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You searched on: Topic Area: Electronics Telecommunications Sorted by: date

Displaying records 1 to 10 of 753 records.
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1. Preparation of silver nanoparticle loaded cotton threads to facilitate measurement development for textile applications
Series: Special Publication (NIST SP)
Report Number: 1200-8
Topic: Electronics & Telecommunications
Published: 1/26/2015
Authors: Justin M Gorham, Karen E Murphy, Jingyu Liu, Dimitri Tselenchuk, Gheorghe Stan, Thao Minh Nguyen, Richard D Holbrook, Michael R Winchester, Robert Francis Cook, Robert MacCuspie, Vincent A Hackley
Abstract: FOREWORD This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916567

2. Dietary Supplement Laboratory Quality Assurance Program: Exercise K Final Report
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 8032
Topic: Electronics & Telecommunications
Published: 1/6/2015
Authors: Melissa Meaney Phillips, Catherine A Rimmer, Laura J Wood
Abstract: The NIST Dietary Supplement Laboratory Quality Assurance Program (DSQAP) was established in collaboration with the National Institutes of Health (NIH) Office of Dietary Supplements (ODS) in 2007 to enable members of the dietary supplements commun ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917518

3. New Ion Source for High Precision FIB Nanomachining and Circuit Edit
Topic: Electronics & Telecommunications
Published: 12/31/2014
Authors: Adam V. Steele, Brenton Knuffman, Jabez J McClelland
Abstract: We present a review of the Low Temperature Ion Source (LoTIS): its aims, design, performance data collected to date, and focused spot size projections when integrated with a FIB. LoTIS provides a Cs+ beam that has been measured to have high brightnes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917117

4. Effect of Heterogeneity in Nano-TiO2 Filled Acrylic Urethane Coatings on Surface Degradation under Accelerated UV Exposure
Topic: Electronics & Telecommunications
Published: 10/30/2014
Authors: Yongyan Pang, Stephanie S Watson, Li Piin Sung
Abstract: The objective of this study was to investigate how the heterogeneity due to nanoparticle dispersion of polymeric coatings affects surface morphological changes during ultraviolet (UV) exposure under different weathering conditions. Three types of nan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909005

5. Parameter Estimation and Uncertainty Evaluation in a Low Rician K-Factor Reverberation-Chamber Environment
Topic: Electronics & Telecommunications
Published: 10/15/2014
Authors: Chih-Ming Wang, Catherine A Remley, Ansgar T. Kirk, Ryan J. Pirkl, Christopher L Holloway, Dylan F Williams, Paul D Hale
Abstract: In this paper we study statistical methods for estimating the Rician K-factor when this parameter is small. A fiducial approach for making statistical inference on the K-factor is discussed. The approach requires a Monte Carlo method to compute the u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914638

6. NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 3.0
Series: Special Publication (NIST SP)
Report Number: 1108r3
Topic: Electronics & Telecommunications
Published: 10/1/2014
Authors: Christopher Greer, David A Wollman, Dean Eldon Prochaska, Paul A Boynton, Jeffrey A. Mazer, Cuong T Nguyen, Gerald J FitzPatrick, Thomas L Nelson, Galen H Koepke, Allen R Hefner Jr, Victoria Y Pillitteri, Tanya L Brewer, Nada T Golmie, David H Su, Allan C Eustis, David G Holmberg, Steven T Bushby
Abstract: Section 1305 of the Energy Independence and Security Act (EISA) of 2007 (Pub. L. 110‹140) directs NIST ,,to coordinate the development of a framework that includes protocols and model standards for information management to achieve interoperabili ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916755

7. Towards a Standard Mixed-Signal Parallel Processing Architecture for Miniature and Microrobotics
Series: Journal of Research (NIST JRES)
Report Number: 119.020
Topic: Electronics & Telecommunications
Published: 9/18/2014
Authors: Brian M. Sadler, Sebastian Hoyos
Abstract: The conventional analog-to-digital conversion (ADC) and digital signal processing (DSP) architecture has led to major advances in miniature and micro-systems technology over the past several decades. The outlook for these devices is significant ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911266

8. Reliability of Low Temperature Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
Topic: Electronics & Telecommunications
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Aric Warner Sanders, Alexandra E Curtin, R. Ishihara, David Thomas Read
Abstract: In this extended abstract we present our recent results on the reliability testing of multi-wall carbon nanotube vertical interconnects (vias).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915382

9. Polyelectrolyte Multilayers in Microfluidic Systems for Biological Applications
Topic: Electronics & Telecommunications
Published: 7/31/2014
Authors: Saugandhika Sarma Minnikanti, Aveek Gangopadhyay, Darwin R Reyes-Hernandez
Abstract: The formation of polyelectrolyte multilayers (PEMs) for the first time two decades ago demonstrating the assembly on charged substrates in a very simple and efficient way have proven to be a reliable method to obtain structures tunable at the nanomet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916103

10. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Electronics & Telecommunications
Published: 7/23/2014
Authors: Nathan Daniel Orloff, Jan Obrzut, Christian John Long, Thomas Fung Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011



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  • SP 250-XX: Calibration Services
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