NIST logo

Publications Portal

You searched on:
Topic Area: Superconductors

Displaying records 1 to 10 of 188 records.
Resort by: Date / Title


1. Differential sampling measurement of a 7 V rms Sine Wave with a Programmable Josephson Voltage Standard
Topic: Superconductors
Published: 6/1/2013
Authors: Alain Rufenacht, Charles J Burroughs, Paul David Dresselhaus, Samuel Paul Benz
Abstract: A 10 V programmable Josephson voltage standard has enabled sine waves with voltages up to 7 V rms to be accurately measured with a differential sampling measurement technique. Expanding the voltage range for this technique enables direct calibration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911610

2. A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium
Topic: Superconductors
Published: 2/17/2011
Authors: Jolene D Splett, Dominic F. (Dominic F.) Vecchia, Loren Frederick Goodrich
Abstract: We compare methods for estimating the residual resistivity ratio (RRR) of high-purity niobium samples and investigate the effects of using different functional models on the final value. RRR is typically defined as the ratio of the electrical resista ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906197

3. Measurement crosstalk between two phase qubits coupled by a coplanar waveguide
Topic: Superconductors
Published: 9/14/2010
Authors: Fabio Altomare, Katarina Cicak, Mika A. Sillanpaa, Michael Shane Allman, Dale Li, Adam Joseph Sirois, Joshua Strong, Jae Park, Jed Douglas Whittaker, Raymond Wiley Simmonds
Abstract: We investigate measurement crosstalk in a system with two flux-biased phase qubits coupled by a resonant coplanar waveguide cavity. After qubit measurement, the superconducting phase undergoes damped oscillations in a deep anharmonic potential produc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904964

4. 1V and 10V SNS Programmable Voltage Standards for 70 GHz
Topic: Superconductors
Published: 6/3/2009
Authors: Franz Mueller, Ralf Behr, T. Weimann, Luis Palafox, David Olaya, Paul David Dresselhaus, Samuel Paul Benz
Abstract: Programmable Josephson voltage standards (PJVSs) in combination with fast switchable DC current sources have opened up new applications in the field of low frequency AC metrology. The growing interest in output voltages of up to 10 V init ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33151

5. Microwave Packaging for Voltage Standard Applications
Topic: Superconductors
Published: 6/3/2009
Authors: Mike Elsbury, Charles J Burroughs, Paul David Dresselhaus, Zoya Popovic, Samuel Paul Benz
Abstract: Improvements to the packaging of Josephson Volt- age Standard (JVS) circuits have increased operating margins, reliability, and longevity of these systems. By using the ,flip- chip-on-flexŠ technique, reliable chip an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33149

6. YBa^d2^Cu^d3^O^d7-{delta}^ coated conductor cabling for low ac-loss and high-field magnet applications
Topic: Superconductors
Published: 5/1/2009
Author: Daniel Cornelis van der Laan
Abstract: The electromechanical properties of YBa^d2^Cu^d3^O^d7-{delta}^ coated conductors under high axial compressive strain are measured; they show no irreversible degradation in critical current up to -2 % strain. The high degree of elasticity of the ceram ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902009

7. Advanced Metrology for Nanoelectronics at the National Institute of Standards and Technology
Topic: Superconductors
Published: 3/11/2009
Authors: Joaquin (Jack) Martinez, Yaw S Obeng, Stephen Knight
Abstract: A broad range of programs at the National Institute of Standards and Technology address critical metrology and characterization challenges facing the nanoelectronics industry. A brief history of the program will be included. From these programs we ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901409

8. Third Intermodulation Distortion and Harmonic Generation in Mismatched Nonlinear Transmission Lines
Topic: Superconductors
Published: 1/1/2009
Authors: James C Booth, Jordi Mateu, Carlos Collado, Eduard Rocas, Juan M O'Callaghan, Nathan Daniel Orloff
Abstract: This paper describes the procedure to obtain analytical expressions for the spurious signals generated in nonlinear transmission lines with impedance mismatch. Using these expressions one can rapidly extract the nonlinear parameters describing th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33019

9. Ultra-high resolution alpha particle spectroscopy using calorimetry
Topic: Superconductors
Published: 9/23/2008
Authors: Robert Daniel Horansky, Joel Nathan Ullom, James A Beall, Gene C Hilton, Kent D Irwin, Don Dry, Beth Hastings, Stephen Lamont, Clifford R Rudy, Michael W Rabin
Abstract: Calorimetry has been used since the late 1700?s to measure the heat output of physical processes ranging from chemical reactions to the respiration of organisms . Calorimetry is performed by measuring the temperature change caused by heat release int ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32940

10. Dependence of the Critical Current of YBa^d2^Cu^d3^O7^d-d^ Coated Conductors on In-Plane Bending
Topic: Superconductors
Published: 9/3/2008
Authors: Daniel Cornelis van der Laan, John (Jack) Ekin
Abstract: A new method to measure the effect of in-plane bending on the critical current of YBa^d2^Cu^d3^O^d7-d^ coated conductors is presented. Such bending mode can be important in transmission cables, saddleback magnets, and double-pancake windings. A linea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33040



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series