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Topic Area: Manufacturing

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Displaying records 971 to 980 of 1000 records.
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971. Combining Interactive Exploration and Optimization for Assembly Design
Topic: Manufacturing
Published: 1/1/1998
Authors: Simon Szykman, Gerard Kim
Abstract: This paper presents an integrated framework for assembly design. The framework will allow the designer to represent knowledge about the design process and constraints as well as information about the artifact being designed, design history and ration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821542

972. Electronic Properties of GaAs Surfaces Etched in an Electron Cyclotron Resonance Source and Chemically Passivated Using P2S5
Topic: Manufacturing
Published: 1/1/1998
Authors: O Glembocki, J Tuchman, John A. Dagata, K Ko, S Pang, C Stutz
Abstract: Photoreflectance has been used to study the electronic properties of (100) GaAs surfaces exposed to a Cl2/Ar plasma generated by an electron cyclotron resonance source and subsequently passivated by P2S5. The plasma etch shifts the Fermi level of p-G ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821782

973. Experiences in Initiating Baldridge-Based Quality in a NIST Technical Division
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6201
Topic: Manufacturing
Published: 1/1/1998
Author: Dennis A Swyt
Abstract: Within the National Institute of Standards and Technology (NIST), which administers the Malcolm Baldrige National Quality Award (MBNQA), a NIST technical division has initiated a Baldrige-based effort to increase the effectiveness of its research and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823104

974. Experiences in Initiating Baldrige-Based Quality in a NIST Technical Division
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6201
Topic: Manufacturing
Published: 1/1/1998
Author: Dennis A Swyt
Abstract: Within the National Institute of Standards and Technology (NIST), which administers the Malcolm Baldrige National Quality Award (MBNQA), a NIST technical division has initiated a Baldrige-based effort to increase the effectiveness of its research and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820915

975. Extinction Coefficients for Dielectric and Conducting Doublets of Spheres
Topic: Manufacturing
Published: 1/1/1998
Author: Egon Marx
Abstract: The extinction cross-sections of doublets of polystyrene and carbon spheres are determined using the optical theorem. The forward scattering amplitude is computed using the single integral equation method. The extinction cross-sections of the doublet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820900

976. Image Sharpness Measurement in Scanning Electron Microscopy - Part I
Topic: Manufacturing
Published: 1/1/1998
Authors: Michael T Postek, Andras Vladar
Abstract: This study introduces the idea of the sharpness concept in relationship to the determination of scanning electron microscope (SEM) perfomance. Scanning electron microscopes are routinely used in many manufacturing environments. Fully automated or sem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820906

977. Improving Step Height and Pitch Measurements Using the Calibrated Atomic Force Microscope
Topic: Manufacturing
Published: 1/1/1998
Authors: R Koning, Ronald G Dixson, Joseph Fu, V W. Tsai, Theodore Vincent Vorburger
Abstract: The most important industrial application of Atomic Force Microscopy (AFM) is probably the accurate measurement of geometrical dimensions of small surface structures. In order to maintain the instrument''s performance and to achieve the high accuracy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820898

978. Learning to Set Up Numerical Optimizations of Engineering Designs
Topic: Manufacturing
Published: 1/1/1998
Authors: Mark Schwabacher, T Ellman, H Hirsh
Abstract: Gradient-based numerical optimization of complex engineering designs offers the promise of rapidly producing better designs. However, such methods generally assume that the objective function and constraint functions are continuous, smooth, and defin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822344

979. Measurement Traceability of NIST Standard Rockwell Diamond Indenters
Topic: Manufacturing
Published: 1/1/1998
Authors: Jun-Feng Song, Samuel Rea Low III, Walter S Liggett Jr, David J Pitchure, Theodore Vincent Vorburger
Abstract: A metrology-based Rockwell hardness scale is established by a standard machine and a standard diamond indenter. Both must be established through force and dimensional metrology with acceptably small measurement uncertainties. In 1994, NIST develope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823113

980. Measurements of Pitch, Height, and Width Artifacts with the NIST Calibrated Atomic Force Microscope
Topic: Manufacturing
Published: 1/1/1998
Authors: Ronald G Dixson, V W. Tsai, Theodore Vincent Vorburger, Edwin Ross Williams, X Wang, Joseph Fu, R Koning
Abstract: The presence of the atomic force microscope (AFM) in the industrial metrology setting is rapidly increasing. Properties commonly measured in such applications are: feature spacing (pitch), feature height (or depth), feature width (critical dimension) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820838



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