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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 1 to 10 of 216 records.
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1. Preparation of silver nanoparticle loaded cotton threads to facilitate measurement development for textile applications
Series: Special Publication (NIST SP)
Report Number: 1200-8
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/26/2015
Authors: Justin M Gorham, Karen E Murphy, Jingyu Liu, Dimitri Tselenchuk, Gheorghe Stan, Thao Minh Nguyen, Richard D Holbrook, Michael R Winchester, Robert Francis Cook, Robert MacCuspie, Vincent A Hackley
Abstract: FOREWORD This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916567

2. Applicability of post-ionization theory to laser-assisted field evaporation of magnetite
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/18/2014
Authors: Ann Chiaramonti Chiaramonti Debay, D. K. Schreiber, Lyle M Gordon, Karen Kruska
Abstract: Analysis of the mean Fe ion charge state from laser-assisted field evaporation of magnetite (Fe3O4) reveals unexpected trends as a function of laser pulse energy that break from conventional post-ionization theory for metals. For Fe ions evaporated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917193

3. Nanomanufacturing Metrology for Cellulosic Nanomaterials: an Update
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/1/2014
Author: Michael T Postek
Abstract: The development of the metrology and standards for advanced manufacturing of cellulosic nanomaterials (or basically, wood-based nanotechnology) is imperative to the success of this rising economic sector. Wood-based nanotechnology is a revolutionary ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916298

4. A rational strategy for characterization of nanoscale particles by asymmetric flow field-flow fractionation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/16/2014
Authors: Julien C. Gigault, John M Pettibone, Charlene Eva Schmitt, Vincent A Hackley
Abstract: This tutorial proposes a comprehensive and rational measurement strategy that provides specific guidance for the application of asymmetric-flow field flow fractionation (A4F) to the size-dependent separation and characterization of nanoscale partic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914192

5. Direct evidence of active and inactive phases of Fe catalyst nanoparticles for carbon nanotube formation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/1/2014
Authors: Stefano Mazzuccoo, Ying Wang, Mihaela M. Tanase, Matthieu C. Picher, Kai Li, Zhijian WU, Stephan Irle, Renu Sharma
Abstract: Iron and carbon interactions play an important role in various industrial processes such as steel manufacturing, liquid fuel the production by Fischer Tropsch process and carbon nanotube synthesis by chemical vapor deposition process. Interestingly, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914905

6. Nanoparticle size determination using optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/27/2014
Authors: Ravikiran Attota, Richard J Kasica, Premsagar Purushotham Kavuri, Hyeong Gon Kang, Lei Chen
Abstract: We present a simple method for size determination of nanoparticles using conventional optical microscopes. The method, called through-focus scanning optical microscopy (TSOM), makes use of the four-dimensional optical information collected at differe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914209

7. A Simplified Approach to Determining Resolutions for Optical, Ion and Electron Microscope Images
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/26/2014
Authors: Alexandra E Curtin, Ann Chiaramonti Chiaramonti Debay, Aric Warner Sanders
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915394

8. Reliability of Low Temperature Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Aric Warner Sanders, Alexandra E Curtin, R. Ishihara, David Thomas Read
Abstract: In this extended abstract we present our recent results on the reliability testing of multi-wall carbon nanotube vertical interconnects (vias).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915382

9. Electrical Scanning Probe Microscopes to Address Industrial Nano-Metrology Needs of Integrated Circuits and Nanoelectronic Devices
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/25/2014
Author: Joseph J Kopanski
Abstract: , Electrical modes of scanning probe microscopes have found considerable metrology applications in integrated circuits and emerging nano-electronic devices. This paper will review the critical metrology needs that electrical SPMs have addressed in th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915485

10. Pseudomagnetic Fields in a Locally Strained Graphene Drumhead
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/25/2014
Authors: Shuze Zhu, Yinjun Huang, Nikolai Nikolayevich Klimov, David B Newell, Nikolai B Zhitenev, Joseph A Stroscio, Santiago de Jesus Solares Rivera, Teng Li
Abstract: Recent experiments reveal that a scanning tunneling microscopy (STM) probe tip can generate a highly localized strain field in a graphene drumhead, which in turn leads to pseudomagnetic fields in the graphene that can spatially confine graphene charg ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915987



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