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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 1 to 10 of 211 records.
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1. A rational strategy for characterization of nanoscale particles by asymmetric flow field-flow fractionation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/16/2014
Authors: Julien C. Gigault, John M Pettibone, Charlene Eva Schmitt, Vincent A Hackley
Abstract: This tutorial proposes a comprehensive and rational measurement strategy that provides specific guidance for the application of asymmetric-flow field flow fractionation (A4F) to the size-dependent separation and characterization of nanoscale partic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914192

2. Direct evidence of active and inactive phases of Fe catalyst nanoparticles for carbon nanotube formation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/1/2014
Authors: Stefano Mazzuccoo, Ying Wang, Mihaela Tanase, Matthieu Claude Pierre Picher, Kai Li, Zhijian WU, Stephan Irle, Renu Sharma
Abstract: Iron and carbon interactions play an important role in various industrial processes such as steel manufacturing, liquid fuel the production by Fischer Tropsch process and carbon nanotube synthesis by chemical vapor deposition process. Interestingly, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914905

3. Nanoparticle size determination using optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/27/2014
Authors: Ravikiran Attota, Richard J Kasica, Premsagar Purushotham Kavuri, Hyeong Gon Kang, Lei Chen
Abstract: We present a simple method for size determination of nanoparticles using conventional optical microscopes. The method, called through-focus scanning optical microscopy (TSOM), makes use of the four-dimensional optical information collected at differe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914209

4. Electrical Scanning Probe Microscopes to Address Industrial Nano-Metrology Needs of Integrated Circuits and Nanoelectronic Devices
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/25/2014
Author: Joseph J Kopanski
Abstract: , Electrical modes of scanning probe microscopes have found considerable metrology applications in integrated circuits and emerging nano-electronic devices. This paper will review the critical metrology needs that electrical SPMs have addressed in th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915485

5. Pseudomagnetic Fields in a Locally Strained Graphene Drumhead
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/25/2014
Authors: Shuze Zhu, Yinjun Huang, Nikolai Nikolayevich Klimov, David B Newell, Nikolai B Zhitenev, Joseph A Stroscio, Santiago de Jesus Solares Rivera, Teng Li
Abstract: Recent experiments reveal that a scanning tunneling microscopy (STM) probe tip can generate a highly localized strain field in a graphene drumhead, which in turn leads to pseudomagnetic fields in the graphene that can spatially confine graphene charg ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915987

6. Analysis of the Noise Spectra from Oxidized Superparamagnetic Nanoparticles
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/18/2014
Authors: Solomon I Woods, Snorri Ingvarsson, Shouheng Sun, John Kirtley
Abstract: Expressions for the thermal noise from a collection of exchange-biased magnetic nanoparticles are derived and used to analyze the magnetic noise from thin films of partially oxidized nanoparticles. Functionalized Co nanoparticles with diameters betw ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915838

7. Attachment of a Reduction-Oxidative Active Diruthenium Compound to Au and Si Surfaces by ,ClickŠ Chemistry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/10/2014
Authors: Sujitra Jeanie Pookpanratana, Joseph William Robertson, Curt A Richter, Christina Ann Hacker, Lee J Richter, Julia Savchenko, Steven Cummings, Tong Ren
Abstract: We report the formation of molecular monolayers containing redox-active diruthenium(II,III) compound to gold and silicon surfaces via ,clickŠ chemistry. The use of Cu-catalyzed azide-alkyne cycloaddition enables modular design of molecular surfa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914145

8. Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/29/2014
Authors: Ravikiran Attota, Ronald G Dixson
Abstract: We experimentally demonstrate that the three-dimensional (3-D) shape variations of nanometer-scale objects can be resolved and measured with sub-nanometer scale sensitivity using conventional optical microscopes by analyzing 3-D optical data using th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908543

9. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/23/2014
Authors: Nathan Daniel Orloff, Jan Obrzut, Christian John Long, Thomas Fung Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

10. High-speed, high-purity separation of gold nanoparticle‹DNA origami constructs using centrifugation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/23/2014
Authors: Seung H. Ko, Luis Fernando Vargas Lara, Paul N. Patrone, Samuel M Stavis, Francis Starr, Jack F Douglas, James Alexander Liddle
Abstract: DNA origami is a powerful platform for assembling gold nanoparticle constructs, an important class of nanostructure with numerous applications. Such constructs are assembled by the association of complementary DNA oligomers. These association reactio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915009



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