NIST logo

Publications Portal

You searched on:
Topic Area: Nanotechnology

Displaying records 11 to 20 of 389 records.
Resort by: Date / Title


11. Storage Wars: How citrate capped silver nanoparticle suspensions are affected by not-so-trivial decisions
Topic: Nanotechnology
Published: 3/21/2014
Authors: Justin M Gorham, Anne B Rohlfing, Katrice A Lippa, Robert I. MacCuspie, Amy Hemmati, Richard D Holbrook
Abstract: A critical but often overlooked component of silver nanoparticle (AgNPs) suspensions involves their behavior following short- and long-term storage. The current study investigates the integrity of citrate-capped AgNP suspensions, nominally 20 nm in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913638

12. Highly Stable Positively Charged Dendron-Encapsulated Gold Nanoparticles
Topic: Nanotechnology
Published: 3/13/2014
Authors: Tae Joon Cho, Robert I. MacCuspie, Julien C. Gigault, Justin M Gorham, John T Elliott, Vincent A Hackley
Abstract: We report the development of a novel cationic dendron (TAG1-PCD) and a positively charged gold nanoparticle-dendron conjugate (PCD-AuNP). TAG1-PCD was designed by considering the reactivity, hydrophilicity, and cationic nature that is required to yie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914562

13. Frequency, amplitude, and phase measurement in contact resonance atomic force microscopies
Topic: Nanotechnology
Published: 3/12/2014
Authors: Gheorghe Stan, Santiago de Jesus Solares Rivera
Abstract: We analysed the resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, differing in the method used to excite the system (cantilever base vs. sample exc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914965

14. Documentation for Reference Material (RM) 8820: A Versatile, Multipurpose Dimensional Metrology Calibration Standard for Scanned Particle Beam, Scanned Probe and Optical Microscopy
Series: Special Publication (NIST SP)
Report Number: 1170
Topic: Nanotechnology
Published: 2/3/2014
Authors: Michael T Postek, Andras Vladar, Bin Ming, Bunday Benjamin
Abstract: Reference Material (RM) 8820 is a multipurpose instrument calibration standard available from NIST. This is a dimensional standard initially developed to replace the out of stock RM 8090 used for X and Y scale calibrations of scanned particle beam mi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914808

15. Head and Media Challenges for 3 Tb/in^u2^ Microwave Assisted Magnetic Recording
Topic: Nanotechnology
Published: 2/3/2014
Authors: Thomas J Silva, Justin M Shaw, Hans T. Nembach, Mike Mallary, Kumar Srinivasan, Gerado Bertero, Dan Wolf, Christian Kaiser, Michael Chaplin, Mahendra Pakala, Leng Qunwen, Yiming Wang, Carl Elliot, Lui Francis
Abstract: A specific design for Microwave Assisted Magnetic Recording (MAMR) at about 3Tb/in^u2^ (0.47 Tb/cm^u2^ or 4.7 Pb/m^u2^) is discussed in detail to highlight the challenges of MAMR and to contrast its requirements with conventional Perpendicular Magnet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914220

16. Template synthesis of gold nanoparticles with an organic molecular cage
Topic: Nanotechnology
Published: 1/16/2014
Authors: Ryan McCaffrey, Hai Long, Yinghua Jin, Aric Warner Sanders, Wounjhang Park, Wei Zhang
Abstract: We report a novel strategy for the controlled synthesis of gold nanoparticles (AuNPs) with narrow size distribution (1.9 {plus or minus} 0.4 nm) through NP nucleation and growth inside the cavity of a well-defined three-dimensional, shape-persist ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915368

17. Does Your SEM Really Tell the Truth? - How would you know? Part 1
Topic: Nanotechnology
Published: 12/16/2013
Authors: Michael T Postek, Andras Vladar
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The high resolution of the SEM is especially suited for both qualitative and quantit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912761

18. Impact of UV Irradiation on the Surface Chemistry and Structure of Multiwall Carbon Nanotube Epoxy Nanocomposites
Topic: Nanotechnology
Published: 12/6/2013
Authors: Elijah J Petersen, Thomas Fung Lam, Justin M Gorham, Keana C K Scott, Christian John Long, Deborah L Stanley, Renu Sharma, James Alexander Liddle, Tinh Nguyen
Abstract: One of the most promising applications of nanomaterials is as nanofillers to enhance the properties of polymeric materials. However, the effect of nanofillers on polymers subject to typical environmental stresses, such as ultraviolet (UV) radiation, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913865

19. Nanomanufacturing Concerns about Measurements made in the SEM II: Specimen Contamination
Topic: Nanotechnology
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar, Premsagar Purushotham Kavuri
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The improvements that have been made have significantly improved the overall SEM per ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914028

20. Nanomanufacturing concerns about Measurements made in the SEM I: Imaging and its Measurement
Topic: Nanotechnology
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar
Abstract: The high resolution of the SEM is especially useful for qualitative and quantitative applications for both nanotechnology and nanomanufacturing. But, should users be concerned about the imaging and measurements made with this instrument? Perhaps one ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914029



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series