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You searched on: Topic Area: Information Technology Sorted by: title

Displaying records 1 to 10 of 735 records.
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1. "Just Try"
Topic: Information Technology
Published: 11/1/2011
Author: Isabel M Beichl

2. (NISTIR 7742) Customized Common Industry Format Template for Electronic Health Record Usability Testing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7742
Topic: Information Technology
Published: 11/16/2010
Authors: Robert M Schumacher, Svetlana Z Lowry
Abstract: This document provides a template for the modified version of Software engineering Software product Quality Requirements and Evaluation(SQuaRE) Common Industry Format (CIF) for usability test reports (ISO/IEC 25062:2006(E)), the Common Industry F ...

3. 1310 nm Differential Phase Shift QKD System Using Superconducting Single Photon Detectors
Topic: Information Technology
Published: 4/30/2009
Authors: Xiao Tang, Lijun Ma, Sae Woo Nam, Burm Baek, Oliver T Slattery, Alan Mink, Hai Xu, Tiejun Chang
Abstract: We have implemented a differential-phase-shift (DPS) quantum key distribution (QKD) system at 1310 nm with superconducting single photon detectors (SSPD). The timing jitter of the SSPDs is small and its dark counts are very low. 1310 nm is an ideal q ...

4. 3-D Segmentation and Motion Estimation of Range Data for Crash Prevention
Series: NIST Interagency/Internal Report (NISTIR)
Topic: Information Technology
Published: 6/6/2007
Author: Hamid Gharavi
Abstract: In this paper we present a 3-D object segmentation and motion estimation scheme of range video data for crash prevention applications. The segmentation is based on slope values of every point in the scene with which atomic regions are constructed by ...

5. 500-143 {?}Guide to the Selection and Use of Fourth Generation Languages
Series: Special Publication (NIST SP)
Report Number: 500-143
Topic: Information Technology
Published: 9/1/1986
Author: M M Gray

6. A Benchmark for Best View Selection of 3D Objects
Topic: Information Technology
Published: 12/23/2010
Authors: Helin Dutagaci, Chun Pan (Benny) Cheung, Afzal A Godil
Abstract: The best view selection corresponds to the task of automatically selecting the most representative view of a 3D model. In this paper, we describe a benchmark for evaluation of best view selection algorithms. The benchmark consists of the preferred vi ...

7. A Case Study of Performance Degradation Attributable to Run-Time Bounds Checks on C++ Vector Access
Series: Journal of Research (NIST JRES)
Report Number: 118.012
Topic: Information Technology
Published: 5/22/2013
Authors: David W Flater, William F Guthrie
Abstract: Programmers routinely omit run-time safety checks from applications because they assume that these safety checks would degrade performance. The simplest example is the use of arrays or array-like data structures that do not enforce the constrain ...

8. A Classification of Differential Invariants for Multivariate Post-Quantum Cryptosystems
Topic: Information Technology
Published: 6/21/2013
Authors: Ray A Perlner, Daniel C Smith-Tone
Abstract: Multivariate Public Key Cryptography (MPKC) has become one of a few options for security in the quantum model of computing. Though a few multivariate systems have resisted years of effort from the cryptanalytic community, many such systems have fall ...

9. A Cognitive-Behavioral Framework of User Password Management Lifecycle
Topic: Information Technology
Published: 6/22/2014
Author: Yee-Yin Choong
Abstract: Passwords are the most commonly used mechanism in controlling users‰ access to information systems. Little research has been established on the entire user password management lifecycle from the start of generating a password, maintaining the pas ...

10. A Comparison of the SSE-CMM and NVLAP IT Security Testing
Topic: Information Technology
Published: 2/16/2000
Author: R J Medlock
Abstract: This paper describes the general accreditation requirements of the NIST National Voluntary Laboratory Accreditation Program (NVLAP) and the specific accreditation requirements for the Cryptographic Module Testing (CMT) and Common Criteria Testing (CC ...

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series