NIST logo

Publications Portal

You searched on:
Topic Area: Nanotechnology

Displaying records 311 to 320 of 395 records.
Resort by: Date / Title


311. Analysis of Kaolinite/Chrysotile Mixtures by Ashing and X-Ray Diffraction
Topic: Nanotechnology
Published: 9/1/2002
Authors: Jennifer R Verkouteren, Eric S Windsor, Joseph M Conny, R L Perkins, J T Ennis
Abstract: A simple ashing procedure is described that converts kaolinite to amorphous metakaolinite while retaining the diffraction intensity of chrysotile. This ashing procedure removes the XRD pattern overlap between kaolinite and chrysotile that can interf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831245

312. Biogenic Contributions to Atmospheric Volatile Organic Compounds in Azusa, California
Topic: Nanotechnology
Published: 4/1/2002
Authors: George A Klouda, C. W. Lewis, D C Stiles, J L Marolf, W D Ellenson, W A Lonneman
Abstract: An objective of the 1997 Southern California Ozone Study (SCOS97) was to provide an up-to-date assessment of the importance of biogenic emissions for tropospheric ozone production in the South Coast Air Basin. To this end ambient air samples were co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831473

313. Survey of FY 2001 Nanotechnology-Related Research at the National Institute of Standards and Technology.
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6864
Topic: Nanotechnology
Published: 1/1/2002
Authors: Chad R Snyder, J P. Looney, M P Casassa
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853823

314. Wide-Field X-Ray Microscopy with Kirkpatrick-Baez Optics
Topic: Nanotechnology
Published: 12/1/2001
Authors: Terrence J Jach, S M Durbin, A S Bakulin, David S. Bright, C B Stagarescu, G Srajer, D. Haskel, J Pedulla
Abstract: Modern technology permits us to fabricate Kirkpatrick-Baez (KB) multilayer optics with performance close to the theoretical limit. We have constructed a KB field-imaging microscope which operates in the x-ray energy range 6-10 keV with a field of vi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831231

315. Experimental Data and Model Simulations of Beam Spread in the Environmental Scanning Electron Microscope
Topic: Nanotechnology
Published: 10/1/2001
Author: Scott A Wight
Abstract: This work describes the comparison of experimental measurements of electron beam spread in the environmental scanning electron microscope with model predictions. Beam spreading is the result of primary electrons being scattered out of the focused be ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831206

316. Distribution and Retention of ^u137^Cs in Sediments at the Hanford Site, Washington
Topic: Nanotechnology
Published: 9/1/2001
Authors: J P McKinley, Cynthia J Zeissler, J M Zachara, R J Serne, Richard M. Lindstrom, H T Schaef, R D Orr
Abstract: sium-137 and other contaminants have leaked from many of the single-shell storage tanks at the Hanford Site in southeastern Washington. The leakage was into sandy unconsolidated sediments consisting largely of quartz, plagioclase, micas, smectite, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831225

317. SRM 482 Revisited After 30 Years
Topic: Nanotechnology
Published: 8/1/2001
Authors: Eric S Windsor, R Carlton, Scott A Wight, C Lyman
Abstract: The National Institute of Standards and Technology's (NIST) Standard Reference Material (SRM) 482 was issued by The National Bureau of Standards (NBS) in 1969 and has been continuously available to the public for over 30 years [1]. The standard ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831217

318. Isotopic Ratio Measurements by Time-of-Flight Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 7/1/2001
Authors: Albert J. Fahey, S R. Messenger
Abstract: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is often considered synonymous with SIMS in the static limit where the ion fluence on the sample surface is so low that damage is negligible. For this same reason its use in measuring isotopi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831143

319. Simultaneous Multianalyte Detection with a Nanometer-Scale Pore
Topic: Nanotechnology
Published: 5/15/2001
Authors: John J Kasianowicz, S. E. Henrickson, H H. Weetall, B Robertson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903581

320. Radioactive Particle Analysis by Digital Autoradiography
Topic: Nanotechnology
Published: 5/1/2001
Authors: Cynthia J Zeissler, Richard M. Lindstrom, J P McKinley
Abstract: We have been exploring ways to evaluate the activity of radioactive particles that have been detected by phosphor plate digital autoradiography based on photostimulated luminescence (PSL). A PSL system with 25{mu} pixel digitization has been applied ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831184



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series