NIST logo

Publications Portal

You searched on:
Topic Area: Manufacturing

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 31 to 40 of 1000 records.
Resort by: Date / Title


31. Proposed E57.02 Range Measurement Performance Standard for Medium Range 3D Imaging Systems
Topic: Manufacturing
Published: 11/11/2013
Authors: David MacKinnon, Luc Cournoyer, Kamel Shawki Saidi, Geraldine S Cheok, Robert Bridges, Darin Ingimarson
Abstract: We present the proposed standard ASTM E57.02 "Test Method to Evaluate the Range Measurement Performance of 3D Imaging Systems in the Medium Range" (Work Item ASTM WK12373). The stated purpose of the standard is to provide metrics and procedures to e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914811

32. Dielectrophoretic Trapping of P19 Cells on Indium Tin Oxide based Microelectrode Arrays
Topic: Manufacturing
Published: 11/8/2013
Authors: Aveek Gangopadhyay, Saugandhika Minnikanti, Darwin R Reyes-Hernandez, Mulpuri V. Rao, Nathalia Peixoto
Abstract: A microfabricated device comprised of a microelectrode array (MEA) and a microfluidic channel is presented here for the purpose of trapping cells using positive dielectrophoresis (DEP). Transparent indium tin oxide (ITO) electrodes are patterned in a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914569

33. Nanomanufacturing Concerns about Measurements made in the SEM II: Specimen Contamination
Topic: Manufacturing
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar, Premsagar Purushotham Kavuri
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The improvements that have been made have significantly improved the overall SEM per ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914028

34. Nanomanufacturing concerns about Measurements made in the SEM I: Imaging and its Measurement
Topic: Manufacturing
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar
Abstract: The high resolution of the SEM is especially useful for qualitative and quantitative applications for both nanotechnology and nanomanufacturing. But, should users be concerned about the imaging and measurements made with this instrument? Perhaps one ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914029

35. Multi-Walled Carbon Nanotube Layer-by-Layer Coatings With a Novel Trilayer Structure to Reduce Foam Flammability
Topic: Manufacturing
Published: 10/29/2013
Authors: Rick D Davis, Yeon Seok Kim, Amanda A Cain, Jaime C. Grunlan
Abstract: The research presented here is the first report of fabricating multi-walled carbon nanotube (MWCNT) based thin coatings on polyurethane foam (PUF) using Layer-by-Layer assembly, and using MWCNTs to reduce the flammability of PUF. The (440.6 ± 47.1) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907032

36. Towards Mobile Manipulator Safety Standards
Topic: Manufacturing
Published: 10/24/2013
Authors: Jeremy A Marvel, Roger V Bostelman
Abstract: We present an overview of the current safety standards for industrial robots and automated guided vehicles (AGVs), and describe how they relate to the safety concerns of mobile manipulators (robot arms mounted on mobile bases) in modern manufacturing ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913947

37. A Literature Review of Sensor Ontologies for Manufacturing Applications
Topic: Manufacturing
Published: 10/23/2013
Authors: Craig I Schlenoff, Tsai Hong Hong, Roger D. Eastman
Abstract: The purpose of this paper is to review existing sensor and sensor network ontologies to understand whether they can be reused as a basis for a manufacturing perception sensor ontology, or if the existing ontologies hold lessons for the development of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914024

38. Controlling Foam Flammability and Mechanical Behavior by Tailoring the Composition of Clay-Based Multilayer Nanocoatings
Topic: Manufacturing
Published: 9/23/2013
Authors: Yu-Chin Li, Yeon Seok Kim, John R Shields, Rick D Davis
Abstract: This is the most comprehensive evaluation of Layer-by-Layer (LbL) coatings intended to reduce the flammability of polymeric materials. Through a systematic variation of the coating recipe, an ideal combination of the coating attributes was ide ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913643

39. Conformance Test Architecture and Test Suite for ANSI/NIST-ITL 1-2011 NIEM XML Encoded Transactions
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7957
Topic: Manufacturing
Published: 9/18/2013
Authors: Fernando L Podio, Dylan James Yaga, Christofer J. McGinnis
Abstract: The latest version of the ANSI/NIST-ITL standard was published in November 2011 (AN-2011). In addition to specifying Record Types in traditional encoding, the standard includes the specification of National Information Exchange Model (NIEM) Extensibl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914580

40. On the Enduring Appeal of Least-squares Fitting in Computational Coordinate Metrology
Topic: Manufacturing
Published: 9/6/2013
Authors: Vijay Srinivasan, Craig M Shakarji, Edward P Morse
Abstract: The vast majority of points collected with coordinate measuring machines are not used in isolation; rather, collections of these points are associated with geometric features through fitting routines. In manufacturing applications, there are two fund ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907559



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series