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Displaying records 11 to 20 of 325 records.
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11. Effect of Heterogeneity in Nano-TiO2 Filled Acrylic Urethane Coatings on Surface Degradation under Accelerated UV Exposure
Topic: Electronics & Telecommunications
Published: 10/30/2014
Authors: Yongyan Pang, Stephanie S Watson, Li Piin Sung
Abstract: The objective of this study was to investigate how the heterogeneity due to nanoparticle dispersion of polymeric coatings affects surface morphological changes during ultraviolet (UV) exposure under different weathering conditions. Three types of nan ...

12. NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 3.0
Series: Special Publication (NIST SP)
Report Number: 1108r3
Topic: Electronics & Telecommunications
Published: 10/1/2014
Authors: Christopher Greer, David A Wollman, Dean Eldon Prochaska, Paul A Boynton, Jeffrey A. Mazer, Cuong T Nguyen, Gerald J FitzPatrick, Thomas L Nelson, Galen H Koepke, Allen R Hefner Jr., Victoria Y Pillitteri, Tanya L Brewer, Nada T Golmie, David H Su, Allan C Eustis, David G Holmberg, Steven T Bushby
Abstract: Section 1305 of the Energy Independence and Security Act (EISA) of 2007 (Pub. L. 110‹140) directs NIST ,,to coordinate the development of a framework that includes protocols and model standards for information management to achieve interoperabili ...

13. Towards a Standard Mixed-Signal Parallel Processing Architecture for Miniature and Microrobotics
Series: Journal of Research (NIST JRES)
Report Number: 119.020
Topic: Electronics & Telecommunications
Published: 9/18/2014
Authors: Brian M. Sadler, Sebastian Hoyos
Abstract: The conventional analog-to-digital conversion (ADC) and digital signal processing (DSP) architecture has led to major advances in miniature and micro-systems technology over the past several decades. The outlook for these devices is significant ...

14. A 100 Tohm Guarded Hamon Transfer Standard
Topic: Electronics & Telecommunications
Published: 8/24/2014
Authors: Dean G Jarrett, Edward O'Brien, Marlin E Kraft
Abstract: Guarded Hamon transfer standards are used at NIST for scaling to high resistance levels. An improved design for a guarded Hamon transfer standard in the range from 1 TΩ to 100 TΩ is described. Measurements taken to select the primary and g ...

15. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Electronics & Telecommunications
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian John Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...

16. Nanoparticle Released from Consumer Products: Flooring Nanocoatings and Interior Nanopaints
Series: Technical Note (NIST TN)
Report Number: 1835
Topic: Electronics & Telecommunications
Published: 7/21/2014
Authors: Li Piin Sung, Tinh Nguyen, Andrew Keith Persily
Abstract: Nanoparticles are increasingly incorporated in flooring coatings and interior paints to improve their abrasion and microbial resistance. One particular concern of this application is the release of nanoparticles from these surfaces due to repeated m ...

17. Pattern Transfer of Hydrogen Depassivation Lithography Patterns into Silicon with Atomically Traceable Placement and Size Control
Topic: Electronics & Telecommunications
Published: 7/17/2014
Authors: Josh Ballard, Stephen McDonnell, Don Dick, Maia Bischof, Joseph Fu, D Jaeger, James Owen , w Owen, Justin Alexander, Udi Fuchs, Pradeep N. (Pradeep) Namboodiri, Kai Li, John Randall, Robert Wallace, Yves Chabal, Richard Reidy, Richard M Silver
Abstract: Reducing the scale of etched nanostructures below the 10 nm range eventually will require an atomic scale understanding of the masks being used in order to maintain exquisite control over both feature size and feature density. Here, we demonstrate a ...

18. Effects of Temperature on Surface Accumulation and Release of Silica Nanoparticles in an Epoxy Nanocoating Exposed to UV Radiation
Topic: Electronics & Telecommunications
Published: 6/16/2014
Authors: Chun-Chieh Tien, Ching-Hsuan Chang, Bernard Hao-Chih Liu, Deborah L Stanley, Savelas A Rabb, Lee Lijian Yu, Tinh Nguyen, Li Piin Sung
Abstract: Polymer nanocoatings are increasingly used outdoors and in harsh environments. However, because most common polymers degraded by the weathering elements, nanoparticles in polymer nanocoatings may be released into the environments. Such nanoparticle r ...

19. 3D Characterization of carbon nanotube polymer composites using Scanning Electron Microscopy and Confocal Raman Microscopy
Topic: Electronics & Telecommunications
Published: 6/11/2014
Authors: Minhua Zhao, Rachel J. Cannara
Abstract: Scanning Electron Microscopy (SEM) and Confocal Raman Microscopy (CRM) were employed to characterize the 3D state of disperison of carbon nanotubes (CNT) in a polymer matrix. First, non-destructive subsurface imaging on CNT-polymer was conducted by c ...

20. 2D and 3D Topography Comparisons of Toolmarks Produced from Consecutively Manufactured Chisels and Punches.
Topic: Electronics & Telecommunications
Published: 5/20/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Robert Meryln Thompson, John Villanova, Taher Kakal
Abstract: A 2009 report by the National Academies [1] recommended strengthening the scientific basis of procedures and criteria employed by the forensic science specialty of toolmark identification. The current method of comparison and determination of ide ...

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