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Topic Area: Manufacturing

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21. Microwave-Based Metrology Platform Development: Application of Broad-Band RF Metrology to Integrated Circuit Reliability Analyses
Topic: Manufacturing
Published: 5/12/2014
Authors: Lin You, Chukwudi Azubuike Okoro, Jungjoon Ahn, Joseph J Kopanski, Yaw S Obeng
Abstract: In this paper we describe the development of a suite of techniques, based on the application of high frequency electromagnetic waves, to probe material and structural changes in integrated circuits under various external perturbations. We discuss how ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915367

22. Control Fusion for Safe Multi-robot Coordination
Topic: Manufacturing
Published: 5/9/2014
Authors: Roger V Bostelman, Jeremy A Marvel
Abstract: Future smart manufacturing systems will include more complex coordination of mobile manipulators (e.g., robot arms mounted on mobile bases). The National Institute of Standards and Technology, Performance of Collaborative Robot Systems Project has b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915915

23. DNA-based Nanocomposite Bio-Coatings for Fire Retarding Polyurethane Foam
Topic: Manufacturing
Published: 5/2/2014
Authors: Yu-Chin Li, Yeon S. Kim, John R Shields, Rick D Davis
Abstract: Layer-by-Layer (LbL) assembled multilayer thin films of deoxyribonucleic acid (DNA), chitosan (CHI), and montmorillonite (MMT), were studied in an effort to produce fully renewable, bio-based fire retardant coatings for flexible polyurethane foam ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915517

24. A Roadmap to Advance Measurement Science in Robot Dexterity and Manipulation
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7993
Topic: Manufacturing
Published: 5/1/2014
Authors: Joseph A Falco, Jeremy A Marvel, Elena R Messina
Abstract: In order for robots to expand their applicability within manufacturing operations, their dexterity needs to advance considerably. There is active research in many areas that is contributing to creating a new generation of much more dexterous arms an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914897

25. A Quantitative Study of Nanoparticle Release from Nanocoatings Exposed to UV Radiation
Topic: Manufacturing
Published: 4/7/2014
Authors: Li Piin Sung, Deborah L Stanley, Justin M Gorham, Savelas A Rabb, Xiaohong Gu, Lee Lijian Yu, Tinh Nguyen
Abstract: Nanoparticles are increasingly used in polymer coatings (i.e., nanocoatings) to improve multiple properties of traditional coatings such as mechanical, electrical, gas barrier, and UV resistance. These high performance nanocoatings are often used in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915497

26. A Call for Artificial Intelligence Tools to Support Manufacturing Innovation
Topic: Manufacturing
Published: 3/14/2014
Author: Vijay Srinivasan
Abstract: We are in the midst of a renewed interest in manufacturing. Developed economies in the West are increasingly concerned about the decline in manufacturing in their countries, and have linked that decline to high unemployment and low economic growth. I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915713

27. Controlled Formation and Characterization of Dithiothreitol-Conjugated Gold Nanoparticle Clusters
Topic: Manufacturing
Published: 3/5/2014
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Justin M Gorham, Jiwen Zheng, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: We report a systematic study of the controlled formation of discrete-size gold nanoparticle clusters (GNCs) by interaction with the reducing agent dithiothreitol (DTT). Asymmetric-flow field flow fractionation and electrospray differential mobility a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915014

28. Metrology Needs for TSV Fabrication
Topic: Manufacturing
Published: 3/4/2014
Authors: Victor Vartanian, Richard A Allen, Larry Smith, Klaus Hummler, Steve Olson, Brian Sapp
Abstract: This paper focuses on the metrology needs and challenges of through silicon via (TSV) fabrication, consisting of TSV etch, liner, barrier, and seed (L/B/S) depositions, copper plating, and copper CMP. These TSVs, with typical dimensions within a f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914497

29. Methods for improving visibility measurement standards of powered industrial vehicles
Topic: Manufacturing
Published: 2/28/2014
Authors: Roger V Bostelman, Jochen Teizer, Soumitry J. Ray, Mike Agronin, Dominic Albanese
Abstract: Poor visibility of powered industrial vehicles, such as forklifts, used in industry is often the cause of accidents that include pedestrians. Current standards allow up to 20% non-visible regions for forklifts where measurement of these regions is p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912877

30. Detection of 3D Interconnect Bonding Voids by IR Microscopy
Topic: Manufacturing
Published: 2/20/2014
Authors: Jonny H?glund, Zoltan Kiss, Gyorgy Nadudvari , Zsolt Kovacs, Szabolcs Velkei, Moore Chris, Victor Vartanian, Richard A Allen
Abstract: There are a number of factors driving 3D integration including reduced power consumption, RC delay, and form factor as well as increased bandwidth. However, before these advantages can be realized, various technical and cost hurdles must be overcom ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914474



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