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Topic Area: Nanotechnology

Displaying records 341 to 350 of 395 records.
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341. Gate Dielectric Thickness Metrology Using Transmission Electron Microscopy
Topic: Nanotechnology
Published: 1/1/2000
Authors: J H J Scott, Eric S Windsor, D Brady, J Canterbury, A. Karamcheti, W Chism, A C Diebold
Abstract: Silicon Oxynitride blanket films approximately 2 n min thickness are characterized in cross section using a 300 keV TEM/STEM. High resolution imaging is used to investigate the accuracy and precision of TEM film thickness measurements and their comp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831208

342. The Stable Carbon Isotope Composition of Atmospheric PAHs
Topic: Nanotechnology
Published: 12/1/1999
Authors: A L Norman, J F Hopper, P Blanchard, D Dernst, K Brice, N Alexandrou, George A Klouda
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100658

343. SRM 2806 (ISO Medium Test Dust in Hydraulic Oil): A Particle-Contamination Standard Reference Material for the Fluid Power Industry
Topic: Nanotechnology
Published: 8/1/1999
Authors: Robert A Fletcher, Jennifer R Verkouteren, Eric S Windsor, David S. Bright, Eric B Steel, John A Small, Walter S Liggett Jr
Abstract: Standard Reference material (SRM) 2806 is composed of ISO medium test dust (ISO 12103-A3), a mineral dust, suspended in MIL-H-5606 hydraulic oil. SRM 2806 is a traceable particle count standard and is certified for number of particles larger than ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831080

344. Si Resonant Interband Tunnel Diodes Grown by Low-Temperature Molecular Beam Epitaxy
Topic: Nanotechnology
Published: 8/1/1999
Authors: P E Thompson, K D Hobart, M E Twigg, G Jernigan, T E Dillon, S L Rommel, P R Berger, David S Simons, P Chi, R Lake, A C Seabaugh
Abstract: Si resonant interband tunnel diodes that demonstrate negative differential resistance at room temperature are presented. The structures were grown using low temperature (320 C) molecular beam epitaxy followed by a post-growth anneal. After a 650 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831118

345. What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?
Topic: Nanotechnology
Published: 8/1/1999
Author: Scott A Wight
Abstract: Electron scattering in the environmental scanning electron microscope may contribute x-ray contamination to quantitative analysis. A series of experiments explores at what range and conditions the analyst in the real world needs to be concerned about ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831119

346. Development of a Triplasmatron Ion Source for the Generation of SF^d5^+ and F- Primary Ion Beams on an Ion Microscope Secondary Ion Mass Spectrometry Instrument
Topic: Nanotechnology
Published: 5/1/1999
Authors: John G Gillen, R Lance King, F Chmara
Abstract: A hot filament duoplasmatron ion source operating with argon has been modified by addition of an enclosed expansion cup mounted to the extraction side of the duoplasmatron anode. Using sulfur hexafluoride (SF^d6^) as a feed gas, this triplasmatron i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831074

347. Elemental and Molecular Imaging of Human Hair Using Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 4/1/1999
Authors: John G Gillen, S V. Roberson, C M. Ng, M Stranick
Abstract: Secondary ion mass spectrometry (SIMS) is used to image the spatial distribution of elemental and molecular species on the surface and in cross-sections of doped human hair using a magnetic sector SIMS instrument operated as an ion microprobe. Analy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831098

348. Fractal Dimension of Particle Outlines: Meaning, Utility, Limitations, Standard Images and Examples
Topic: Nanotechnology
Published: 4/1/1999
Author: David S. Bright
Abstract: Only a handful of shape parameters, such as aspect ratio and circularity, are in common use for characterizing individual microscopic particles. The fractal dimension, D, is seeing increased use as an additional shape parameter because particle shape ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831092

349. Preliminary Evaluation of an SF5+ Polyatomic Primary Ion Beam for Analysis of Organic Thin Films by Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 12/1/1998
Authors: John G Gillen, S V. Roberson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100651

350. The Formation of Abrupt n+ Doping Profiles Using Atomic Hydrogen and Sb During Si MBE
Topic: Nanotechnology
Published: 12/1/1998
Authors: P E Thompson, C Silvestre, M E Twigg, G Jernigan, David S Simons
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100665



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