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Topic Area: Nanotechnology

Displaying records 301 to 310 of 390 records.
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301. Nist-Led International Collaboration Results in Improved Measurement Technology for Light Stable Isotopes Relevant to Climate Change Research
Series: Journal of Research (NIST JRES)
Topic: Nanotechnology
Published: 3/1/2003
Author: R Michael Verkouteren
Abstract: Two manuscripts recently have been accepted in RapidCommunications in Mass Spectrometry that detail aninternational collaboration to identify, understand at afundamental level, and correct measurement biasesmanifested in gas isotope ratio mass spectr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831300

302. Diffusion Barrier Cladding in Si/SiGe Resonant Interband Tunneling Diodes and Their Patterned Growth on PMOS Source/Drain Regions
Topic: Nanotechnology
Published: 1/1/2003
Authors: N Jin, A T Rice, P R Berger, P E Thompson, C Rivas, R Lake, S Sudirgo, J J Kempisty, B Curanovic, S L Rommel, K D Hirschman, S K Kurinec, P Chi, David S Simons, S.J. Chung
Abstract: Si/SiGe resonant interband tunnel diodes (RITD) employing delta-doping spikes that demonstrate negative differential resistance (NDR) at room temperature are presented. Efforts have focused on improving the tunnel diode peak-to-valley current ratio ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831272

303. Secondary Ion Mass Spectrometry Using Cluster Primary Ion Beams
Topic: Nanotechnology
Published: 1/1/2003
Authors: John G Gillen, Albert J. Fahey
Abstract: At the National Institute of Standards and Technology (NIST) we have a capability for conducting cluster SIMS experiments on both our ion microscope and TOF-SIMS instruments. This paper will review our recent work on cluster ion source development, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831247

304. Copper Oxide Precipitates in NBS Standard Reference Material 482
Series: Journal of Research (NIST JRES)
Topic: Nanotechnology
Published: 12/1/2002
Authors: Eric S Windsor, R Carlton, John G Gillen, Scott A Wight, David S. Bright
Abstract: Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831277

305. Fine Particulate Matter Source Attribution for Southeast Texas Using ^u14^C/^u13^C Ratios
Topic: Nanotechnology
Published: 11/1/2002
Authors: K R Lemire, D T Allen, George A Klouda, C. W. Lewis
Abstract: Radiocarbon analyses of fine particulate matter samples collected during the summer of 2000 in southeast Texas indicate that a substantial fraction of the aerosol carbon at an urban/suburban site (27-73%) and at a rural, forested site (45-78%) was mo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831240

306. Analysis of Kaolinite/Chrysotile Mixtures by Ashing and X-Ray Diffraction
Topic: Nanotechnology
Published: 9/1/2002
Authors: Jennifer R Verkouteren, Eric S Windsor, Joseph M Conny, R L Perkins, J T Ennis
Abstract: A simple ashing procedure is described that converts kaolinite to amorphous metakaolinite while retaining the diffraction intensity of chrysotile. This ashing procedure removes the XRD pattern overlap between kaolinite and chrysotile that can interf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831245

307. Biogenic Contributions to Atmospheric Volatile Organic Compounds in Azusa, California
Topic: Nanotechnology
Published: 4/1/2002
Authors: George A Klouda, C. W. Lewis, D C Stiles, J L Marolf, W D Ellenson, W A Lonneman
Abstract: An objective of the 1997 Southern California Ozone Study (SCOS97) was to provide an up-to-date assessment of the importance of biogenic emissions for tropospheric ozone production in the South Coast Air Basin. To this end ambient air samples were co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831473

308. Survey of FY 2001 Nanotechnology-Related Research at the National Institute of Standards and Technology.
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6864
Topic: Nanotechnology
Published: 1/1/2002
Authors: Chad R Snyder, J P. Looney, M P Casassa
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853823

309. Wide-Field X-Ray Microscopy with Kirkpatrick-Baez Optics
Topic: Nanotechnology
Published: 12/1/2001
Authors: Terrence J Jach, S M Durbin, A S Bakulin, David S. Bright, C B Stagarescu, G Srajer, D. Haskel, J Pedulla
Abstract: Modern technology permits us to fabricate Kirkpatrick-Baez (KB) multilayer optics with performance close to the theoretical limit. We have constructed a KB field-imaging microscope which operates in the x-ray energy range 6-10 keV with a field of vi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831231

310. Experimental Data and Model Simulations of Beam Spread in the Environmental Scanning Electron Microscope
Topic: Nanotechnology
Published: 10/1/2001
Author: Scott A Wight
Abstract: This work describes the comparison of experimental measurements of electron beam spread in the environmental scanning electron microscope with model predictions. Beam spreading is the result of primary electrons being scattered out of the focused be ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831206



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