NIST logo

Publications Portal

You searched on:
Topic Area: Manufacturing

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 31 to 40 of 1000 records.
Resort by: Date / Title


31. Metrological challenges introduced by new tolerancing standards
Topic: Manufacturing
Published: 2/13/2014
Authors: Edward P Morse, Yue Peng, Vijay Srinivasan, Craig M Shakarji
Abstract: The recent release of ISO has provided designers with a richer set of specification tools for the size of part features, so that various functional requirements can be captured with greater fidelity [2]. However, these tools also bring new challenges ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916214

32. The U.S. Manufacturing Value Chain: An International Perspective
Series: Technical Note (NIST TN)
Report Number: 1810
Topic: Manufacturing
Published: 2/11/2014
Author: Douglas S Thomas
Abstract: This report uses input-output data from the World Input-Output Database along with the methods developed by Wassily Leontief to track the intermediate goods and services used in national manufacturing industries. Specifically, it examines the extent ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914022

33. An Ontology Based Approach to Action Verification for Agile Manufacturing
Topic: Manufacturing
Published: 1/10/2014
Authors: Zeid Kootbally, Stephen B. Balakirsky
Abstract: Many of today's robotic work cells are unable to detect when an action failure has occurred. This results in faulty products being sent down the line, and/or downtime for the cell as failures are detected and corrected. This article examines a novel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914818

34. Applications of Surface Metrology in Toolmark Identification
Topic: Manufacturing
Published: 1/8/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar, Robert Meryln Thompson
Abstract: Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. In 2009, a report by the National Academies called into question, amon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913337

35. A Detailed Failure Analysis Examination of the Effect of Thermal Cycling on Cu TSV Reliability
Topic: Manufacturing
Published: 1/1/2014
Authors: Chukwudi Azubuike Okoro, June Waiyin Lau, Yaw S Obeng, Klaus Hummler
Abstract: In this work, a detailed failure analysis of the physical root cause for the increase in electrical resistance and radio-frequency (RF) transmission coefficient of through-silicon via (TSV) daisy chain was investigated. Six different failure modes we ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913115

36. Uncertainty of temperature measurements by infrared thermography for metal cutting applications
Topic: Manufacturing
Published: 12/31/2013
Authors: Brandon M Lane, Eric Paul Whitenton, Viswanathan Madhavan, M Alkan Donmez
Abstract: This paper presents the methodology and results of a comprehensive measurement uncertainty analysis for infrared thermography of a cutting tool during the metal cutting process. The analysis is based on a commercial off-the-shelf (COTS) camera, ty ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913632

37. Developmental validation of the PowerPlex 21 System.
Topic: Manufacturing
Published: 12/24/2013
Authors: Carolyn R Hill, Martin G. Ensenberger, Robert S. McLaren, Cynthia J. Sprecher, Douglas R. Storts
Abstract: The PowerPlex(®) 21 System is a STR multiplex that has been optimized for casework samples while still being capable of database workflows including direct amplification. The loci included in the multiplex offer increasing overlap with core loci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916143

38. A Simulated Sensor-based Approach for Kit Building Applications
Topic: Manufacturing
Published: 12/20/2013
Authors: Zeid Kootbally, Craig I Schlenoff, Theodore J Weisman, Stephen B. Balakirsky, Thomas Rollin Kramer, Anthony Pietromartire
Abstract: Kit building or kitting is a process in which individually separate but related items are grouped, packaged, and supplied together as one unit (kit). This paper describes advances in developing sensing/control and parts detection technologies enablin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914962

39. Back-End-of-Line Test Structure Design and Simulation for Subsurface Metrology with Scanning Probe Microscopy
Topic: Manufacturing
Published: 12/13/2013
Authors: Lin You, Emily Hitz, Jungjoon Ahn, Yaw S Obeng, Joseph J Kopanski
Abstract: As demands in the semiconductor industry call for further miniaturization and performance enhancement of electronic systems, the traditional planar (2D) electronic interconnection and packaging technologies show their difficulties in meeting the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915013

40. Additive Manufacturing Technical Workshop Summary Report
Series: Technical Note (NIST TN)
Report Number: 1823
Topic: Manufacturing
Published: 12/4/2013
Authors: Christopher U Brown, Joshua Lubell, Robert R Lipman
Abstract: This report summarizes the presentations, discussions, and recommendations from the Additive Manufacturing Technical Workshop held during the PDES, Inc. offsite meeting in Gaithersburg, Maryland in March of 2013. The purpose of the workshop was to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914642



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series