NIST logo

Publications Portal

You searched on:
Topic Area: Physics

Displaying records 661 to 670 of 735 records.
Resort by: Date / Title

661. Thermochemistry
Topic: Physics
Published: 12/1/1997
Author: P A O'Hare

662. Sum-Frequency Generation of Continuous-Wave Light at 194 nm
Topic: Physics
Published: 6/20/1997
Authors: D J Berkeland, F C Cruz, James C Bergquist

663. Atomic Physics in Ion Traps
Topic: Physics
Published: 3/1/1997
Authors: C Monroe, John J Bollinger

664. Grotian Diagrams for Highly Ionized Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Kr and Mo
Topic: Physics
Published: 1/1/1997
Authors: T Shirai, J Sugar, Wolfgang Lothar Wiese

665. Local Characterization of Transmission Properties of a Two-Dimensional Photonic Crystal
Topic: Physics
Published: 1/1/1997
Authors: E B Mcdaniel, Julia W Hsu, Lori S. Goldner, R J Tonucci, Eric L Shirley, Garnett W Bryant

666. Mass Spectrometric Analysis of Polymers Derived from N-aryl-Amino Acid Initiators
Topic: Physics
Published: 1/1/1997
Authors: Mahnaz Farahani, J M Antonucci, Lisa R Karam

667. NIST Develops IR Standards: Detector Transfer Standards to be Ready Soon
Topic: Physics
Published: 1/1/1997
Author: Steven Ray Lorentz

668. Optimal Frequency Measurements with Maximally Correlated States
Topic: Physics
Published: 12/1/1996
Authors: John J Bollinger, Wayne M Itano, David J Wineland, D J Heinzen

669. High-Accuracy Hg^u+^ Microwave and Optical Frequency Standards in Cryogenic Linear Ion Traps
Topic: Physics
Published: 11/7/1996
Authors: D J Berkeland, J D Miller, F C Cruz, James C Bergquist, Wayne M Itano, David J Wineland

670. A Cryogenic Linear Ion Trap for ^u199^Hg^u+^ Frequency Standards
Topic: Physics
Published: 6/5/1996
Authors: J D Miller, M E Poitzsch, F C Cruz, D J Berkeland, James C Bergquist, Wayne M Itano, David J Wineland

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series