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Topic Area: Nanotechnology

Displaying records 301 to 310 of 382 records.
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301. Wide-Field X-Ray Microscopy with Kirkpatrick-Baez Optics
Topic: Nanotechnology
Published: 12/1/2001
Authors: Terrence J Jach, S M Durbin, A S Bakulin, David S. Bright, C B Stagarescu, G Srajer, D. Haskel, J Pedulla
Abstract: Modern technology permits us to fabricate Kirkpatrick-Baez (KB) multilayer optics with performance close to the theoretical limit. We have constructed a KB field-imaging microscope which operates in the x-ray energy range 6-10 keV with a field of vi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831231

302. Experimental Data and Model Simulations of Beam Spread in the Environmental Scanning Electron Microscope
Topic: Nanotechnology
Published: 10/1/2001
Author: Scott A Wight
Abstract: This work describes the comparison of experimental measurements of electron beam spread in the environmental scanning electron microscope with model predictions. Beam spreading is the result of primary electrons being scattered out of the focused be ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831206

303. Distribution and Retention of ^u137^Cs in Sediments at the Hanford Site, Washington
Topic: Nanotechnology
Published: 9/1/2001
Authors: J P McKinley, Cynthia J Zeissler, J M Zachara, R J Serne, Richard Mark Lindstrom, H T Schaef, R D Orr
Abstract: sium-137 and other contaminants have leaked from many of the single-shell storage tanks at the Hanford Site in southeastern Washington. The leakage was into sandy unconsolidated sediments consisting largely of quartz, plagioclase, micas, smectite, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831225

304. SRM 482 Revisited After 30 Years
Topic: Nanotechnology
Published: 8/1/2001
Authors: Eric S Windsor, R Carlton, Scott A Wight, C Lyman
Abstract: The National Institute of Standards and Technology's (NIST) Standard Reference Material (SRM) 482 was issued by The National Bureau of Standards (NBS) in 1969 and has been continuously available to the public for over 30 years [1]. The standard ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831217

305. Isotopic Ratio Measurements by Time-of-Flight Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 7/1/2001
Authors: Albert J. Fahey, S R. Messenger
Abstract: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is often considered synonymous with SIMS in the static limit where the ion fluence on the sample surface is so low that damage is negligible. For this same reason its use in measuring isotopi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831143

306. Simultaneous Multianalyte Detection with a Nanometer-Scale Pore
Topic: Nanotechnology
Published: 5/15/2001
Authors: John J Kasianowicz, S. E. Henrickson, H H. Weetall, B Robertson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903581

307. Radioactive Particle Analysis by Digital Autoradiography
Topic: Nanotechnology
Published: 5/1/2001
Authors: Cynthia J Zeissler, Richard Mark Lindstrom, J P McKinley
Abstract: We have been exploring ways to evaluate the activity of radioactive particles that have been detected by phosphor plate digital autoradiography based on photostimulated luminescence (PSL). A PSL system with 25{mu} pixel digitization has been applied ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831184

308. Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles
Topic: Nanotechnology
Published: 5/1/2001
Authors: E Fuoco, John G Gillen, M Wijesundara, William E Wallace III, L Hanley
Abstract: In this paper examine the mechanism of secondary ion yield enhancements previously observed for polyatomic projectiles by measuring the weight loss, volume loss, and surface composition of poly(methylmethacrylate) (PMMA) films sputtered by keV SF^d5^ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831207

309. Negative Cesium Sputter Ion Source for Generating Cluster Primary Ion Beams for Secondary Ion Mass Spectrometry Analysis
Topic: Nanotechnology
Published: 4/1/2001
Authors: John G Gillen, R Lance King, B Freibaum, R Lareau, J Bennett, F Chmara
Abstract: The use of a cluster (or polyatomic) primary ion projectile for organic SIMS has been demonstrated to increase the yield of characteristic molecular secondary ions, more efficiently desorb higher molecular weight species and reduce the accumulation o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831137

310. Block Copolymer Thin Films: Physics and Applications
Topic: Nanotechnology
Published: 2/15/2001
Authors: Michael J Fasolka, A M Mayes
Abstract: A two-part review of research concerning block copolymer thin films is presented. The first section summarizes experimental and theoretical studies of the fundamental physics of these systems, concentrating upon the forces that govern film morpholog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841503



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