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Topic Area: Manufacturing

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Displaying records 971 to 980 of 1000 records.
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971. Advances in NIST Standard Rockwell Diamond Indenters
Topic: Manufacturing
Published: 1/1/1998
Authors: Jun-Feng Song, Samuel Rea Low III, David J Pitchure, Theodore Vincent Vorburger
Abstract: Recent developments in standard hardness machines and microform calibration techniques have made it possible to establish a worldwide unified Rockwell hardness scale with metrological traceability. This includes the establishments of the reference st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820911

972. An Integrated Approach to Optimal Three Dimensional Layout and Routing
Topic: Manufacturing
Published: 1/1/1998
Authors: Simon Szykman, J Cagan, P Weisser
Abstract: This paper describes the combination of previously-developed component placement and routing algorithms into an integrated computational approach to product layout optimization. Previous work introduced simulated annealing-based algorithms for opt ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821540

973. Characterization of Surface Topography
Topic: Manufacturing
Published: 1/1/1998
Authors: Theodore Vincent Vorburger, John A. Dagata, G. Wilkening, K Iizuka
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901983

974. Combining Interactive Exploration and Optimization for Assembly Design
Topic: Manufacturing
Published: 1/1/1998
Authors: Simon Szykman, Gerard Kim
Abstract: This paper presents an integrated framework for assembly design. The framework will allow the designer to represent knowledge about the design process and constraints as well as information about the artifact being designed, design history and ration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821542

975. Electronic Properties of GaAs Surfaces Etched in an Electron Cyclotron Resonance Source and Chemically Passivated Using P2S5
Topic: Manufacturing
Published: 1/1/1998
Authors: O Glembocki, J Tuchman, John A. Dagata, K Ko, S Pang, C Stutz
Abstract: Photoreflectance has been used to study the electronic properties of (100) GaAs surfaces exposed to a Cl2/Ar plasma generated by an electron cyclotron resonance source and subsequently passivated by P2S5. The plasma etch shifts the Fermi level of p-G ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821782

976. Experiences in Initiating Baldridge-Based Quality in a NIST Technical Division
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6201
Topic: Manufacturing
Published: 1/1/1998
Author: Dennis A Swyt
Abstract: Within the National Institute of Standards and Technology (NIST), which administers the Malcolm Baldrige National Quality Award (MBNQA), a NIST technical division has initiated a Baldrige-based effort to increase the effectiveness of its research and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823104

977. Experiences in Initiating Baldrige-Based Quality in a NIST Technical Division
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6201
Topic: Manufacturing
Published: 1/1/1998
Author: Dennis A Swyt
Abstract: Within the National Institute of Standards and Technology (NIST), which administers the Malcolm Baldrige National Quality Award (MBNQA), a NIST technical division has initiated a Baldrige-based effort to increase the effectiveness of its research and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820915

978. Extinction Coefficients for Dielectric and Conducting Doublets of Spheres
Topic: Manufacturing
Published: 1/1/1998
Author: Egon Marx
Abstract: The extinction cross-sections of doublets of polystyrene and carbon spheres are determined using the optical theorem. The forward scattering amplitude is computed using the single integral equation method. The extinction cross-sections of the doublet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820900

979. Image Sharpness Measurement in Scanning Electron Microscopy - Part I
Topic: Manufacturing
Published: 1/1/1998
Authors: Michael T Postek, Andras Vladar
Abstract: This study introduces the idea of the sharpness concept in relationship to the determination of scanning electron microscope (SEM) perfomance. Scanning electron microscopes are routinely used in many manufacturing environments. Fully automated or sem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820906

980. Improving Step Height and Pitch Measurements Using the Calibrated Atomic Force Microscope
Topic: Manufacturing
Published: 1/1/1998
Authors: R Koning, Ronald G Dixson, Joseph Fu, V W. Tsai, Theodore Vincent Vorburger
Abstract: The most important industrial application of Atomic Force Microscopy (AFM) is probably the accurate measurement of geometrical dimensions of small surface structures. In order to maintain the instrument''s performance and to achieve the high accuracy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820898



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