Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Electronics Telecommunications

Displaying records 21 to 30 of 353 records.
Resort by: Date / Title


21. Preparation of silver nanoparticle loaded cotton threads to facilitate measurement development for textile applications
Series: Special Publication (NIST SP)
Report Number: 1200-8
Topic: Electronics & Telecommunications
Published: 1/26/2015
Authors: Justin M Gorham, Karen E Murphy, Jingyu Liu, Dimitri Tselenchuk, Gheorghe Stan, Thao M. Nguyen, Richard D Holbrook, Michael R Winchester, Robert Francis Cook, Robert MacCuspie, Vincent A Hackley
Abstract: FOREWORD This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916567

22. Dietary Supplement Laboratory Quality Assurance Program: Exercise K Final Report
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 8032
Topic: Electronics & Telecommunications
Published: 1/6/2015
Authors: Melissa Meaney Phillips, Catherine A Rimmer, Laura J Wood
Abstract: The NIST Dietary Supplement Laboratory Quality Assurance Program (DSQAP) was established in collaboration with the National Institutes of Health (NIH) Office of Dietary Supplements (ODS) in 2007 to enable members of the dietary supplements commun ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917518

23. Effect of Heterogeneity in Nano-TiO2 Filled Acrylic Urethane Coatings on Surface Degradation under Accelerated UV Exposure
Topic: Electronics & Telecommunications
Published: 10/30/2014
Authors: Yongyan Pang, Stephanie S Watson, Li Piin Sung
Abstract: The objective of this study was to investigate how the heterogeneity due to nanoparticle dispersion of polymeric coatings affects surface morphological changes during ultraviolet (UV) exposure under different weathering conditions. Three types of nan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909005

24. NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 3.0
Series: Special Publication (NIST SP)
Report Number: 1108r3
Topic: Electronics & Telecommunications
Published: 10/1/2014
Authors: Christopher Greer, David A Wollman, Dean Eldon Prochaska, Paul A Boynton, Jeffrey A. Mazer, Cuong T Nguyen, Gerald J FitzPatrick, Thomas L Nelson, Galen H. Koepke, Allen R Hefner Jr., Victoria Y Pillitteri, Tanya L Brewer, Nada T Golmie, David H Su, Allan C Eustis, David G Holmberg, Steven T Bushby
Abstract: Section 1305 of the Energy Independence and Security Act (EISA) of 2007 (Pub. L. 110‹140) directs NIST ,,to coordinate the development of a framework that includes protocols and model standards for information management to achieve interoperabili ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916755

25. GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy
Topic: Electronics & Telecommunications
Published: 9/26/2014
Authors: Joel C Weber, Paul T Blanchard, Aric Warner Sanders, Jonas Gertsch, Steven George, Samuel Berweger, Atif A. Imtiaz, Thomas M Wallis, Kristine A Bertness, Pavel Kabos, Norman A Sanford, victor bright
Abstract: We report on the fabrication of a GaN nanowire probe for near-field scanning microwave microscopy. The probe has a capacitive resolution of ~0.03 fF, surpassing that of a commercial Pt tip. Imaging of MoS2 sheets found the probe to be immune to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916071

26. Towards a Standard Mixed-Signal Parallel Processing Architecture for Miniature and Microrobotics
Series: Journal of Research (NIST JRES)
Report Number: 119.020
Topic: Electronics & Telecommunications
Published: 9/18/2014
Authors: Brian M. Sadler, Sebastian Hoyos
Abstract: The conventional analog-to-digital conversion (ADC) and digital signal processing (DSP) architecture has led to major advances in miniature and micro-systems technology over the past several decades. The outlook for these devices is significant ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911266

27. A 100 Tohm Guarded Hamon Transfer Standard
Topic: Electronics & Telecommunications
Published: 8/24/2014
Authors: Dean G Jarrett, Edward O'Brien, Marlin E Kraft
Abstract: Guarded Hamon transfer standards are used at NIST for scaling to high resistance levels. An improved design for a guarded Hamon transfer standard in the range from 1 TΩ to 100 TΩ is described. Measurements taken to select the primary and g ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915486

28. Photonic-assisted Endoscopic Analysis of Guided W-band Pulses
Topic: Electronics & Telecommunications
Published: 8/24/2014
Authors: Jeffrey A Jargon, DongJoon Lee, JaeYong Kwon
Abstract: We present a photonic-assisted time-domain measurement technique for exploring millimeter-wave propagation through a W-band waveguide. The electric fields, guided inside a rectangular waveguide, are sampled using a sub-millimeter-scale electro-optic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915464

29. Broadband Rydberg Atom Based Self-Calibrating RF E-field Probe
Topic: Electronics & Telecommunications
Published: 8/16/2014
Authors: Christopher L Holloway, Joshua A Gordon, Steven R Jefferts, Thomas Patrick Heavner
Abstract: We present a significantly new approach for an electric (E) field probe. The probe is based on the interaction of RF-fields with Rydberg atoms, where alkali atoms are excited optically to Rydberg states and the applied RF-field alters the resonant st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915542

30. Characterizing a Device's susceptibility to broadband signals: A case study
Topic: Electronics & Telecommunications
Published: 8/4/2014
Authors: Jason B Coder, John M Ladbury, David Hunter
Abstract: It is common for electronic devices to be tested for their susceptibility to radiated signals they may be exposed to during their normal operation. A reverberation chamber is well suited to perform this type of testing because it can expose the d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915392



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series