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You searched on: Topic Area: Nanotechnology

Displaying records 341 to 350 of 402 records.
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341. PC/MAC Image Processing Freeware for Examining Spectral Images
Topic: Nanotechnology
Published: 8/1/2000
Author: David S. Bright
Abstract: Lispix is a public domain image processing system for Windows and the Macintosh, is applied to exploration of a spectral image of data cube.

342. Phosphor Imaging Plate Measurement of Electron Scattering in the Environmental Scanning Electron Microscope
Topic: Nanotechnology
Published: 8/1/2000
Authors: Scott A Wight, Cynthia J Zeissler
Abstract: Phosphor Imaging Plate Technology is applied to electron beam scattering in the Environmental Scanning Electron Microscope. The plate is exposed to primary and scattered electrons which stimulate the phosphor grains to an excited state. The intensi ...

343. Characterization of the Electron Beam Specimen Interaction in the ESEM with SIM Imaging
Topic: Nanotechnology
Published: 7/1/2000
Authors: Scott A Wight, John G Gillen, G B. Saupe
Abstract: A Secondary Ion Mass Spectrometry (SIMS) study has been undertaken to examine surfaces and films modified in the environmental scanning electron microscope (ESEM). Examination of the modifications induced by ESEM electrons and ions lead to a better ...

344. New Low-Index Liquid Refractive Index Standard: SRM 1922
Topic: Nanotechnology
Published: 6/1/2000
Authors: Jennifer R Verkouteren, Stefan D Leigh
Abstract: A new standard for the calibration of refractometers has been developed. Standard Reference Material (SRM) 1922 is a mineral oil with a refractive index n^dD^=1.46945 at 20 C, which is within the range of the Brix scale (% sucrose). The change in ...

345. Channeling-Induced Asymmetric Distortion of Depth Profiles from Polycrystalline-TiN/Ti/TiN(001) Trilayers During Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 5/1/2000
Authors: G Ramanath, J E Greene, I Petrov, J E Baker, L H Allen, John G Gillen
Abstract: Asymmetric depth profiles of elemental and molecular secondary ions are observed during secondary ion mass spectrometry (SIMS) analyses of polycrystalline-TiN/Ti/TiN(001) trilayers using a Cs+ ion beam. The sputter-etching rate R and the secondary i ...

346. Direct Measurement of Electron Beam Scattering in the Environmental Scanning Electron Microscope Using Phosphor Imaging Plates
Topic: Nanotechnology
Published: 5/1/2000
Authors: Scott A Wight, Cynthia J Zeissler
Abstract: Phosphor imaging plate technology has made it possible to directly image the distribution of primary beam electrons and scattered electrons in the environmental scanning electron microscope. The phosphor plate is exposed under electron scattering co ...

347. Chemical and Structural Characterization of Ultrathin Dielectric Films Using AEM
Topic: Nanotechnology
Published: 1/1/2000
Authors: J H J Scott, Eric S Windsor
Abstract: The structure of ultrathin silicon oxynitride films, used as gate dielectrics in integrated circuits (ICs), is studied using analytical electron microscopy (AEM). Laterally homogeneous blanket films approximately 2nm in thickness are characterized i ...

348. Gate Dielectric Thickness Metrology Using Transmission Electron Microscopy
Topic: Nanotechnology
Published: 1/1/2000
Authors: J H J Scott, Eric S Windsor, D Brady, J Canterbury, A. Karamcheti, W Chism, A C Diebold
Abstract: Silicon Oxynitride blanket films approximately 2 n min thickness are characterized in cross section using a 300 keV TEM/STEM. High resolution imaging is used to investigate the accuracy and precision of TEM film thickness measurements and their comp ...

349. The Stable Carbon Isotope Composition of Atmospheric PAHs
Topic: Nanotechnology
Published: 12/1/1999
Authors: A L Norman, J F Hopper, P Blanchard, D Dernst, K Brice, N Alexandrou, George A Klouda

350. SRM 2806 (ISO Medium Test Dust in Hydraulic Oil): A Particle-Contamination Standard Reference Material for the Fluid Power Industry
Topic: Nanotechnology
Published: 8/1/1999
Authors: Robert A Fletcher, Jennifer R Verkouteren, Eric S Windsor, David S. Bright, Eric B Steel, John A Small, Walter S Liggett Jr
Abstract: Standard Reference material (SRM) 2806 is composed of ISO medium test dust (ISO 12103-A3), a mineral dust, suspended in MIL-H-5606 hydraulic oil. SRM 2806 is a traceable particle count standard and is certified for number of particles larger than ...

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