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Topic Area: Nanotechnology

Displaying records 331 to 340 of 387 records.
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331. Direct Measurement of Electron Beam Scattering in the Environmental Scanning Electron Microscope Using Phosphor Imaging Plates
Topic: Nanotechnology
Published: 5/1/2000
Authors: Scott A Wight, Cynthia J Zeissler
Abstract: Phosphor imaging plate technology has made it possible to directly image the distribution of primary beam electrons and scattered electrons in the environmental scanning electron microscope. The phosphor plate is exposed under electron scattering co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831140

332. Chemical and Structural Characterization of Ultrathin Dielectric Films Using AEM
Topic: Nanotechnology
Published: 1/1/2000
Authors: J H J Scott, Eric S Windsor
Abstract: The structure of ultrathin silicon oxynitride films, used as gate dielectrics in integrated circuits (ICs), is studied using analytical electron microscopy (AEM). Laterally homogeneous blanket films approximately 2nm in thickness are characterized i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831163

333. Gate Dielectric Thickness Metrology Using Transmission Electron Microscopy
Topic: Nanotechnology
Published: 1/1/2000
Authors: J H J Scott, Eric S Windsor, D Brady, J Canterbury, A. Karamcheti, W Chism, A C Diebold
Abstract: Silicon Oxynitride blanket films approximately 2 n min thickness are characterized in cross section using a 300 keV TEM/STEM. High resolution imaging is used to investigate the accuracy and precision of TEM film thickness measurements and their comp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831208

334. The Stable Carbon Isotope Composition of Atmospheric PAHs
Topic: Nanotechnology
Published: 12/1/1999
Authors: A L Norman, J F Hopper, P Blanchard, D Dernst, K Brice, N Alexandrou, George A Klouda
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100658

335. SRM 2806 (ISO Medium Test Dust in Hydraulic Oil): A Particle-Contamination Standard Reference Material for the Fluid Power Industry
Topic: Nanotechnology
Published: 8/1/1999
Authors: Robert A Fletcher, Jennifer R Verkouteren, Eric S Windsor, David S. Bright, Eric B Steel, John A Small, Walter S Liggett Jr
Abstract: Standard Reference material (SRM) 2806 is composed of ISO medium test dust (ISO 12103-A3), a mineral dust, suspended in MIL-H-5606 hydraulic oil. SRM 2806 is a traceable particle count standard and is certified for number of particles larger than ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831080

336. Si Resonant Interband Tunnel Diodes Grown by Low-Temperature Molecular Beam Epitaxy
Topic: Nanotechnology
Published: 8/1/1999
Authors: P E Thompson, K D Hobart, M E Twigg, G Jernigan, T E Dillon, S L Rommel, P R Berger, David S Simons, P Chi, R Lake, A C Seabaugh
Abstract: Si resonant interband tunnel diodes that demonstrate negative differential resistance at room temperature are presented. The structures were grown using low temperature (320 C) molecular beam epitaxy followed by a post-growth anneal. After a 650 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831118

337. What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?
Topic: Nanotechnology
Published: 8/1/1999
Author: Scott A Wight
Abstract: Electron scattering in the environmental scanning electron microscope may contribute x-ray contamination to quantitative analysis. A series of experiments explores at what range and conditions the analyst in the real world needs to be concerned about ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831119

338. Development of a Triplasmatron Ion Source for the Generation of SF^d5^+ and F- Primary Ion Beams on an Ion Microscope Secondary Ion Mass Spectrometry Instrument
Topic: Nanotechnology
Published: 5/1/1999
Authors: John G Gillen, R Lance King, F Chmara
Abstract: A hot filament duoplasmatron ion source operating with argon has been modified by addition of an enclosed expansion cup mounted to the extraction side of the duoplasmatron anode. Using sulfur hexafluoride (SF^d6^) as a feed gas, this triplasmatron i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831074

339. Elemental and Molecular Imaging of Human Hair Using Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 4/1/1999
Authors: John G Gillen, S V. Roberson, C M. Ng, M Stranick
Abstract: Secondary ion mass spectrometry (SIMS) is used to image the spatial distribution of elemental and molecular species on the surface and in cross-sections of doped human hair using a magnetic sector SIMS instrument operated as an ion microprobe. Analy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831098

340. Fractal Dimension of Particle Outlines: Meaning, Utility, Limitations, Standard Images and Examples
Topic: Nanotechnology
Published: 4/1/1999
Author: David S. Bright
Abstract: Only a handful of shape parameters, such as aspect ratio and circularity, are in common use for characterizing individual microscopic particles. The fractal dimension, D, is seeing increased use as an additional shape parameter because particle shape ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831092



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