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1. Dependency of Morphology on Miscut Angle for Si(111) Etched in NH^d4^F
Topic: Manufacturing
Published: 5/1/2003
Authors: Joseph Fu, Hui Zhou, John A Kramar, Richard M Silver, S Gonda
Abstract: Using scanning probe microscopy, we have examined the surfaces produced by etching several different vicinal Si(111) samples in NH^d4^F aqueous solution. In agreement with others, we found that deoxygenation of the etchant generally reduces the numbe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823151

2. 1/N Feynman Machines as a Path to Ultraminiaturization
Topic: Manufacturing
Published: 9/1/1995
Author: E Clayton Teague
Abstract: The possibility of implementing Feynman''s proposal for achieving ultraminiaturization by an iterative process of three-dimensional machines making ever-smaller three-dimensional machines is considered in the nature of a thought experiment. A large a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820781

3. 1998-99 NIST/International SEMATECH Collaboration to Develop Atom-Based Linewidth Standards
Topic: Manufacturing
Published: 1/1/2000
Author: Richard M Silver
Abstract: This is the final report for the SEMATECH funded SEMATECH/NIST contract for the development of atom-based standard artifacts. This report is intended to summarize the progress completed on the technical elements and is intended as a general release d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820978

4. 20 Degrees Celsius--A Short History of the Standard Reference Temperature for Industrial Dimensional Measurements
Series: Journal of Research (NIST JRES)
Topic: Manufacturing
Published: 1/1/2007
Author: Theodore D Doiron
Abstract: While most dimensional metrologists know that the reference temperature for dimensional measurements is 20  C, very few know how or why that temperature was chosen.  Many people have thought it was, in some sense, arbitrary.  In actual ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823211

5. 2005 Metrology for a New Science: Advanced Metrology Needs
Topic: Manufacturing
Published: 1/1/2005
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822383

6. 2005 Variable Pressure/Environmental Scanning Electron Microscopy: Application to Photomask Dimensional Metrology
Topic: Manufacturing
Published: 1/1/2005
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822384

7. 2010 Proceedings of the Performance Metrics for Intelligent Systems (PerMIS'10) Workshop
Series: Special Publication (NIST SP)
Report Number: 1113
Topic: Manufacturing
Published: 2/8/2011
Authors: Rajmohan Madhavan, Elena R Messina, Brian A Weiss
Abstract: The 2010 Performance Metrics for Intelligent Systems workshop is the tenth in a series dedicated to defining measures and methodologies of evaluating performance of intelligent systems. Started in 2000, the PerMIS series focuses on applications of pe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907548

8. 2010 Programs of the Manufacturing Engineering Laboratory
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7713
Topic: Manufacturing
Published: 11/5/2010
Authors: Lisa Jean Fronczek, Bessmarie A. Young
Abstract: The National Institute of Standards and Technology s Manufacturing Engineering Laboratory (MEL) promotes innovation and the competitiveness of U.S. manufacturing through measurement science, measurement services, and critical technical contributions ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905800

9. 2011 Solutions in Perception Challenge Performance Metrics and Results
Topic: Manufacturing
Published: 3/22/2012
Authors: Jeremy A Marvel, Tsai Hong Hong, Elena R Messina
Abstract: The 2011 Solutions in Perception Challenge (SPC) presented an international collection of teams with the opportunity to develop algorithms that could positively identify and accurately locate in space an arbitrary collection of artifacts. Researchers ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910645

10. 2012 Proceedings of the Performance Metrics for Intelligent Systems (PerMI'12) Workshop
Series: Special Publication (NIST SP)
Report Number: 1136
Topic: Manufacturing
Published: 11/21/2012
Authors: Rajmohan Madhavan, Elena R Messina, Brian A Weiss
Abstract: The 2012 Performance Metrics for Intelligent Systems workshop is the eleventh in a series dedicated to defining measures and methodologies of evaluating performance of intelligent systems. Started in 2000, the PerMIS series focuses on application ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911879



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