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Topic Area: Nanotechnology

Displaying records 331 to 340 of 395 records.
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331. Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy
Topic: Nanotechnology
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specifici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831196

332. Scanning Near-Field Infared Microscopy and Spectroscopy with a Broadband Laser Source
Topic: Nanotechnology
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: Near-field scanning optical microscopy (NSOM) is a powerful tool for the characterization of the optical properties of nanoscale objects, although pervasive artifacts often create difficulties in image interpretation. A three dimensional scanning NS ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831210

333. The Tremolite-Actinolite-Ferro-Actinolite Series: Systematic Relationships Among Cell Parameters Composition, Optical Properties, and Habit and Evidence of Discontinuities
Topic: Nanotechnology
Published: 9/1/2000
Authors: Jennifer R Verkouteren, A G Wylie
Abstract: The cell parameters, optical properties and chemical composition of 103 samples in the tremolite-actinolite-ferro-actinolite series have been measured. The combination of properties and the large number of samples provided a powerful means of determi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831109

334. PC/MAC Image Processing Freeware for Examining Spectral Images
Topic: Nanotechnology
Published: 8/1/2000
Author: David S. Bright
Abstract: Lispix is a public domain image processing system for Windows and the Macintosh, is applied to exploration of a spectral image of data cube.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831171

335. Phosphor Imaging Plate Measurement of Electron Scattering in the Environmental Scanning Electron Microscope
Topic: Nanotechnology
Published: 8/1/2000
Authors: Scott A Wight, Cynthia J Zeissler
Abstract: Phosphor Imaging Plate Technology is applied to electron beam scattering in the Environmental Scanning Electron Microscope. The plate is exposed to primary and scattered electrons which stimulate the phosphor grains to an excited state. The intensi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831179

336. Characterization of the Electron Beam Specimen Interaction in the ESEM with SIM Imaging
Topic: Nanotechnology
Published: 7/1/2000
Authors: Scott A Wight, John G Gillen, G B. Saupe
Abstract: A Secondary Ion Mass Spectrometry (SIMS) study has been undertaken to examine surfaces and films modified in the environmental scanning electron microscope (ESEM). Examination of the modifications induced by ESEM electrons and ions lead to a better ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830163

337. New Low-Index Liquid Refractive Index Standard: SRM 1922
Topic: Nanotechnology
Published: 6/1/2000
Authors: Jennifer R Verkouteren, Stefan D Leigh
Abstract: A new standard for the calibration of refractometers has been developed. Standard Reference Material (SRM) 1922 is a mineral oil with a refractive index n^dD^=1.46945 at 20 C, which is within the range of the Brix scale (% sucrose). The change in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831124

338. Channeling-Induced Asymmetric Distortion of Depth Profiles from Polycrystalline-TiN/Ti/TiN(001) Trilayers During Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 5/1/2000
Authors: G Ramanath, J E Greene, I Petrov, J E Baker, L H Allen, John G Gillen
Abstract: Asymmetric depth profiles of elemental and molecular secondary ions are observed during secondary ion mass spectrometry (SIMS) analyses of polycrystalline-TiN/Ti/TiN(001) trilayers using a Cs+ ion beam. The sputter-etching rate R and the secondary i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831134

339. Direct Measurement of Electron Beam Scattering in the Environmental Scanning Electron Microscope Using Phosphor Imaging Plates
Topic: Nanotechnology
Published: 5/1/2000
Authors: Scott A Wight, Cynthia J Zeissler
Abstract: Phosphor imaging plate technology has made it possible to directly image the distribution of primary beam electrons and scattered electrons in the environmental scanning electron microscope. The phosphor plate is exposed under electron scattering co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831140

340. Chemical and Structural Characterization of Ultrathin Dielectric Films Using AEM
Topic: Nanotechnology
Published: 1/1/2000
Authors: J H J Scott, Eric S Windsor
Abstract: The structure of ultrathin silicon oxynitride films, used as gate dielectrics in integrated circuits (ICs), is studied using analytical electron microscopy (AEM). Laterally homogeneous blanket films approximately 2nm in thickness are characterized i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831163



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