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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 1 to 10 of 163 records.
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1. Electrospray Differential Mobility Hyphenated with Single Particle Mass Spectrometry for Characterization of Nanoparticles and their Aggregates
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/1/2016
Authors: Jiaojie Tan, Jingyu Liu, Mingdong M. Li, Hind El Hadri, Vincent A Hackley, Michael Russel Zachariah
Abstract: The hyphenation of electrospray-differential mobility analysis with single particle-inductively coupled plasma mass spectrometry (ES-DMA-spICP-MS) was demonstrated with the capacity for real- time size, mass and concentration measurement of nanopa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920035

2. Feasibility study on 3-D shape analysis of high-aspect-ratio features using through-focus scanning optical microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/14/2016
Authors: Ravikiran Attota, Peter Weck, John A Kramar, Bunday Benjamin, Victor H Vartanian
Abstract: In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device architectures. Metrology and process control of three-dimensional (3D) high-aspect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914709

3. Parameter optimization for through-focus scanning optical microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/23/2016
Authors: Ravikiran Attota, Hyeong G. Kang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920557

4. Development of surface chemical approaches for detection and characterization of multi-walled carbon nanotubes dispersed in a polymer composite
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/23/2016
Authors: Justin M Gorham, William A Osborn, Jeremiah W Woodcock, Jeffrey W Gilman
Abstract: Multi-walled carbon nanotubes (MWCNT) and other carbon nanofillers are used in different applications to enhance the materials and electrical properties of consumer products such as polymer composites. As a result, concern has arisen regarding the p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920519

5. Use of the Bethe Equation for Inner-Shell Ionization by Electron Impact
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/13/2016
Authors: Cedric John Powell, Xavier Llovet, Francesc Salvat
Abstract: We analyzed calculated cross sections for K-, L-, and M-shell ionization by electron impact to determine the energy ranges over which these cross sections are consistent with the Bethe equation for inner-shell ionization. Our analysis was performed w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919625

6. Probing Charge Transfer and Hot Carrier Dynamics in Organic Solar Cells with Terahertz Spectroscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/10/2016
Authors: Paul D. Cunningham, Paul A. Lane, Joseph S Melinger, Okan Esenturk, Edwin J Heilweil
Abstract: Time-resolved terahertz spectroscopy (TRTS) was used to explore charge generation, transfer, and the role of hot carriers in organic solar cell photovoltaic materials. Two model molecular photovoltaic systems were investigated: with Zinc Phthaloc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920502

7. Enabling Quantitative Optical Imaging for In-die-capable Critical Dimension Targets
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/4/2016
Authors: Bryan M Barnes, Mark Alexander Henn, Martin Y Sohn, Hui Zhou, Richard M Silver
Abstract: Dimensional scaling trends will eventually bring the semiconductor critical dimensions (CDs) down to only a few atoms in width. New optical techniques are required to address intra-die variability for these CDs using sufficiently small in-die metrolo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920551

8. Optimizing noise for defect analysis with through-focus scanning optical microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/25/2016
Authors: Ravikiran Attota, John A Kramar
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920308

9. Centroid and Orientation Precision of Localization Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/11/2016
Authors: Craig Dyer McGray, Craig Robert Copeland, Samuel M Stavis, Jon C Geist
Abstract: The concept of localization precision, which is essential to localization microscopy, is formally extended from optical point sources to microscopic rigid bodies. Measurement functions are presented to calculate the planar position, orientation, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918105

10. In Situ Monitoring, Separation, and Characterization of Gold Nanorod Transformation during Seed-Mediated Synthesis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/12/2016
Authors: Thao M. Nguyen, John M Pettibone, Julien Gigault, Vincent A Hackley
Abstract: Gold nanorods (GNRs) occupy a unique place in nanotechnology due to the ability to tune the optical properties from the middle visible to near IR spectrum by varying their size and aspect ratio (AR). Although there have been many anisotropic growth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918205



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