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Topic Area: Nanotechnology

Displaying records 291 to 300 of 388 records.
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291. Nanometrology - FY 2003 Program and Selected Accomplishments
Series: NIST Interagency/Internal Report (NISTIR)
Topic: Nanotechnology
Published: 12/15/2003
Authors: C M Allocca, Stephen Weil Freiman
Abstract: The emphasis on nanotechnology around the world is leading to the development and commercialization of unique products based upon significantly smaller devices and material ensembles. Materials at the nanoscale in three dimensions (NEMS, MEMS), two ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850109

292. Value Assignment and Uncertainty Estimation of Selected Light Stable Isotope Reference Materials: RMs 8543-8545, RMs 8562-8564, and RM 8566
Series: Special Publication (NIST SP)
Report Number: 260-149
Topic: Nanotechnology
Published: 12/1/2003
Authors: R Michael Verkouteren, D Klinedinst
Abstract: We report the technical basis for value assignments of several carbon and oxygen stable isotope reference materials distributed by NIST and the International Atomic Energy Agency (IAEA), and make recommendations regarding laboratory practices and fut ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831290

293. Ferroelectric Phase Transitions in Nano-Scale Chemically Ordered PbSc^d0.5^Nb^d0.5^O^d3^ Using a First-Principles Model Hamiltonian
Topic: Nanotechnology
Published: 7/1/2003
Authors: U Waghmare, Eric J Cockayne, Benjamin P Burton
Abstract: fects of chemical order, disorder, short range order, and anti-phase boundaries on phase transitions and dielectric properties of PBSc^d1/2^Nb^d1/2^O^d3^ are studied through molecular dynamics simulations of a FP model. Simulations of large systems ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850670

294. Tools and Procedures for Quantitative Microbeam Isotope Ratio Imaging by Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 7/1/2003
Authors: John G Gillen, David S. Bright
Abstract: In this work we demonstrate the use of secondary ion mass spectrometry (SIMS) combined with the Lispix image processing program (Bright 1995) to generate quantitative isotope ratio images from a test sample of a calcium-aluminum rich inclusion (CA ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831237

295. Isotopic Metrology of Carbon Dioxide. I. Interlaboratory Comparison and Empirical Modeling of Inlet Equilibration Time, Inlet Pressure, and Ion Source Conductance
Topic: Nanotechnology
Published: 6/1/2003
Authors: R Michael Verkouteren, C E Allison, S A Studley, K J Leckrone
Abstract: We report a pilot study of high-precision differential isotopic ratio measurements made on replicate samples of pure carbon dioxide using three instruments of identical manufacture. Measurement protocols were designed to explore the effects of sampl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831258

296. Isotopic Metrology of Carbon Dioxide. II. Effects of Ion Source Materials, Conductance Emission, and Accelerating Voltage on Dual-Inlet Cross Contamination
Topic: Nanotechnology
Published: 6/1/2003
Authors: R Michael Verkouteren, S Assonov, D Klinedinst, W Brand
Abstract: We report high-precision isotope carbon dioxide measurements, made before and after ion source modification to gas isotope ratio mass spectrometry (IRMS) instruments. Measurement protocols were designed to explore the effects of ion surce material ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831257

297. Virtual Environment for Manipulating Microscopic Particles with Optical Tweezer
Topic: Nanotechnology
Published: 6/1/2003
Authors: Yong-Gu Lee, Kevin W Lyons, Thomas W LeBrun
Abstract: In this paper, we use virtual reality techniques to define an intuitive interface to a nanoscale manipulation device. This device utilizes optical methods to focus laser light to trap and reposition nano-to-microscopic particles. The underlying physi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822011

298. Implications of Emerging Micro and Nanotechnology
Topic: Nanotechnology
Published: 4/1/2003
Authors: S Brueck, S Picraux, J Belk, Robert Celotta, W Holton, S Janson, W Kuo, D Nagel, P Penz, A Pisano, R Smith, P Stang, G Sutton, W Tolles, R Trew, M. Young
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620546

299. Nist-Led International Collaboration Results in Improved Measurement Technology for Light Stable Isotopes Relevant to Climate Change Research
Series: Journal of Research (NIST JRES)
Topic: Nanotechnology
Published: 3/1/2003
Author: R Michael Verkouteren
Abstract: Two manuscripts recently have been accepted in RapidCommunications in Mass Spectrometry that detail aninternational collaboration to identify, understand at afundamental level, and correct measurement biasesmanifested in gas isotope ratio mass spectr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831300

300. Diffusion Barrier Cladding in Si/SiGe Resonant Interband Tunneling Diodes and Their Patterned Growth on PMOS Source/Drain Regions
Topic: Nanotechnology
Published: 1/1/2003
Authors: N Jin, A T Rice, P R Berger, P E Thompson, C Rivas, R Lake, S Sudirgo, J J Kempisty, B Curanovic, S L Rommel, K D Hirschman, S K Kurinec, P Chi, David S Simons, S.J. Chung
Abstract: Si/SiGe resonant interband tunnel diodes (RITD) employing delta-doping spikes that demonstrate negative differential resistance (NDR) at room temperature are presented. Efforts have focused on improving the tunnel diode peak-to-valley current ratio ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831272



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