NIST logo

Publications Portal

You searched on:
Topic Area: Manufacturing
Sorted by: date

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 1 to 10 of 1000 records.
Resort by: Date / Title


1. Uncertainty in Measurement of the Maximum Cutting Tool Temperature by Infrared Thermography
Topic: Manufacturing
Published: 6/13/2014
Authors: Brandon M Lane, Eric Paul Whitenton, Viswanathan Madhavan, M Alkan Donmez
Abstract: This paper presents an analysis of the uncertainty in measurement of the peak temperature on the side face of a cutting tool by infrared thermography. An analytical method uses the temperature measurement equation to study the uncertainty arising f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915534

2. A Quantitative Study of Nanoparticle Release from Nanocoatings Exposed to UV Radiation
Topic: Manufacturing
Published: 4/7/2014
Authors: Li Piin Sung, Deborah L Stanley, Justin M Gorham, Savelas A Rabb, Xiaohong Gu, Lee Lijian Yu, Tinh Nguyen
Abstract: Nanoparticles are increasingly used in polymer coatings (i.e., nanocoatings) to improve multiple properties of traditional coatings such as mechanical, electrical, gas barrier, and UV resistance. These high performance nanocoatings are often used in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915497

3. A Call for Artificial Intelligence Tools to Support Manufacturing Innovation
Topic: Manufacturing
Published: 3/14/2014
Author: Vijay Srinivasan
Abstract: We are in the midst of a renewed interest in manufacturing. Developed economies in the West are increasingly concerned about the decline in manufacturing in their countries, and have linked that decline to high unemployment and low economic growth. I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915713

4. Metrology Needs for TSV Fabrication
Topic: Manufacturing
Published: 3/4/2014
Authors: Victor Vartanian, Richard A Allen, Larry Smith, Klaus Hummler, Steve Olson, Brian Sapp
Abstract: This paper focuses on the metrology needs and challenges of through silicon via (TSV) fabrication, consisting of TSV etch, liner, barrier, and seed (L/B/S) depositions, copper plating, and copper CMP. These TSVs, with typical dimensions within a f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914497

5. Methods for improving visibility measurement standards of powered industrial vehicles
Topic: Manufacturing
Published: 2/28/2014
Authors: Roger V Bostelman, Jochen Teizer, Soumitry J. Ray, Mike Agronin, Dominic Albanese
Abstract: Poor visibility of powered industrial vehicles, such as forklifts, used in industry is often the cause of accidents that include pedestrians. Current standards allow up to 20% non-visible regions for forklifts where measurement of these regions is p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912877

6. Detection of 3D Interconnect Bonding Voids by IR Microscopy
Topic: Manufacturing
Published: 2/20/2014
Authors: Jonny H?glund, Zoltan Kiss, Gyorgy Nadudvari , Zsolt Kovacs, Szabolcs Velkei, Moore Chris, Victor Vartanian, Richard A Allen
Abstract: There are a number of factors driving 3D integration including reduced power consumption, RC delay, and form factor as well as increased bandwidth. However, before these advantages can be realized, various technical and cost hurdles must be overcom ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914474

7. The U.S. Manufacturing Value Chain: An International Perspective
Series: Technical Note (NIST TN)
Report Number: 1810
Topic: Manufacturing
Published: 2/11/2014
Author: Douglas S Thomas
Abstract: This report uses input-output data from the World Input-Output Database along with the methods developed by Wassily Leontief to track the intermediate goods and services used in national manufacturing industries. Specifically, it examines the extent ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914022

8. An Ontology Based Approach to Action Verification for Agile Manufacturing
Topic: Manufacturing
Published: 1/10/2014
Authors: Zeid Kootbally, Stephen B. Balakirsky
Abstract: Many of today's robotic work cells are unable to detect when an action failure has occurred. This results in faulty products being sent down the line, and/or downtime for the cell as failures are detected and corrected. This article examines a novel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914818

9. Applications of Surface Metrology in Toolmark Identification
Topic: Manufacturing
Published: 1/8/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar, Robert Meryln Thompson
Abstract: Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. In 2009, a report by the National Academies called into question, amon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913337

10. A Detailed Failure Analysis Examination of the Effect of Thermal Cycling on Cu TSV Reliability
Topic: Manufacturing
Published: 1/1/2014
Authors: Chukwudi Azubuike Okoro, June W. Lau, Yaw S Obeng, Klaus Hummler
Abstract: In this work, a detailed failure analysis of the physical root cause for the increase in electrical resistance and radio-frequency (RF) transmission coefficient of through-silicon via (TSV) daisy chain was investigated. Six different failure modes we ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913115



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series