electromagnetic analysis of dielectric-loaded cylindrical and coaxial waveguides and cavities is developed. For this purpose, a new four-port ring network is proposed, and the mode-matching method is applied ...

7. A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics
Topic: Microwave Measurement Services
Published: 8/10/2012
Authors: Joel C Weber, Kristine A Bertness, John B. Schlager, Norman A Sanford, Atif A. Imtiaz, Thomas M Wallis, Pavel Kabos, Kevin J Coakley, Victor Bright, Lorelle M. Mansfield
Abstract: We present a near field scanning microwave microscope (NSMM) optimized for imaging photovoltaic samples. Our system incorporates a cut Pt-Ir tip inserted into an open ended coaxial cable to form a weak resonator, allowing the microwave reflection S1 ...

8. An Investigation of Antenna Characterization Techniques in Microwave Remote Sensing Calibrations
Topic: Microwave Measurement Services
Published: 7/22/2012
Authors: Derek Anderson Houtz, Dazhen Gu, David K Walker, James Paul Randa
Abstract: We compare three methods of quantifying illumination efficiency (IE). The ratio IE describes the contribution of energy emitted from a blackbody target to the total energy measured at an antenna aperture in a free-space microwave calibration target r ...

9. A Genetic Algorithm for Generating RF Circuit Models from Calibrated Broadband Measurements
Topic: Microwave Measurement Services
Published: 12/1/2011
Author: Thomas M Wallis
Abstract: A genetic algorithm has been developed to generate circuit models from calibrated broadband measurements of coaxial and on-wafer devices under test (DUTs). The algorithm randomly builds a population of circuit models from lumped as well as distribute ...

10. Microwave Radiometric Standards Development at the U.S. National Institute of Standards and Technology
Topic: Microwave Measurement Services
Published: 12/1/2011
Author: David K Walker
Abstract: NIST‰s stated mission is, ,To promote U.S. innovation and industrial competitiveness by advancing measurement science, standards, and technology in ways that enhance economic security and improve our quality of life.Š NIST offers an extensive range o ...

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