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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 1 to 10 of 121 records.
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1. Challenges, Strategies and Opportunities for Measuring Carbon Nanotubes within a Polymer Composites by X-ray Photoelectron Spectroscopy
Series: Special Publication (NIST SP)
Report Number: 1200-10
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/14/2015
Authors: Justin M Gorham, Jeremiah Wallace Woodcock, Keana C K Scott
Abstract: FOREWORD This NIST Special Publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917794

2. Photodetectors: High-Gain and Low-Driving-Voltage Photodetectors Based on Organolead Triiodide Perovskites (Adv. Mater. 11/2015)
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/12/2015
Authors: Riu Dong, Yanjun Fang, Jungseok Chae, Jun Dai, Zhengguo Xiao, Qingfeng Dong, Yongbo Yuan, Andrea Centrone, Xiaocheng Zeng, Jinsong Huang
Abstract: Methylammonium lead triiodide (CH3NH3PbI3) perovskite is an emerging low-cost, solution processable material which attracts great interest for enabling the fabrication of high performance optoelectronic devices such as solar cells, room temperature l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917115

3. New Insights into Subsurface Imaging of Carbon Nanotubes in Polymer Composites via Scanning Electron Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/4/2015
Authors: Minhua Zhao, Bin Ming, Jae-Woo Kim, Luke J Gibbons, Xiaohong Gu, Tinh Nguyen, Cheol Park, Peter T Lillehei, John S Villarrubia, Andras Vladar, James Alexander Liddle
Abstract: Despite many studies of subsurface imaging of carbon nanotube (CNT)-polymer composites via scanning electron microscopy (SEM), significant controversy exists concerning the imaging depth and contrast mechanisms. We studied CNT-polyimide composites an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917530

4. Preparation of silver nanoparticle loaded cotton threads to facilitate measurement development for textile applications
Series: Special Publication (NIST SP)
Report Number: 1200-8
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/26/2015
Authors: Justin M Gorham, Karen E Murphy, Jingyu Liu, Dimitri Tselenchuk, Gheorghe Stan, Thao Minh Nguyen, Richard D Holbrook, Michael R Winchester, Robert Francis Cook, Robert MacCuspie, Vincent A Hackley
Abstract: FOREWORD This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916567

5. Direct evidence of active and inactive phases of Fe catalyst nanoparticles for carbon nanotube formation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/1/2014
Authors: Stefano Mazzuccoo, Ying Wang, Mihaela M. Tanase, Matthieu C. Picher, Kai Li, Zhijian WU, Stephan Irle, Renu Sharma
Abstract: Iron and carbon interactions play an important role in various industrial processes such as steel manufacturing, liquid fuel the production by Fischer Tropsch process and carbon nanotube synthesis by chemical vapor deposition process. Interestingly, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914905

6. Nanoparticle size determination using optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/27/2014
Authors: Ravikiran Attota, Richard J Kasica, Premsagar Purushotham Kavuri, Hyeong Gon Kang, Lei Chen
Abstract: We present a simple method for size determination of nanoparticles using conventional optical microscopes. The method, called through-focus scanning optical microscopy (TSOM), makes use of the four-dimensional optical information collected at differe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914209

7. Reliability of Low Temperature Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Aric Warner Sanders, Alexandra E Curtin, R. Ishihara, David Thomas Read
Abstract: In this extended abstract we present our recent results on the reliability testing of multi-wall carbon nanotube vertical interconnects (vias).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915382

8. Attachment of a Reduction-Oxidative Active Diruthenium Compound to Au and Si Surfaces by ,ClickŠ Chemistry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/10/2014
Authors: Sujitra Jeanie Pookpanratana, Joseph William Robertson, Curt A Richter, Christina Ann Hacker, Lee J Richter, Julia Savchenko, Steven Cummings, Tong Ren
Abstract: We report the formation of molecular monolayers containing redox-active diruthenium(II,III) compound to gold and silicon surfaces via ,clickŠ chemistry. The use of Cu-catalyzed azide-alkyne cycloaddition enables modular design of molecular surfa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914145

9. Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/29/2014
Authors: Ravikiran Attota, Ronald G Dixson
Abstract: We experimentally demonstrate that the three-dimensional (3-D) shape variations of nanometer-scale objects can be resolved and measured with sub-nanometer scale sensitivity using conventional optical microscopes by analyzing 3-D optical data using th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908543

10. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian John Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011



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